The Datasheet Archive

Top Results (2)

Part Manufacturer Description Datasheet Download Buy Part
RNC50J9412BSRE6 Vishay Dale RES 94.1K OHM 1/10W .1% AXIAL
RNC50J9412BSB14 Vishay Dale RES 94.1K OHM 1/10W .1% AXIAL
SF Impression Pixel

Search Stock (7)

  You can filter table by choosing multiple options from dropdownShowing 7 results of 7
Part Manufacturer Supplier Stock Best Price Price Each Buy Part
CJ9410-000 TE Connectivity Ltd Avnet - - -
MC7812BQBJ941 Motorola Semiconductor Products New Advantage Corporation 228 - -
RNC50J9412BSB14 Vishay Intertechnologies Avnet - $3.39 $2.99
RNC50J9412BSRE5 Vishay Intertechnologies Avnet - $3.39 $2.99
RNC50J9412BSRE6 Vishay Intertechnologies Avnet - $3.39 $2.99
RNC50J9412BSRE7 Vishay Intertechnologies Avnet - $3.39 $2.99
RNC50J9412BSRE8 Vishay Intertechnologies Avnet - $3.39 $2.99

No Results Found

Show More

J941 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
USART 8251

Abstract: 8251 pin diagram 8251 microprocessor block diagram block diagram 8251 J941 8251 teradyne 8251 programmable interface pin configuration of 8251 8251 usart
Text: test circuit is the dynamic load of a Teradyne J941. 3-36 Powered by ICminer.com Electronic-Library , Teradyne J941 tester. Measurement of typical signals generated by the J941 showed tR = tF = 5 ns. 5


OCR Scan
PDF 8251/Am9551 APX86 8251/Am9551 Am9551. USART 8251 8251 pin diagram 8251 microprocessor block diagram block diagram 8251 J941 8251 teradyne 8251 programmable interface pin configuration of 8251 8251 usart
5962-8754801

Abstract: No abstract text available
Text: Rise and Fall times are controlled by the Teradyne J-941 tester. Measurement of typical signals generated by the J-941 showed tp = tp = 5 ns. 4. Test condition: C l = 100 pF ± 20 pF, guaranteed by Teradyne J941 DIB. 5. This recovery time is for Mode Initialization only. Write Data is allowed only


OCR Scan
PDF APX86 J-941 16tcy. 5962-8754801
Not Available

Abstract: No abstract text available
Text: TC003851 This test circuit is the dynamic load of a Teradyne J941. 3-36 over operating range (for , Rise and Fall times are controlled by the Teradyne J941 tester. Measurement of typical signals generated by the J941 tR = tp = 5 ns. Sampling pulse is internal and not tested; guaranteed by design


OCR Scan
PDF 8251/Am9551 APX86 8251/Am9551 Am9551.
8086 minimum mode and maximum mode

Abstract: timing diagram of 8086 maximum mode 8086 microprocessor architecture diagram timing diagram of 8086 minimum mode max and min mode 8086 8086 microprocessor APPLICATIONS block and pin diagram of 8086 addressing modes 8086 8086 architecture notes 8086 microprocessor pin diagram
Text: to T2 state (8 ns into T3). Not tested; these specs are controlled by the Teradyne J941 tester. V cc , controlled by the Teradyne J941 tester. VCC = 4.5 V, 5.5 V VjH - 2.4 V V| l " -45 V V|HC " V V ilc - -25 V V0 , to T2 state (8 ns into T3). Not tested; these specs are controlled by the Teradyne J941 tester. Vcc , J941 tester. V cc * 4.5 V, 5.5 V V|H - 2.4 V V|L - .45 V V|HC 4.3 V V ilc - -25 V V o h - 1.6 V Vol "


OCR Scan
PDF 16-Bit APX86 8086 minimum mode and maximum mode timing diagram of 8086 maximum mode 8086 microprocessor architecture diagram timing diagram of 8086 minimum mode max and min mode 8086 8086 microprocessor APPLICATIONS block and pin diagram of 8086 addressing modes 8086 8086 architecture notes 8086 microprocessor pin diagram
8251 IC FUNCTION

Abstract: block diagram 8251 IC 8251 block diagram J941 Block Diagram of 8251 usart ic 8251 IC Applications 8251 pin diagram 8251 processor 8251 usart Block Diagram of 8251
Text: Teradyne J941. 3-36 8251/Am9551 SWITCHING CHARACTERISTICS over operating range (for APL Products , order. 4. Clock Rise and Fall times are controlled by the Teradyne J941 tester. Measurement of typical signals generated by the J941 showed tp - tF - 5 ns. 5. Sampling pulse is internal and not tested


OCR Scan
PDF 8251/Am9551 APX86 /Am9551 Am9551. 8251 IC FUNCTION block diagram 8251 IC 8251 block diagram J941 Block Diagram of 8251 usart ic 8251 IC Applications 8251 pin diagram 8251 processor 8251 usart Block Diagram of 8251
8251 microprocessor block diagram

Abstract: 8251 UNIVERSAL SYNCHRONOUS ASYNCHRONOUS RECEIVER operation of 8251 microprocessor 8251 microprocessor applications
Text: the Teradyne J-941 tester. Measurement of typical signals generated by the J-941 showed tR = tp = 5 ns. 4. Test condition: Cl = 100 pF ± 20 pF, guaranteed by Teradyne J941 DIB. 5. This recovery time is


OCR Scan
PDF APX86 28-pin J-941 16tcY6. 8251 microprocessor block diagram 8251 UNIVERSAL SYNCHRONOUS ASYNCHRONOUS RECEIVER operation of 8251 microprocessor 8251 microprocessor applications
8251A programmable communication interface

Abstract: 8251 microprocessor block diagram 8251 UNIVERSAL SYNCHRONOUS ASYNCHRONOUS RECEIVER 5962-8754801 USART 8251 block diagram 8251A microprocessor 8251 applications 8251 usart AMD 8251 8251 usart applications
Text: are controlled by the Teradyne J-941 tester. Measurement of typical signals generated by the j-»4i snowed ir = tp = 5 ns. Test condition: CL= 100 pF ± 20 pF, guaranteed by Teradyne J941 DIB This


OCR Scan
PDF APX86 28-pin J-941 16tCY-6. 8251A programmable communication interface 8251 microprocessor block diagram 8251 UNIVERSAL SYNCHRONOUS ASYNCHRONOUS RECEIVER 5962-8754801 USART 8251 block diagram 8251A microprocessor 8251 applications 8251 usart AMD 8251 8251 usart applications
internal block diagram of 8088

Abstract: 8088 microprocessor circuit diagram 8088 bus structure 8088 structure 8088 microprocessor 16 bit 16 bit 8088 structure instruction set of 8088 microprocessor teradyne tester test system
Text: T3). Not tested; these specs are controlled by the Teradyne J941 tester. V cc 4.5 V, 5.5 V Vjh - 2.4 , T3). Not tested; these specs are controlled by the Teradyne J941 tester. VCC - 4.5 V, 5.5 V V|H - 2.4 , T3). Not tested; these specs are controlled by the Teradyne J941 tester. V c c " 4.5 V, 5.5 V V(h -


OCR Scan
PDF 16-bit internal block diagram of 8088 8088 microprocessor circuit diagram 8088 bus structure 8088 structure 8088 microprocessor 16 bit 16 bit 8088 structure instruction set of 8088 microprocessor teradyne tester test system
2010 - CW12010T0050GBK

Abstract: CW12010T0050G J965 ATC600F1R1BT250XT Transistor J550
Text: 49.9 Zsource W 5.14 - j9.41 7.59 - j9.88 8.90 - j9.65 Zload W 1.56 - j5.24 1.58 - j5.37 1.57 - j5 , Vdc, IDQA = 550 mA f MHz 1880 1900 1920 Max Eff. (1) % 65.1 64.6 64.6 Zsource W 5.14 - j9.41 7.59 - j9 , Level f (MHz) 1880 1900 1920 P1dB P1dB P1dB Zsource 5.14 - j9.41 7.59 - j9.88 8.90 - j9.65 Zload 1.65


Original
PDF MRF8P20160H MRF8P20160HSR3 CW12010T0050GBK CW12010T0050G J965 ATC600F1R1BT250XT Transistor J550
Not Available

Abstract: No abstract text available
Text: 98 49.9 5.14 - j9.41 1.56 - j5.24 1900 98 49.9 7.59 - j9.88 1.58 - j5 , Eff. (1) % Zsource ) Zload ) 1880 65.1 5.14 - j9.41 3.04 - j3.65 1900 , Level f (MHz) Zsource ) Zload ) 1880 P1dB 5.14 - j9.41 1.65 - j5.46 1900


Original
PDF MRF8P2160H MRF8P20160HR3 MRF8P20160HSR3 MRF8P20160HR3
2010 - CW12010T0050GBK

Abstract: J965 J546 mrf8p ATC600F1R1BT250XT GCS351-HYB1900 MRF8P2160H J5-46 CRCW12068R25FKEA MRF8P20160HS
Text: 1880 98 49.9 5.14 - j9.41 1.56 - j5.24 1900 98 49.9 7.59 - j9.88 1.58 - , MHz Max Eff. (1) % Zsource Zload 1880 65.1 5.14 - j9.41 3.04 - j3 , Compression Level f (MHz) Zsource Zload 1880 P1dB 5.14 - j9.41 1.65 - j5.46 1900


Original
PDF MRF8P2160H MRF8P20160HR3 MRF8P20160HSR3 MRF8P20160HR3 CW12010T0050GBK J965 J546 mrf8p ATC600F1R1BT250XT GCS351-HYB1900 MRF8P2160H J5-46 CRCW12068R25FKEA MRF8P20160HS
8253 amd

Abstract: 82C54-12/BJA "INTEL" "24-PIN" CERAMIC DIP intel 8253 timer 8254 counter 82C54-2
Text: , guaranteed by Teradyne J941 test equipment. 3-53


OCR Scan
PDF 82C54 82C54 10-MHz 16-bit 82C54-2 82C54-12 24-pin 82C54-2) 8253 amd 82C54-12/BJA "INTEL" "24-PIN" CERAMIC DIP intel 8253 timer 8254 counter
ic 8255A

Abstract: SMDID 8255A programmable peripheral interface 8255A-5 J941 5962-8757001
Text: test circuit is the dynamic load of a Teradyne J941. SWITCHING TEST WAVEFORM XIÖ H. - TEST _


OCR Scan
PDF APX86 ic 8255A SMDID 8255A programmable peripheral interface 8255A-5 J941 5962-8757001
82C54

Abstract: J941 8253 "INTEL" "24-PIN" CERAMIC DIP timer 8254 circuit Teradyne 8086 interval timer 8254 counter 82C54-2 82C54-2/BJA
Text: times are tested at 5 ns, guaranteed by Teradyne J941 test equipment. 3-53 Powered by ICminer.com


OCR Scan
PDF 82C54 10-MHz 16-bit 82C54-2 24-pin 82C54-12 82C54 82C54-2) J941 8253 "INTEL" "24-PIN" CERAMIC DIP timer 8254 circuit Teradyne 8086 interval timer 8254 counter 82C54-2 82C54-2/BJA
8255A programmable peripheral interface

Abstract: 5962-8757001
Text: circuit is the dynamic load of a Teradyne J941. SWITCHING TEST WAVEFORM - TEST -PO INTS' AC testing


OCR Scan
PDF APX86 8255A programmable peripheral interface 5962-8757001
8751H

Abstract: ta 8751h 8753H variable oscillator Z1P21 4kx8 eprom
Text: Time 20 ns *Not tested; these specs are controlled by the Teradyne J941 , J983 tester


OCR Scan
PDF 8751H/8753H 128x8 16-bit 8751H 8753H 8751H, 8753H, 12-MHz 12tCLCL 10tCLCL-133 ta 8751h variable oscillator Z1P21 4kx8 eprom
AMD 8051AH

Abstract: 8751H/8753H
Text: ns *Not tested; these specs are controlled by the Teradyne J941 , J983 tester. 4-17 8751H


OCR Scan
PDF 8751H/8753H 8751H/8753H 128x8 16-bit 8751H 8753H 8751H, 8753H, 8051AH AMD 8051AH
Not Available

Abstract: No abstract text available
Text: and fall times are tested at 5 ns, guaranteed by Teradyne J941 test equipment. 3-53


OCR Scan
PDF 82C54 10-MHz 16-bit 82C54-2 82C54-12 24-pin 82C54 82C54-2)
CD026

Abstract: rip smd AM9519A 33c3
Text: the dynamic load of a Teradyne J941. SWITCHING TEST INPUT/OUTPUT WAVEFORM DC See Section 6 of


OCR Scan
PDF Am9519A CD026 rip smd 33c3
8751H

Abstract: 8753H
Text: Time 20 ns •Not tested; these specs are controlled by the Teradyne J941 , J983 tester


OCR Scan
PDF 8751H/8753H 128x8 16-bit 8751H 8753H 8751H, 8753H, 8053AH, 12-MHz 12tCLCL
2003 - Not Available

Abstract: No abstract text available
Text: .91 5.66 ­ j6.84 3.20 ­ j9.64 5.49 ­ j6.61 3.13 ­ j9.41 5.31 ­ j6.40 DRAIN (1) ZL SOURCE (3) GATE (2) ZS


Original
PDF AGR21045E AGR21045EU AGR21045EF DS02-380RFPP DS02-276RFPP)
2004 - AGR21045E

Abstract: AGR21045EF AGR21045EU JESD22-C101A 178rf
Text: .84 3.20 ­ j9.64 5.49 ­ j6.61 3.13 ­ j9.41 5.31 ­ j6.40 GATE (2) ZS DRAIN (1) ZL SOURCE (3


Original
PDF AGR21045E AGR21045E AGR21045EU AGR21045EF car18109-9138 DS04-178RFPP DS04-164RFPP) AGR21045EF AGR21045EU JESD22-C101A 178rf
2004 - AGR21045EF

Abstract: AGR21045XF JESD22-C101A
Text: .84 3.20 ­ j9.64 5.49 ­ j6.61 3.13 ­ j9.41 5.31 ­ j6.40 GATE (2) ZS DRAIN (1) ZL SOURCE (3


Original
PDF AGR21045EF AGR21045EF DS04-241RFPP DS04-178RFPP) AGR21045XF JESD22-C101A
AM9516A

Abstract: No abstract text available
Text: . 'Taradyna J941 Channel Capacitance Inducing DIB. TC004391 TC004381 A. Standard Dynamic Load B


OCR Scan
PDF Am9516A BD003630 09226ck
2004 - AGR21045E

Abstract: AGR21045EF AGR21045EU JESD22-C101A 100B8 Agere Systems
Text: j9.91 5.66 ­ j6.84 3.20 ­ j9.64 5.49 ­ j6.61 3.13 ­ j9.41 5.31 ­ j6.40 GATE (2) ZS DRAIN


Original
PDF AGR21045E AGR21045E AGR21045EU AGR21045EF DS04-164RFPP DS04-037RFPP) AGR21045EF AGR21045EU JESD22-C101A 100B8 Agere Systems
Supplyframe Tracking Pixel