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    J-STD-002 TEST A Search Results

    J-STD-002 TEST A Result Highlights (6)

    Part ECAD Model Manufacturer Description Download Buy
    SN74BCT8240ADW Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 Visit Texas Instruments Buy
    SN74BCT8245ADW Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70 Visit Texas Instruments
    SN74BCT8244ADW Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 Visit Texas Instruments Buy
    SN74LVT8980AIDWREP Texas Instruments Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 Visit Texas Instruments Buy
    V62/03668-01XE Texas Instruments Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 Visit Texas Instruments Buy
    SN74BCT8245ADWR Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70 Visit Texas Instruments Buy