SN74BCT8240ADW
|
|
Texas Instruments
|
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 |
|
|
SN74BCT8245ADW
|
|
Texas Instruments
|
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70 |
|
|
SN74BCT8244ADW
|
|
Texas Instruments
|
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
|
|
SN74LVT8980AIDWREP
|
|
Texas Instruments
|
Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 |
|
|
V62/03668-01XE
|
|
Texas Instruments
|
Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 |
|
|
SN74BCT8245ADWR
|
|
Texas Instruments
|
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70 |
|
|