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GR228X Datasheets Context Search

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1996 - gr228x

Abstract: 28F001BX 28F002BC 28F002BX 28F010 28F020
Text: ON-BOARD PROGRAMMING EQUIPMENT GENRAD GR228X i Series Production Test Systems s s s s s On-board programming of Intel Flash memory devices Change data sets on the fly Automatic program file conversion Highest throughput test programming available Increased board manufacturing flexibility The GR228X i Series Production Test Systems feature high-performance analog, digital , flash memory and ISP without adversely affecting the production line capacity. The new GR228X i


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PDF GR228X 28F001BX 28F002BC 28F002BX 28F010 28F020
1997 - GR228X

Abstract: No abstract text available
Text: ON-BOARD PROGRAMMING EQUIPMENT GENRAD GR228X i Series Production Test Systems s s s s s On-board programming of Intel Flash memory devices Change data sets on the fly Automatic program file conversion Highest throughput test programming available Increased board manufacturing flexibility The GR228X i Series Production Test Systems feature high-performance analog, digital , /devtools/index.htm The new GR228X i Series allows for maximum manufacturing test flexibility. Their


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PDF GR228X
1997 - gr228x

Abstract: GR2284i GR2287i GR2286i GR2281i new ieee programs in vhdl and verilog GR2287L GR2280i GenRad
Text: . The Genrad GR228X series of board test systems are examples of such ATE platforms. 22 CORE , . (Deep vector memory is not required.) Creating the appropriate "test program" for a GR228X system


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Not Available

Abstract: No abstract text available
Text: TATION TT W ith U frm P inJJ B a s ic S C A N ™ Test Generator A Boundary Scan Test Solution for 1149.1 Components K ey Featu res: Boundary Scan Solution for 1149.1 Devices ■Available on any TestStation™ or GR228X test sys­ tem ■Faster Test Pro­ gram Develop­ m ent ■B etter Process Fault Coverage ■Improved Throughput ■More Accurate Diagnostics ■Fast , 1149.1compliant devices. Available on TestStation and GR228X systems, BasicScan simplifies test generation for


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PDF GR228X 2011-All AN-2011-02
2000 - 1032HA

Abstract: gr228x ATECOM HP3070 ispLSI1000
Text: Board Testers - GenRad GR228X Series of Board Testers - Hewlett-Packard HP3065 and HP3070 Families of , accomplish this. GenRad GR228X Lattice ispATE software generates a generic vector format for GenRad


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PDF Z1800 GR228X HP3065 HP3070 1-800-LATTICE 1032HA ATECOM ispLSI1000
2000 - teradyne

Abstract: HP3070 ATECOM conversion software jedec lattice gr228x HP3065 teradyne tester test system z1800 lattice 22v10 programming
Text: AUTOMATIC TEST EQUIPMENT - Teradyne Z1800 Series of Board Testers - GenRad GR228X Series of Board , resistors to the ISP interface programming fixture to accomplish this. GenRad GR228X Lattice ispATE


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PDF 1-800-LATTICE teradyne HP3070 ATECOM conversion software jedec lattice gr228x HP3065 teradyne tester test system z1800 lattice 22v10 programming
1998 - GR228X

Abstract: HP3065 1032HA ATECOM teradyne tester test system ISP 22V10 0111X HP 3070 Tester operation Z1800 HP3070
Text: AUTOMATIC TEST EQUIPMENT - Teradyne Z1800 Series of Board Testers - GenRad GR228X Series of Board , GenRad GR228X Short Pulse Lattice ispATE software generates a generic vector format for GenRad


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PDF 1-888-ISP-PLDS GR228X HP3065 1032HA ATECOM teradyne tester test system ISP 22V10 0111X HP 3070 Tester operation Z1800 HP3070
1998 - GR228X

Abstract: HP3070 Teradyne XC9500 Z1800
Text: HP3070 series, the GenRad GR228X series, and the Teradyne Z1800 series of ATE. In the manufacturing


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PDF XC9500 XC9500 GR228X HP3070 Teradyne Z1800
1997 - ict flexacom analyzer

Abstract: Xilinx PCI logicore FR-hel v309 gr228x
Text: step M1 Design Portability . 19 Mixed Voltages and PLDs . 20 XC9500 ISP With GR228X


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1997 - gr228x

Abstract: LEAPER-10 XC1765D LEAPER-10 driver leaper-10 CABLE FLEX-700 ic remote control bas 408 Micromaster automatic visitor counter system circuit diagram HI-LO ALL-07
Text: XACTstep M1 Design Portability . 19 Mixed Voltages and PLDs . 20 XC9500 ISP With GR228X


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PDF XC4000E-1 XC95288 gr228x LEAPER-10 XC1765D LEAPER-10 driver leaper-10 CABLE FLEX-700 ic remote control bas 408 Micromaster automatic visitor counter system circuit diagram HI-LO ALL-07
teradyne tester test system

Abstract: No abstract text available
Text: GR228X and TestStation test programs and fixtures, preserving your test investments and providing


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PDF 2012-All STG-TS0-2011-01 teradyne tester test system
Not Available

Abstract: No abstract text available
Text: JTAG Technologies for manufacturers using Teradyne's popular TestStation™ and legacy GR228X family


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PDF 2011-All STG-SYM-2011-01
Not Available

Abstract: No abstract text available
Text: x a t io n , Wnh U knfinjJ UltraPin 121a The New Standard for Analog In-Circuit Testing Key Features: Industry leading analog test capa­ bilities ■Compatible with existing TestStation™/ GR228X ap­ plications ■TestStation scal­ ability from analog to full digital ■Lower entrance price into TestSta­ tion platform ■Can be combined with UltraPin I1121 digital pin cards ■The U ltra P in 121a provides 128 high fid e lity analog pins. W ith the UltraPin 121a


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PDF /GR228X I1121 performance488 2011-All STG-M121a-2011-02
1997 - LATTICE plsi architecture 3000 SERIES speed

Abstract: HP3065 1048C GR228X HP3070 Z1800
Text: AUTOMATIC TEST EQUIPMENT - Teradyne Z1800 Series of Board Testers - GenRad GR228X Series of Board , programming fixture to accomplish this. 5 ispATE Software GenRad GR228X Lattice ispATE software


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Not Available

Abstract: No abstract text available
Text: previous generation GR228X and TS12X test fixtures and programs, the UltraPin I1121 has been designed to


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PDF STG-II121-2011-02
1999 - FLASHLINK

Abstract: GR228X PSDPRO PSD813 eeprom tutorial psd5xx psd4xx psd3xx HP3065 HP306
Text: : ­ Hewlett-Packard HP3065 and HP3070 tester families ­ GenRad GR228X Series · Available in 2nd


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PDF 9902Awebtools NT/95/98, WS7004 DK800 FLASHLINK GR228X PSDPRO PSD813 eeprom tutorial psd5xx psd4xx psd3xx HP3065 HP306
1996 - HP3065

Abstract: GR228X LATTICE plsi architecture 3000 SERIES speed 1048C HP3070 Z1800 ispcode
Text: - GenRad GR228X Series of Board Testers - Hewlett-Packard HP3065 and HP3070 Families of Board , GenRad HP GenRad GR228X 1-800-LATTICE (Domestic) 1-503-693-0201 (International) 1-503-693-0215


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Not Available

Abstract: No abstract text available
Text: e s t S t a t i o n rr 7 - - - / With U/tmPinJJ^ Scan Pathfinder™ Boundary Scan Option Boundary Scan Test Generation and Diagnostic Software for TestStation™ and GR228X Test Systems Key Features: ■Comprehensive shorts and opens testing for boards with limited test access ■Supports testing boards with a mix o f conventional and boundary-scan devices ■Effective opens testing for complex IEEE 1149.1compliant digital devices ■Accurate, pin-level


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PDF GR228X STG-SCANPF-2011-01 2011-All
1996 - IC data book free

Abstract: teradyne z1800 tester manual GR228X Teradyne z1800 teradyne z1800 tester schematic HP3065 IC data book free download Z1800 HP3070 isp synario
Text: vector set: the Teradyne Z1800 series, the GenRad GR228X series and HewlettPackard's HP3065 and HP3070


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1997 - teradyne 18xx

Abstract: lattice 22v10 programming 74HC244 hp Laptop adapter REPAIR isplsi device layout ispcode AN8028 ispLSI2064 1048C 1032E
Text: MODEL Hewlett-Packard HP 3060, 3065, 3070, 3075 GenRad GR228X /e Series GR28XX Series


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1991 - Genrad 228X

Abstract: xc9572xl pin configuration xilinx xc95108 jtag cable Schematic XC9572XL Series GR228X Xilinx jtag cable pcb Schematic 15N35 22N55 dts circuit board xc95108 bsd
Text: GR228X i-Series · TS121 · 1-2 GR2287L/LX TS8X Xilinx Development System Chapter


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PDF XC9500/XL/XV XC2064, XC3090, XC4005, XC5210, XC-DS501, 32-bit Genrad 228X xc9572xl pin configuration xilinx xc95108 jtag cable Schematic XC9572XL Series GR228X Xilinx jtag cable pcb Schematic 15N35 22N55 dts circuit board xc95108 bsd
1998 - ISP 2032 110LT48

Abstract: 80lt44 marconi 4200 ISPLSI2064-80LT ISPLSI2032-150LT44 ispLSI1032E-70LJ84 "rainbow technologies" 110lt48 100lt44 ispLSI2064-125LT100
Text: testers including: Models 3060, 3065, 3070, 3073 GenRad GR228X /e Series Teradyne Z1800 Series


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PDF 1-800-LATTICE 1000E, 3000E GAL16V8 GAL16V8Z GAL16LV8 GAL16VP8 GAL16LV8ZD GAL18V10 GAL20LV8ZD ISP 2032 110LT48 80lt44 marconi 4200 ISPLSI2064-80LT ISPLSI2032-150LT44 ispLSI1032E-70LJ84 "rainbow technologies" 110lt48 100lt44 ispLSI2064-125LT100
1997 - PLSI2032-150LJ

Abstract: PLSI1024-60LJ ispLSI1032E-70LJ84 PLSI1024 ISP 2032 110LT48 ISPLSI1032E-100LT100 isplsi1048c ISPLSI1032E-100LJ84 80lt100 PLSI1016
Text: , 3073 GenRad GR228X /e Series Teradyne Z1800 Series & Z8000 Series ­Vector Processor Option


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PDF 1-800-LATTICE 1000E, GAL16V8 GAL16V8Z GAL16LV8 GAL16VP8 GAL16LV8ZD GAL18V10 GAL20LV8ZD GAL20RA10 PLSI2032-150LJ PLSI1024-60LJ ispLSI1032E-70LJ84 PLSI1024 ISP 2032 110LT48 ISPLSI1032E-100LT100 isplsi1048c ISPLSI1032E-100LJ84 80lt100 PLSI1016
1999 - teradyne z1800 tester manual

Abstract: HP 3070 Manual HP 3070 series 3 Manual marconi 4200 tester manual marconi 4200 HP 3070 Tester gal programming algorithm diode M160 HP 3070 Tester operation allpro 88
Text: Model Hewlett Packard All testers, including: Models 3060, 3065, 3070, 3073 GenRad GR228X /e


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PDF 1-800-LATTICE pDS4104 teradyne z1800 tester manual HP 3070 Manual HP 3070 series 3 Manual marconi 4200 tester manual marconi 4200 HP 3070 Tester gal programming algorithm diode M160 HP 3070 Tester operation allpro 88
1998 - DC MOTOR SPEED CONTROL USING VHDL xilinx

Abstract: xilinx vhdl rs232 code gr228x structural vhdl code for ripple counter xilinx xc9536 digital clock xilinx uart verilog code PCIM 164 PCIM 176 XC4013XL PIN BG256 MATROX Mil
Text: No file text available


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PDF XC4000XV 500K-Gate XC5200 XLQ198 DC MOTOR SPEED CONTROL USING VHDL xilinx xilinx vhdl rs232 code gr228x structural vhdl code for ripple counter xilinx xc9536 digital clock xilinx uart verilog code PCIM 164 PCIM 176 XC4013XL PIN BG256 MATROX Mil
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