The Datasheet Archive

Top Results (4)

Part Manufacturer Description Datasheet Download Buy Part
DG442AK/883B Maxim Integrated Products SPST, 4 Func, 1 Channel, CMOS, CDIP16, CERAMIC, DIP-16
DG306AAK/883 Atmel Corporation DG306AAK/883
RN2108ACT(TPL3) Toshiba America Electronic Components PRE-BIASED DIGITAL TRANSISTOR,50V V(BR)CEO,80MA I(C),SOT-883
CEDM8001 TR Central Semiconductor Corp MOSFET P-CH 20V 0.1A SOT-883
SF Impression Pixel

Search Stock (2)

  You can filter table by choosing multiple options from dropdownShowing 2 results of 2
Part Manufacturer Supplier Stock Best Price Price Each Buy Part
DG442AK/883 Vishay Siliconix Bristol Electronics 7 $22.80 $22.80
DG442AK/883B Maxim Integrated Products Avnet - - -

No Results Found

Show More

DG442AK/883 datasheet (5)

Part Manufacturer Description Type PDF
DG442AK/883 Intersil Monolithic Quad SPST CMOS Analog Switch Original PDF
DG442AK/883 Others Historical semiconductor price guide (US$ - 1998). From our catalog scanning project. Scan PDF
DG442AK/883 Siliconix Quad SPST CMOS Analog Switches Scan PDF
DG442AK/883B Maxim Integrated Products Improved, Quad, SPST Analog Switches Original PDF
DG442AK/883B Maxim Integrated Products Improved, Quad, SPST Analog Switches Original PDF

DG442AK/883 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
2001 - 5962-92041

Abstract: No abstract text available
Text: documentation M Vendor self-certification to the requirements for MIL-STD- 883 compliant, nonJAN class , for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD- 883 MIL-STD-1835 - 1/ 2/ 3/ Test Method , conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD- 883 , criteria for device class M. a. Burn-in test, method 1015 of MIL-STD- 883 . (1) Test condition A or B , MIL-STD- 883 . b. Interim and final electrical test parameters shall be as specified in table II


Original
PDF 5962-R121-94. 1ES66 5962-92041
Not Available

Abstract: No abstract text available
Text: specifications. ' Contact factory for availability and processing to MIL-STD- 883 . Com m unications Systems


OCR Scan
PDF 441/D 441/DG442 500pA HP3571A 10dBm
DG441DY

Abstract: DG441 DG441DJ DG442 DG442DJ DG442DY DG441AK
Text: -Pin Narrow SOIC DG442DY DG441AK DG441AK/ 883 5962-9204101MEA 16-Pin CerDIP ­55 to 125_C DG442AK DG442AK/ 883 5962-9204102MEA 5962-9204101M2A LCC-20 5962-9204102M2A Absolute Maximum Ratings V


Original
PDF DG441/442 DG201A/DG202 DG441/44 VN0300L, DG442 DG441 S-52880--Rev. 28-Apr-97 DG441DY DG441DJ DG442 DG442DJ DG442DY DG441AK
DG441

Abstract: CS 442 J
Text: : CerDIP: DG441AK, DG441AK/ 883 DG442AK, DG442AK/ 883 Plastic: DG441DJ, DG442DJ DS XXIC 10505 9001 -


OCR Scan
PDF DG441/442 DG441) DG201A/DG202 DG441 DG441/442 CS 442 J
DG441

Abstract: AXd 155 5962-9204101M2A
Text: -Pin Plastic DIP P a rt N um ber DG441DJ DG442DJ DG441DY DG442DY DG441AK DG441AK/ 883 5962-9204101MEA DG442AK DG442AK/ 883 5962-9204102MEA 5962-9204101M2A 5962-9204102M2A fj; Siliconix A Member of the TBM 1CGroup


OCR Scan
PDF DG441/442 DG201A/DG202 DG441/442 DG441 DG442 P-32167--Rev. AXd 155 5962-9204101M2A
lcc-200

Abstract: dg441
Text: DG442DJ DG441DY DG442DY DG441AK DG441AK/ 883 5962-9204101MEA 16-Pin CerDIP -5 5 to 125°C DG442AK DG442AK/ 883 5962-9204102MEA 5962-9204101M2A LCC-20 5962-9204102M2A ABSOLUTE MAXIMUM RATINGS V +


OCR Scan
PDF DG441/442 DG201A/DG202 DG441/442 HP4192A E-77798-- 08-Mar-99 08-Mar-99 lcc-200 dg441
Not Available

Abstract: No abstract text available
Text: factory for availability and processing to MIL-STD- 883 . ' Heads-Up Displays Test Equipment


OCR Scan
PDF DG441/DG442 DG441 DG442 500pA) 250ns, 170ns. 500pA 10dBm
1999 - QUAD OP HIGH-VOLTAGE

Abstract: DG442DY DG441 DG441DJ DG441DY DG442 DG442DJ dg4420 DG441AK
Text: DG441DY 16-Pin 16 Pin Narrow SOIC DG442DY DG441AK DG441AK/ 883 5962-9204101MEA 16-Pin 16 Pin CerDIP ­55 to 125_C 55 DG442AK DG442AK/ 883 5962-9204102MEA LCC 20 LCC-20 5962-9204101M2A


Original
PDF DG441/442 DG201A/DG202 VN0300L, DG442 DG441 S-52880--Rev. 28-Apr-97 QUAD OP HIGH-VOLTAGE DG442DY DG441DJ DG441DY DG442 DG442DJ dg4420 DG441AK
AXd 155

Abstract: DG441
Text: 85°C 16-Pin Narrow SOIC Part N um ber DG441DJ DG442DJ DG441DY DG442DY DG441AK DG441AK/ 883 5962-9204101MEA 16-Pin CerDIP DG442AK -5 5 to 125°C DG442AK/ 883 5962-9204102MEA 5962-9204101M2A LCC


OCR Scan
PDF DG441/442 DG442) HP4192A P-32167--Rev. AXd 155 DG441
DG441

Abstract: SJ93 DG201 DG441DJ DG442 DG442DJ block diagram for automatic room power control us KSS 210 a
Text: DG442DY — 55 to 125°C 16-Pin CerDIP DG441AK DG441AK/ 883 5962-9204101MEA DG442AK DG442AK/ 883 5962-9204102MEA LCC-20 5962-9204101M2A 5962-9204102M2A Truth Table DG 441 0 ON OFF


OCR Scan
PDF DG441/442 DG201A/DG202 DG442 DG441 P-32167â SJ93 DG201 DG441DJ DG442 DG442DJ block diagram for automatic room power control us KSS 210 a
2002 - DG441

Abstract: DG441DJ DG441DY DG442 DG442DJ DG442DY dg4420 5962-9204102M2A DG441AK
Text: DG442DJ ­40 to 85_C _ DG441DY 16-Pin Narrow SOIC DG442DY DG441AK DG441AK/ 883 5962-9204101MEA 16-Pin CerDIP DG442AK ­55 to 125_C _ DG442AK/ 883 5962-9204102MEA 5962-9204101M2A LCC


Original
PDF DG441/442 DG201A/DG202 DG442 DG441 S-20147--Rev. 11-Mar-02 DG441DJ DG441DY DG442 DG442DJ DG442DY dg4420 5962-9204102M2A DG441AK
1997 - DG441

Abstract: DG441DJ DG441DY DG442 DG442DJ DG442DY
Text: Input DG441AK/ 883 16-Pin CerDIP 5962-9204101MEA DG442AK ­55 to 125_C DG442AK/ 883


Original
PDF DG441/442 DG201A/DG202 DG4415 VN0300 DG442 DG441 P-32167--Rev. 15-Nov-93 DG441DJ DG441DY DG442 DG442DJ DG442DY
1995 - DG441

Abstract: DG441AK DG441DJ DG441DY DG442 DG442DJ DG442DY
Text: p DG441AK/ 883 16Pin C DIP 16 Pi CerDIP 55 125 C -55 to 125_C 59629204101MEA DG442AK DG442AK/ 883 59629204102MEA LCC20 59629204101M2A 59629204102M2A Absolute Maximum Ratings V+ to


Original
PDF DG441/442 DG201A/DG202 VN0300 DG442 DG441 P32167Rev. DG441AK DG441DJ DG441DY DG442 DG442DJ DG442DY
5962-92041

Abstract: 5962-9204101M2C CQCC1-N20 DG441A GDIP1-T16 20-LCC 5962-9204101MEA 5962-9204102
Text: MilStd- 883 . Screening shall be in accordance with Method 5004 of Mil-Std- 883 . Burn-in test Method 1015 , 5005 of Mil-Std- 883 , including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std- 883 shall be omitted. Group , . Steady-state life test, Method 1005 of Mil-Std- 883 : 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std- 883 . TABLE 2. ELECTRICAL


Original
PDF DG441A /883B DG442A 5962-9204101M2C 5962-9204102M2C Mil-Std-1835 Mil-Std-1835 GDIP1-T16 CDIP2-T16 5962-92041 5962-9204101M2C CQCC1-N20 20-LCC 5962-9204101MEA 5962-9204102
Not Available

Abstract: No abstract text available
Text: -38535, Appendix A as specified in MilStd- 883 . Screening shall be in accordance with Method 5004 of Mil-Std- 883 , accordance with Method 5005 of Mil-Std- 883 , including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std- 883 shall be , . Steady-state life test, Method 1005 of Mil-Std- 883 : 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std- 883 . TABLE 2. ELECTRICAL


Original
PDF DG441A /883B DG442A /883B Mil-Std-1835 GDIP1-T16 CDIP2-T16 CQCC1-N20 20-Pin
1996 - TCA780

Abstract: TFK U 111 B TFK U 4614 B TFK S 186 P TFK U 217 B TFK BP w 41 n TFK BPW 41 N Tfk 880 TFK 148 TDSR 5150 G
Text: DG506ACJ DG506ACK DG506ACJ DG506ABK DG506AAK DG506AAZ/ 883 Page 14 of 128 Approximate ReplacemenMfg , ADG200AA/ 883 ADG200AP ADG200AP/ 883 ADG200BA ADG200BP ADG200CJ ADG201ABQ ADG201ABQ ADG201AKN ADG201AKR ADG201ATE ADG201ATE/883B ADG201ATQ ADG201ATQ/ 883 ADG201BQ ADG201CJ ADG201HSAQ ADG201HSBQ , DG506AAK DG507ACJ DG507ABK DG507ACJ DG507ABK DG507AAK DG507AAZ/ 883 DG507AAK DG201BAK DG441AK DG201BDJ DG201BDY 5962-9204101M2A 5962-9204101M2A DG441AK DG441AK/ 883 DG441AK DG441DJ DG201HSAK/ 883


Original
PDF 1N3245 1N3611GP 1N3612GP 1N3613GP 1N3614GP 1N3725 1N3957GP 1N4001GP 1N4002GP 1N4003GP TCA780 TFK U 111 B TFK U 4614 B TFK S 186 P TFK U 217 B TFK BP w 41 n TFK BPW 41 N Tfk 880 TFK 148 TDSR 5150 G
2002 - Not Available

Abstract: No abstract text available
Text: -38535, Appendix A as specified in MilStd- 883 . Screening shall be in accordance with Method 5004 of Mil-Std- 883 , accordance with Method 5005 of Mil-Std- 883 , including Groups A, B, C, and D inspection. Group A inspection: 1. Tests as specified in Table 2. 2. Selected subgroups in Table 1, Method 5005 of Mil-Std- 883 shall be , . Steady-state life test, Method 1005 of Mil-Std- 883 : 1. Test condition A, B, C, D. 2. TA = +125°C, minimum. 3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std- 883 . TABLE 2. ELECTRICAL


Original
PDF DG441A /883B DG442A /883B Mil-Std-1835 GDIP1-T16 CDIP2-T16 CQCC1-N20 20-Pin
2000 - DG441

Abstract: DG441DJ DG441DY DG442 DG442DJ DG442DY
Text: DG441AK DG441AK/ 883 5962-9204101MEA 16-Pin C DIP 16 Pi CerDIP DG442AK ­55 to 125 C 55 125_C DG442AK/ 883 5962-9204102MEA 5962-9204101M2A LCC-20 5962-9204102M2A ABSOLUTE MAXIMUM RATINGS V


Original
PDF DG441/442 DG201A/DG202 DG441 DG442 E-77798--Rev. 08-Mar-99 DG441DJ DG441DY DG442 DG442DJ DG442DY
h13-5046

Abstract: No abstract text available
Text: 175 210 Toff (n*) TYP 280 150 160 Very Low Leakage, TTL Inputs MIL SPEC H11-5040/ 883 IH5140MJE/883B , H11-0305 HI2-0305 HI3-0305 HI9P0305 HI9P0305 H11-0301/ 883 HI2-0301/ 883 Selection Guide H11-0305/ 883 HI2-0305/ 883 50 11.0 3.5 44V CMOS-DI 0.04 160 100 CMOS Logic Vary Low , 44 V CMOS-JI 0.1 150 130 DG401 DG401AK/ 883 45 2.4 0.8 44V CMOS-JI -0.01 , 240 Toff (n8) TYP 500 FEATURES -2, -4, -5, -7 H11-0200/ 883 -2, -4, -5, -7 HI2-0200/ 883 -5 -5


OCR Scan
PDF HI1-5040 IH5140 H11-5040/883 IH5140MJE/883B HI1-0301 HI2-0301 HI3-0301 HI9P0301 H11-0305 h13-5046
DG3157

Abstract: INTERSIL Cross Reference Search dg403bdy ADG201ABQ DG211BDJ DG442LDY semiconductors cross reference MAX32xx MAX333ACWP DG2001DV
Text: ADG201ATQ DG201BAK YES ADI ADG201HSAQ DG201HSAK/ 883 YES For the most current information on Vishay Siliconix analog products, please visit us on the web at: ADI ADG201HSBQ DG201HSAK/ 883 YES , DG201HSDY YES YES YES ADI ADG201HSSQ DG201HSAK/ 883 YES YES YES ADI ADG201HSTQ DG201HSAK/ 883 YES YES YES ADI ADG202ABQ DG202BDK YES YES YES ADI , YES ADI ADG201HSAQ DG201HSAK/ 883 YES YES YES ADI ADG201HSBQ DG201HSAK/ 883


Original
PDF VMN-MS6328-0911 DG3157 INTERSIL Cross Reference Search dg403bdy ADG201ABQ DG211BDJ DG442LDY semiconductors cross reference MAX32xx MAX333ACWP DG2001DV
DG441

Abstract: DG442
Text: SB H A R R IS June 1994 S E M I C O N D U C T O R DG441/ 883 DG442/ 883 Monolithic Quad SPST CMOS Analog Switches Description The DG441/ 883 and DG442/ 883 monolithic CMOS analog switches are drop-in replacements for the popular DG201A/ 883 and DG202/ 883 series devices. They include four inde , faster switch time (t0 N <250ns) compared to the DG201 A/ 883 and DG202/ 883 . Charge injection has been reduced, simplifying sample and hold applications. The improvements in the DG441/ 883 series are made possi


OCR Scan
PDF DG441/883 DG442/883 DG442/883 DG201A/ DG202/883 250ns) DG201 DG202/883. DG441 DG442
Not Available

Abstract: No abstract text available
Text: H A R R DG441/ 883 DG442/ 883 I S S E M I C O N D U C T O R Monolithic Quad SPST CMOS Analog Switches June 1994 Features • Description The DG441/ 883 and DG442/ 883 monolithic CMOS analog switches are drop-in replacements for the popular DG201A/ 883 and DG202/ 883 series , / 883 and DG202/ 883 . Charge injection has been reduced, simplifying sample and hold applications. - t 0N <250ns - t 0 FF <120ns (DG441/ 883 ) • Low Charge Injection The improvements in the DG441


OCR Scan
PDF DG441/883 DG442/883 DG441/883 DG442/883 DG201A/ DG202/883 MIL-STD883 MIL-STD-883 43Q2271 DG441/883,
Not Available

Abstract: No abstract text available
Text: S DG441/ 883 , DG442/ 883 Harris T O R S E M I C O N D U C 7 Monolithic Quad SPST CMOS , to MILSTD- 883 and is Fully Conformant Under the Provi­ sions of Paragraph 1.2.1. â , / 883 and DG202/ 883 . Charge injection has been reduced, simplify­ ing sample and hold applications. ■^on <250ns - t0FF <120ns (DG441/ 883 ) • Low Charge Injection • Upgrade from DG201A/ 883 /DG202/ 883 • TTL, CMOS Compatible • Single or Split Supply Operation Applications • Audio


OCR Scan
PDF DG441/883, DG442/883 MILSTD-883 250ns) DG201 DG202/883. 250ns 120ns DG441/883) DG201A/883/DG202/883
2005 - DG441

Abstract: DG441DJ DG441DY DG442 DG442DJ DG442DY DG441AK
Text: DG442DJ ­40 to 85_C _ DG441DY 16-Pin Narrow SOIC DG442DY DG441AK DG441AK/ 883 5962-9204101MEA 16-Pin CerDIP DG442AK ­55 to 125_C _ DG442AK/ 883 5962-9204102MEA 5962-9204101M2A LCC


Original
PDF DG441/442 DG201A/DG202 08-Apr-05 DG441 DG441DJ DG441DY DG442 DG442DJ DG442DY DG441AK
DG441

Abstract: DJ118
Text: Ordering Information PART NUMBER DG441 AK/ 883 (Note 2) DG441DJ DG441DY DG441EJ (N otel) DG441EY (N otel) DG442AK/ 883 (Note 2) DG442DJ DG442DY TEMP. RANGE (°C) -5510 125 -40 to 85 -40 to 85 -40 to 85 -40 to 85


OCR Scan
PDF DG441, DG442 DG441 DG442 DG201A DG202 250ns) DG202. DJ118
Supplyframe Tracking Pixel