The Datasheet Archive

Top Results (4)

Part Manufacturer Description Datasheet Download Buy Part
CY7C109D-10VXI Cypress Semiconductor Standard SRAM, 128KX8, 10ns, CMOS, PDSO32, 0.400 INCH, LEAD FREE, SOJ-32
CY7C109D-10ZXI Cypress Semiconductor Standard SRAM, 128KX8, 10ns, CMOS, PDSO32, 8 X 20 MM, LEAD FREE, TSOP1-32
CY7C109D-10ZXIT Cypress Semiconductor Standard SRAM, 128KX8, 10ns, CMOS, PDSO32, 8 X 20 MM, LEAD FREE, TSOP1-32
CY7C109D-10VXIT Cypress Semiconductor Standard SRAM, 128KX8, 10ns, CMOS, PDSO32, 0.400 INCH, LEAD FREE, SOJ-32

CY7C109-VC Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
7C109A

Abstract: 8361H CY7C1009 JESD22 CY7C109-VC
Text: LIFE-EARLY FAILURE RATE (150C, 5.75V) FAIL MODE = 96053 CY7C109-VC KOREA-L 3552030 , CY7C109-VC KOREA-L 3601107 349601548 48 510 0 96053 CY7C109-VC KOREA-L 3602279 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH 96053 CY7C109-VC KOREA-L 3552030 349600865 128 48 0 96053 CY7C109-VC KOREA-L 3601107 349601548 128 , -STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 5.75V) 96053 96053 CY7C109-VC CY7C109-VC


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PDF CY7C1009 32-Pins, 300-mil 32-pin, 7C109A 85C/85 CY7C109-VC 7C109A 8361H CY7C1009 JESD22 CY7C109-VC
CY7C144V

Abstract: CY7C017 CY7C109-VC
Text: FAIL MODE = CY7C109-VC INDNS-O 4738602 519712560 COMP 3 0 -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 4738602 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 192 HRS 30C/60%RH CY7C109-VC INDNS-O 4738602 519712560 128 46 0 CY7C109-VC CY7C109-VC INDNS-O INDNS-O 4738564 4738564 519712898 519712898 128 256 46 46 0 0 CY7C109-VC INDNS-O 4739644 519714390 128 46 0


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PDF R42HD CY7C026 /CY7C036 CY7C025 /CY7C0251 CY7C024 /CY7C0241 CY7C09269 /CY7C09369 x16/18 CY7C144V CY7C017 CY7C109-VC
CY7C109-VC

Abstract: No abstract text available
Text: REJ = FAIL MODE = CY7C109-VC INDNS-O 4738602 519712560 , -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 4738602 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V, 85%RH), PRECOND. 192 HRS 30C/60%RH CY7C109-VC INDNS-O 4738602 519712560 128 46 0 CY7C109-VC CY7C109-VC INDNS-O INDNS-O 4738564 4738564 519712898 519712898 128 256 46 46 0 0 CY7C109-VC INDNS-O 4739644 519714390 128 46 0


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PDF CY62148 7C621485A) 32-pin CY62148 CY7C1049-VC CY7C1049-VCB 30C/60 CY7C109-VC
7C109A

Abstract: CY7C109 JESD22
Text: RELIABILITY TEST DATA QTP#: DEVICE = STRESS: CY7C109-VC ASSY-LOC = , 85C/85%RH INDNS-O 3613863 519607384 128 48 0 CY7C109-VC INDNS-O 3614995 , -STRESS: HIGH TEMPERATURE STORAGE (165C, NO BIAS) CY7C109-VC INDNS-O 3614995 519607385 336 48 0 CY7C109-VC INDNS-O 3614995 519607385 1000 48 0 -STRESS: TC COND. C, -65 TO 150C, PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 3613863


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PDF 28/32L, 400-MIL CY7C109 32-pin, 7C109A 85C/85 CY7C109-VC 7C109A CY7C109 JESD22
140C

Abstract: 7C109A CY7C109
Text: %RH, 5.5V), PRECONDITION DRY BAKE FAIL MODE = CY7C109-VC SEOL-L , -STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 5.75V) CY7C109-VC SEOL-L 3538909 349522649 80 78 0 CY7C109-VC SEOL-L 3538909 349522649 168 78 0 -STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 5.75V) CY7C109-VC SEOL-L 3538909 349522649 80 118 0 CY7C109-VC SEOL-L 3538909 349522649 500 118 0


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PDF CY7C109 32-pin, 400-mil 7C109A Mat501923 CY7C194-VC 140C 7C109A CY7C109
cel hitachi

Abstract: hitachi mold cel CY62256 JESD22
Text: = CY7C109-VC INDNS-O 4738602 519712560 COMP 3 0 -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 4738602 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 192 HRS 30C/60%RH CY7C109-VC INDNS-O 4738602 519712560 128 46 0 CY7C109-VC CY7C109-VC INDNS-O INDNS-O 4738564 4738564 519712898 519712898 128 256 46 46 0 0 CY7C109-VC INDNS-O 4739644 519714390 128 46 0


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PDF CY62256 7C62256E) CY62256, CY7C109-VC 30C/60 cel hitachi hitachi mold cel CY62256 JESD22
CY7C1006

Abstract: No abstract text available
Text: STRESS: ESD-CHARGE DEVICE MODEL (1000V) DURATION = S/S = REJ = CY7C109-VC , -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015 (2200V) CY7C109-VC INDNS-O 4722615 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 4722615 519708180 128 48 0 CY7C109-VC INDNS-O 4722615 519708180 256 48 0 -STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 5.75V) CY7C109-VC INDNS-O 4722615 519708180 80 79


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PDF CY7C106/CY7C1006 Pins-400/300 CY7C107/CY7C1007 CY7C109/CY7C1009 CY7C106/107/109/1009 CY7C106/1006 CY7C107/1007 CY7C109/1009 CY7C1006
AF 238

Abstract: 7C109A CY7C106A CY7C109 FR28
Text: CY7C109-VC INDNS-O 3804290 519802969 COMP 3 0 -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 3804290 , -STRESS: TC COND. C, -65 TO 150C, PRECOND. 192 HRS 30C/60%RH CY7C109-VC CY7C109-VC INDNS-O INDNS-O 3804290 3804290 519802968 519802968 300 1000 48 45 0 0 CY7C109-VC INDNS-O 3804290 519802969 300 48 0 CY7C109-VC INDNS-O 3804278 519802970 300 48 0


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PDF CY7C106A CY7C109 CY7C106A/CY7C109, 7C109F CY7C106A/CY7C109 32-pin, CY7C109-VC 85C/85 AF 238 7C109A CY7C106A CY7C109 FR28
7C109A

Abstract: CY7C109
Text: MODE = CY7C109-VC INDNS-O 4738602 519712560 COMP 3 0 -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 4738602 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 192 HRS 30C/60%RH CY7C109-VC INDNS-O 4738602 519712560 128 46 0 CY7C109-VC CY7C109-VC INDNS-O INDNS-O 4738564 4738564 519712898 519712898 128 256 46 46 0 0 CY7C109-VC INDNS-O 4739644 519714390 128 46 0


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PDF R42HD CY7C109/CY7C1009 R42DH CY7C109 7C109H) 32-pin, 400-mil CY7C109-VC 7C109A CY7C109
7C109A

Abstract: CY7C106A CY7C109 JESD22
Text: = STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 5.75V) 96053 CY7C109-VCB , 759 CY7C109-VC SEOL-L 3601107 349601548 48 510 0 96053 CY7C109-VC SEOL-L , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH 96053 CY7C109-VCB SEOL-L 3552030 349600865 128 48 0 96053 CY7C109-VC SEOL-L 3601107 349601548 128 , -STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 5.75V) 96053 96053 CY7C109-VCB CY7C109-VCB


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PDF CY7C106A CY7C109 32-pin, 400-mil 7C109A 85C/85 CY7C109-VCB CY7C109-VC 7C109A CY7C106A CY7C109 JESD22
Hitachi-CEL9200

Abstract: CY7C109 JESD22
Text: = CY7C109-VC INDNS-O 4726848 519708433 48 538 0 1 EOS , 0 CY7C109-VC INDNS-O 4726848 519708433 COMP 3 0 , CY7C109-VC INDNS-O 4726848 519708433 COMP 3 0 -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 4726848 , -STRESS: HIGH TEMPERATURE STORAGE (165C, NO BIAS) CY7C109-VC INDNS-O 4726848 519708433 336 46 0


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PDF CY7C109/CY7C1009 CY7C109V33/CY7C1009V33 CY7C109 7C109G/7C1309G) CY7C109/CY7C1009/CY7C109V33/CY7C1009V33 32-pin, 400-mil 30C/60 Hitachi-CEL9200 CY7C109 JESD22
145AA

Abstract: FIT4 8361H CY7C1399 CY7C199 JESD22
Text: ) FAIL MODE = CY7C109-VC INDNS-O 4726848 519708433 48 538 0 1 , -STRESS: ESD-CHARGE DEVICE MODEL (2000V) CY7C109-VC INDNS-O 4726848 519708433 COMP 3 0 -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015 (2200V) CY7C109-VC INDNS-O 4726848 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 4726848 , -STRESS: HIGH TEMPERATURE STORAGE (165C, NO BIAS) CY7C109-VC INDNS-O 4726848 519708433 336 46 0


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PDF CY7C199 CY7C1399 CY7C199/CY7C1399 28-pin, 300-mil 048-SC 30C/60 CY7C1049-VC 145AA FIT4 8361H CY7C1399 CY7C199 JESD22
CY7C106A

Abstract: 84-1MISR4 CY7C109 R28 transistors
Text: MODE = CY7C109-VC INDNS-O 4646419 519615484 COMP 3 0 -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015 (2200V) CY7C109-VC INDNS-O 4646419 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 4646419 , -STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 5.75V) CY7C109-VC CY7C109-VC INDNS-O INDNS-O 4646419 4646419 519615484 519615484 80 168 80 80 0 0 CY7C109-VC INDNS-O 4646419


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PDF CY7C106A CY7C109 CY7C106A/CY7C109 32-pin, CY7C109-VC 85C/85 CY7C106A 84-1MISR4 CY7C109 R28 transistors
SOJ package MSL

Abstract: 7C109A CY7C109 JESD22 R42HD R42HD FAB4
Text: (150C, 5.75V) FAIL MODE = CY7C109-VC INDNS-O 4802677 519802689/90 48 498 0 CY7C109-VC INDNS-O 4802677 519802689/90 48 1491 0 2 PARTICLES, 1 OTHERS (note 1) CY7C109-VC INDNS-O 4802677 519802689/90 48 1664 0 1 PARTICLE, 1 OTHER (note 1) -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 4802677 , -STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 5.75V) CY7C109-VC INDNS-O 4802677


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PDF R42HD CY7C109/CY7C1009 CY7C109 7C109H) R42HD 32-pin, 400-mil SOJ package MSL 7C109A CY7C109 JESD22 R42HD FAB4
7C109A

Abstract: 8361H CY62128 JESD22 96081
Text: 96053 CY7C109-VC KOREA-L 3552030 349600865 48 510 CY7C106A-VC KOREA-L 3552030 349600923 48 759 0 96053 CY7C109-VC KOREA-L 3601107 349601548 48 510 0 96053 CY7C109-VC KOREA-L 3602279 349601780 48 506 = 0 96081 = 0 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH 96053 CY7C109-VC KOREA-L 3552030 349600865 128 48 0 96053 CY7C109-VC KOREA-L 3601107 349601548 128


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PDF CY62128 32-Pins, 450-mil 32-pin, 7C109A CY7C109-VC 7C109A 8361H CY62128 JESD22 96081
8361H

Abstract: CY7C09079 CY7C09089 CY7C09099 CY7C09269 CY7C09279 Hitachi-CEL9200 7C03 R42HD FAB4
Text: REJ = FAIL MODE = CY7C109-VC INDNS-O 4738602 519712560 , -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 4738602 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V, 85% RH), PRECOND. 192 HRS 30C/60%RH CY7C109-VC INDNS-O 4738602 519712560 128 46 0 CY7C109-VC CY7C109-VC INDNS-O INDNS-O 4738564 4738564 519712898 519712898 128 256 46 46 0 0 CY7C109-VC INDNS-O 4739644 519714390 128 46 0


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PDF R42HD CY7C09079 /CY7C09179 CY7C09089 /CY7C09189 CY7C09099 /CY7C09199 CY7C09269 /CY7C09369 x16/18 8361H CY7C09279 Hitachi-CEL9200 7C03 R42HD FAB4
84-1LMISR4

Abstract: No abstract text available
Text: = CY7C109-VC INDNS-O 4738602 519712560 COMP 3 0 -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 4738602 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 192 HRS 30C/60%RH CY7C109-VC INDNS-O 4738602 519712560 128 46 0 CY7C109-VC INDNS-O 4738564 519712898 128 46 0 CY7C109-VC INDNS-O 4738564 519712898 256 46 0 CY7C109-VC INDNS-O 4739644 519714390 128 46 0


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PDF R42HD CY7C1031/CY7C1032 R42DH CY7C1032 CY7C1032/31. 52-pin CY7C109-VC 84-1LMISR4
7C109B

Abstract: CU7C109-VC CY7C109 EME-6300H
Text: Early Failure Rate Device Assy Lot # Fab Lot # 48 Hours Cumulative CY7C109-VC CY7C109-VC 49403634 49403973 3406190 3408310 0/457 0/340 0/1040 CU7C109-VC 49404374 , Device Assy Lot # Fab Lot # 80 Hours 500 Hours Cumulative CY7C109-VC CY7C109-VC , Cumulative CY7C109-VC CY7C109-VC 49403634 49403973 3406190 3408310 0/80 0/76 0/80 0/76 , Cycles Cumulative CY7C109-VC CY7C109-VC 49403634 49403973 3406190 3408310 0/45 0/45


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PDF CY7C109 400-mil 7C109B June/1994 CY7C109-VC 7C109B CU7C109-VC CY7C109 EME-6300H
sumitomo epoxy

Abstract: 7C109A CY7C109 EME TI
Text: STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 5.75V) CY7C109-VC SEOL-L 3540122 349523599 48 750 FAIL MODE = 0 CY7C109-VC , -STRESS: HI-ACCEL SATURATION TEST (140C, 85%RH, 5.5V), PRECONDITION DRY BAKE CY7C109-VC SEOL-L 3540122 349523599 128 48 4 3 BROKEN BOND NECK CY7C109-VC SEOL-L 3540140 349523601 , -STRESS: HIGH TEMPERATURE STORAGE (165C, NO BIAS) CY7C109-VC CY7C109-VC SEOL-L SEOL-L 3540122


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PDF EME-9300 CY7C109 32-pin, 400-mil CY7C109) 7C109A PassivaY7C109-VC CY7C109-VC sumitomo epoxy 7C109A CY7C109 EME TI
7C109A

Abstract: CY7C106A CY7C109 JESD22
Text: (150C, 5.75V) CY7C109-VC INDNS-O 3627860 519610489 48 510 0 CY7C109-VC INDNS-O 3631357 519610871 48 510 0 CY7C109-VC INDNS-O 3630218 519610893 48 510 0 -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 3627860 519610489 128 48 0 CY7C109-VC INDNS-O 3630218 519610893 128 48 0 CY7C109-VC INDNS-O 3632497 519611457 128 48 0


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PDF CY7C106A CY7C109 32-pin, 400-mil 7C109A CY7C109-VC 85C/85 7C109A CY7C106A CY7C109 JESD22
hitachi mold cel

Abstract: 9200 hitachi CEL9200 cel hitachi cel-9200 cel 9200 Hitachi CEL JESD22 8361H 140C
Text: ), PRECOND. 168 HRS 85C/85%RH FAIL MODE = CY7C109-VC INDNS-O 4722615 , -STRESS: HIGH TEMPERATURE STORAGE (165C, NO BIAS) CY7C109-VC INDNS-O 4722615 519708179 336 49 0 CY7C109-VC INDNS-O 4722615 519708179 500 48 0 CY7C109-VC INDNS-O 4722615 519708179 1000 48 0 -STRESS: TC COND. C, -65 TO 150C, PRECOND. 168 HRS 85C/85%RH CY7C109-VC CY7C109-VC INDNS-O INDNS-O


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PDF CEL9200 CEL9200 8361H CY7C109-VC 85C/85 CY7C107-VC hitachi mold cel 9200 hitachi cel hitachi cel-9200 cel 9200 Hitachi CEL JESD22 8361H 140C
CY7C109-VC

Abstract: 140C
Text: REJ = FAIL MODE = CY7C109-VC INDNS-O 4738602 519712560 , -STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015, 2200V CY7C109-VC INDNS-O 4738602 , -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 192 HRS 30C/60%RH CY7C109-VC INDNS-O 4738602 519712560 128 46 0 CY7C109-VC CY7C109-VC INDNS-O INDNS-O 4738564 4738564 519712898 519712898 128 256 46 46 0 0 CY7C109-VC INDNS-O 4739644 519714390 128 46 0


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PDF CY7C1031-JC CY7C109-VC 30C/60 CY7C109-VC 140C
QMI2419

Abstract: CY7C197 CY7C199 precondition DIP JEDEC
Text: = CY7C109-VC INDNS-O 4802677 519802689/90 48 498 0 CY7C109-VC INDNS-O 4802677 519802689/90 48 1491 0 CY7C109-VC INDNS-O 4802677 519802689/90 48 1664 0 -STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7C109-VC INDNS-O 4802677 , -STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 5.75V) CY7C109-VC INDNS-O 4802677 519802689/90 80 385 0 CY7C109-VC INDNS-O 4802677 519802689/90 500 383 0


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PDF R42HDHA CY7C194/195 CY7C197 CY7C198/199 CY7C199 7C1599G) R42HD 98------STRESS: CY7C109-VC QMI2419 CY7C197 CY7C199 precondition DIP JEDEC
CY7199

Abstract: mos die CY7C109 CY7C199 EME-6300H JESD22-A112
Text: Device Assy Lot# Fab Lot # 48 Hours Cumulative CY7C109-VC CY7C199-VC 349412320 , Cumulative CY7C109-VC 349412320 3432982 0/120 0/120 0/240 CY7C199-VC 349410144 , CY7C109-VC 349412320 3432982 0/95 1000 Cycles 0/95 Cumulative 0/95 Autoclave (PCT, No , Hours Cumulative CY7C109-VC CY7C199-VC 349412320 349410144 3432982 3429771 0/46 0/54 , # Fab Lot# 128 Hours Cumulative CY7C109-VC CY7C199-VC 349412320 349410144 3432982


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PDF CY7C109/CY7C199 CY7199) CY7C109) CY7C199) 7C199A 7C109 Oct/1994 CY7199 mos die CY7C109 CY7C199 EME-6300H JESD22-A112
Ablestik 84-1MISR4

Abstract: 84-1MISR4 MP-8000 JESD22 CY7C457 CY7C199 CY7C109 Nitto CY7C384 CERQUAD
Text: 0 CY7C109-VC SEOL-L 3621836 349608918 48 506 0 1 RETEST GOOD , 4611121 219606653 128 46 0 CY7C109-VC SEOL-L 3621836 349608918 128 48 0 , CY7C109-VC SEOL-L 3621836 349608918 80 120 0 CY7C109-VC SEOL-L 3621836 349608918 500 120 0 , ALPHA-X 4611121 4611121 219606653 219606653 300 1000 48 48 0 0 CY7C109-VC SEOL-L


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PDF CY7C199/CY7C109/CY7C457/CY7C384/CY100E383 52-pin CY7C457) 84-pin CY7384) 28-pin CY7C199) 32-pin CY7C109) EME-9300 Ablestik 84-1MISR4 84-1MISR4 MP-8000 JESD22 CY7C457 CY7C199 CY7C109 Nitto CY7C384 CERQUAD
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