SNJ54BCT8245AFK
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Texas Instruments
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Scan Test Devices With Octal Bus Transceivers 28-LCCC -55 to 125 |
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SN74BCT8240ADW
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Texas Instruments
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IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 |
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SN74BCT8245ADW
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Texas Instruments
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IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70 |
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SNJ54BCT8374AJT
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Texas Instruments
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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 |
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SNJ54BCT8245AJT
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Texas Instruments
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Scan Test Devices With Octal Bus Transceivers 24-CDIP -55 to 125 |
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SN74BCT8244ADW
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Texas Instruments
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IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
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