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AN1955 datasheet (1)

Part Manufacturer Description Type PDF
AN1955 Freescale Semiconductor Thermal Measurement Methodology of RF Power Amplifiers Original PDF

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2009 - AN1955

Abstract: Power di123 LM5009AMM di-123 C1608X7R1H103M dr73-331-r AN-1955. P6137 LM5009AEVAL LM5009A
Text: . AN-1955 © 2009 National Semiconductor Corporation 300938 www.national.com AN-1955 , is typically less than 10 mVp-p. See Figure 4 and Figure 8. 3 www.national.com AN-1955 , A above by AN-1955 30093808 FIGURE 4. Minimum Output Ripple Configuration where VFB is , AN-1955 30093809 FIGURE 5. Complete Evaluation Board Schematic (As Supplied) Bill of , www.national.com AN-1955 Circuit Performance 30093810 FIGURE 6. Efficiency vs Load Current 30093811


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PDF LM5009AEVAL LM5009A AN-1955 AN1955 Power di123 LM5009AMM di-123 C1608X7R1H103M dr73-331-r AN-1955. P6137
2009 - tdk F20-330 A53

Abstract: No abstract text available
Text: User's Guide SNVA392A – June 2009 – Revised April 2013 AN-1955 LM5009A Evaluation Board , Documentation Feedback AN-1955 LM5009A Evaluation Board Copyright © 2009–2013, Texas Instruments , the most economical solution. The circuit is shown in Figure 2 and Figure 8. 2 AN-1955 LM5009A , €“ June 2009 – Revised April 2013 Submit Documentation Feedback AN-1955 LM5009A Evaluation Board , VFB = 2.5V. A standard value 715 kΩ resistor is used. 4 AN-1955 LM5009A Evaluation Board


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PDF SNVA392A AN-1955 LM5009A LM5009AEVAL tdk F20-330 A53
2004 - AN1955

Abstract: AN1955 rf integrated circuit
Text: Freescale Semiconductor Application Note AN1955 Rev. 0, 1/2004 Thermal Measurement , Thermocouple AN1955 1 #4-40 Stainless Cap Screws Die Temperature (TJ) Measured with IR Microscope , measured by the IR scan and AN1955 2 RF Application Information Freescale Semiconductor used in , . REFERENCES AN1955 RF Application Information Freescale Semiconductor 3 Appendix: Coating , RF Devices," Proceedings of IEEE MTT - S International Microwave Symposium, May 2001. AN1955 4


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PDF AN1955 AN1955 AN1955 rf integrated circuit
2004 - AN1955

Abstract: dupont delrin infrared temperature measure Motorola Microwave power Transistor EMISSIVITY
Text: by AN1955 /D AN1955 Thermal Measurement Methodology of RF Power Amplifiers Prepared by: Mali , : www.freescale.com 1 Freescale Semiconductor, Inc. AN1955 #4-40 Stainless Cap Screws Die Temperature , DATA AN1955 power amplifiers. Integral to this measurement methodology are: · Using infrared , Semiconductor, Inc. AN1955 Appendix: Coating Methodology for Infrared Thermal Measurement of RF Power , For More Information On This Product, APPLICATION INFORMATION AN1955 /D Go to: www.freescale.com


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PDF AN1955/D AN1955 AN1955 dupont delrin infrared temperature measure Motorola Microwave power Transistor EMISSIVITY
2013 - RC0402JR-071K21L

Abstract: 1210 QFN 22A115 JESD A114 MMA25312BT1 Freescale Kinetis
Text: Value (3) 92 Unit C/W 3. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. Freescale , your design process. Application Notes AN1955 : Thermal Measurement Methodology of RF Power Amplifiers


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PDF MMA25312B MMA25312BT1 MMA25312B RC0402JR-071K21L 1210 QFN 22A115 JESD A114 MMA25312BT1 Freescale Kinetis
2012 - RC0402JR-071K20L

Abstract: GRM155R61A105KE15 YAGEO CAPACITOR 04023J1R8BBS MMZ25332B
Text: . Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. © Freescale Semiconductor, Inc., 2012. All , following documents, software and tools to aid your design process. Application Notes · AN1955 : Thermal


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PDF MMZ25332B 11g/n) MMZ25332BT1 MMZ25332B RC0402JR-071K20L GRM155R61A105KE15 YAGEO CAPACITOR 04023J1R8BBS
2015 - ISL84781

Abstract: No abstract text available
Text: . FIGURE 13. FIGURE 14. FIGURE 15. June 17, 2015 AN1955.0 Point of Load Monitoring Design Idea . . . , 23 Submit Document Feedback 2 AN1955.0 June 17, 2015 Application Note 1955 , error: <0.05% AN1955.0 June 17, 2015 Application Note 1955 R shunt RSH 0.32 (EQ. 1 , . Equation 1 on page 4 shows the formula used to calculate Rshunt. AN1955.0 June 17, 2015 Application , CURRENT DRIVE CAPABILITY AN1955.0 June 17, 2015 Application Note 1955 The digital-to-analog


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PDF ISL28022 ISL28025 ISL28025 AN1955 ISL84781
2009 - AN1955

Abstract: J1311 MRF7P20040H J1240 j182 semiconductor ATC600F2R4AT250XT JESD22 A115 A114 CRCW12061000FKEA
Text: . 3. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/ Application Notes - AN1955. © Freescale Semiconductor, Inc., 2009. All , Documentation/ Application Notes - AN1955. 3. Each side of device measured separately. 4. Part internally , Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 2. Refer to AN1955 , process. Application Notes · AN1955 : Thermal Measurement Methodology of RF Power Amplifiers Engineering


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PDF MRF7P20040H MRF7P20040HR3 MRF7P20040HSR3 MRF7P20040HR3 AN1955 J1311 MRF7P20040H J1240 j182 semiconductor ATC600F2R4AT250XT JESD22 A115 A114 CRCW12061000FKEA
GRM55DR61H106KA88B

Abstract: No abstract text available
Text: MTTF calculators by product. 3. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. ï , process. Application Notes  AN1955 : Thermal Measurement Methodology of RF Power Amplifiers


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PDF MHT1000H MHT1000HR5 GRM55DR61H106KA88B
Z25 transistor

Abstract: Z27 transistor
Text: - AN1955. 4. Exceeds recommended operating conditions. See CW operation data in Maximum Ratings , /Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955 , Thermal Measurement , resources to aid your design process. Application Notes  AN1955 : Thermal Measurement Methodology of RF


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PDF MHT1001H MHT1001HR5 Z25 transistor Z27 transistor
2009 - AN1955

Abstract: j1303 C3225X7R1H225KT RO4350B Rogers RO4350B CRCW12061000FKEA A114 J1311 JESD22 MRF7P20040H
Text: . 3. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/ Application Notes - AN1955. © Freescale Semiconductor, Inc., 2009. All , to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/ Application Notes - AN1955. 3. Side A and Side B are tied together for this , process. Application Notes · AN1955 : Thermal Measurement Methodology of RF Power Amplifiers Engineering


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PDF MRF7P20040H MRF7P20040HR3 MRF7P20040HSR3 MRF7P20040HR3 AN1955 j1303 C3225X7R1H225KT RO4350B Rogers RO4350B CRCW12061000FKEA A114 J1311 JESD22 MRF7P20040H
Not Available

Abstract: No abstract text available
Text: ) Unit RJC 16 C/W 3. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955.  , tools to aid your design process. Application Notes  AN1955 : Thermal Measurement Methodology of RF


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PDF MMZ25332B MMZ25332BT1 MMZ25332B 11g/n)
2014 - M38151

Abstract: No abstract text available
Text: system. 2. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955.  Freescale Semiconductor, Inc., 2014 , design process. Application Notes  AN1955 : Thermal Measurement Methodology of RF Power Amplifiers ï


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PDF MMG38151B MMG38151BT1 MMG38151BT1 M38151
2007 - MW6IC2420N

Abstract: AN1955 MW6IC2420NB JESD22 C101 AN1977 A115 A114 A113 MW6IC2420NBR1
Text: /Application Notes - AN1955. (continued) MW6IC2420NBR1 2 RF Device Data Freescale Semiconductor , 10 dB Adjacent Channel Power Ratio Input Return Loss 1. Refer to AN1955 , Thermal , Power RF Devices in Plastic Packages · AN1955 : Thermal Measurement Methodology of RF Power Amplifiers


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PDF MW6IC2420N MW6IC2420NB MW6IC2420NBR1 MW6IC2420N AN1955 JESD22 C101 AN1977 A115 A114 A113 MW6IC2420NBR1
2014 - Not Available

Abstract: No abstract text available
Text: - AN1955.  Freescale Semiconductor, Inc., 2014. All rights reserved. RF Device Data , /Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955 , Thermal Measurement , design process. Application Notes  AN1955 : Thermal Measurement Methodology of RF Power Amplifiers


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PDF MMRF1011H MMRF1011HR5 MMRF1011HSR5 MMRF1011HR5 7/2014Semiconductor,
2010 - J280

Abstract: MRF8S19140H MRF8S19140HS J589 J296 C1825C564J5RACTU mrf8s19140 MCRH63V337M13X21-RH MRF8S19140HR3 ATC800B0R8BT500XT
Text: /Application Notes - AN1955. © Freescale Semiconductor, Inc., 2010. All rights reserved. RF Device Data , Tools/Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955 , Thermal , . Application Notes · AN1955 : Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins ·


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PDF MRF8S19140H MRF8S19140HR3 MRF8S19140HSR3 MRF8S19140HR3 J280 MRF8S19140H MRF8S19140HS J589 J296 C1825C564J5RACTU mrf8s19140 MCRH63V337M13X21-RH ATC800B0R8BT500XT
2008 - MRF18085A

Abstract: No abstract text available
Text: Model Class 1 (Minimum) M3 (Minimum) 1. Refer to AN1955 /D, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. , €¢ AN1955 : Thermal Measurement Methodology of RF Power Amplifiers REVISION HISTORY The following table


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PDF MRF18085A MRF18085ALSR3 MRF18085A
2013 - Not Available

Abstract: No abstract text available
Text: Documentation/Application Notes − AN1955. This document contains information on a preproduction product , Vdc, 55 mA, no RF applied Symbol Value (4) Unit RθJC 77 °C/W 4. Refer to AN1955 , €¢ AN1955 : Thermal Measurement Methodology of RF Power Amplifiers Software • .s2p File Development


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PDF MML09231H MML09231HT1 MML09231H
2008 - Not Available

Abstract: No abstract text available
Text: calculators by product. 2. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. ATTENTION: The , €¢ AN1955 : Thermal Measurement Methodology of RF Power Amplifiers • AN3263: Bolt Down Mounting Method for


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PDF MRF6V4300N MRF6V4300NR1 MRF6V4300NBR1 MRF6V4300NR1
2010 - FR408

Abstract: 06035J100GBS MARKING HBT 25c2625 GRM188R71H104KA93 AN1955 RR0816Q-121-D MMA20312 MMA20312BT1 06035J5R6BBS
Text: 3. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. © Freescale Semiconductor, Inc., 2010 , your design process. Application Notes · AN1955 : Thermal Measurement Methodology of RF Power


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PDF MMA20312B MMA20312BT1 MMA20312B FR408 06035J100GBS MARKING HBT 25c2625 GRM188R71H104KA93 AN1955 RR0816Q-121-D MMA20312 MMA20312BT1 06035J5R6BBS
2007 - GRM55DR61H106KA88B

Abstract: AN1955 MRF6S24140H MRF6S24140HR3 MRF6S24140HSR3
Text: - AN1955. © Freescale Semiconductor, Inc., 2007-2010. All rights reserved. RF Device Data , Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955 , Thermal Measurement , design process. Application Notes · AN1955 : Thermal Measurement Methodology of RF Power Amplifiers


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PDF MRF6S24140H MRF6S24140HR3 MRF6S24140HSR3 MRF6S24140HR3 GRM55DR61H106KA88B AN1955 MRF6S24140H MRF6S24140HSR3
2010 - MRFE6VP6300

Abstract: MRFE6VP6300H mrfe6vp6300hr MRFE6VP6300H date MRFE6VP GA3095-ALC 465M-01 ATC100B820JT500XT AN1955 1812SMS-R12JLC
Text: - AN1955. © Freescale Semiconductor, Inc., 2010. All rights reserved. RF Device Data , /Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955 , Thermal Measurement , . Application Notes · AN1955 : Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins ·


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PDF MRFE6VP6300H MRFE6VP6300HR3 MRFE6VP6300HSR3 MRFE6VP6300HR3 MRFE6VP6300 MRFE6VP6300H mrfe6vp6300hr MRFE6VP6300H date MRFE6VP GA3095-ALC 465M-01 ATC100B820JT500XT AN1955 1812SMS-R12JLC
2006 - 2508051107Y0

Abstract: NIPPON CAPACITORS GRM55DR61H106KA88B NACZF331M63V MRF6P24190HR6 AN1955 A115 C101 JESD22 A114
Text: access MTTF calculators by product. 3. Refer to AN1955 , Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes - AN1955. , process. Application Notes · AN1955 : Thermal Measurement Methodology of RF Power Amplifiers Engineering


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PDF MRF6P24190H MRF6P24190HR6 2508051107Y0 NIPPON CAPACITORS GRM55DR61H106KA88B NACZF331M63V MRF6P24190HR6 AN1955 A115 C101 JESD22 A114
2008 - C5750JF1H226ZT

Abstract: AN3263 C3225JB2A105KT tdk MRF6V4300N MRF6V4300NBR1 C3225JB2A105KT Resistor mttf JESD22-A113 MRF6V4300NR1 C3225CH2A153JT
Text: Documentation/Application Notes - AN1955. ATTENTION: The MRF6V4300N and MRF6V4300NB are high power devices and , Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 2. Refer to AN1955 , AN1907: Solder Reflow Attach Method for High Power RF Devices in Plastic Packages · AN1955 : Thermal


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PDF MRF6V4300N MRF6V4300NR1 MRF6V4300NBR1 MRF6V4300NR1 C5750JF1H226ZT AN3263 C3225JB2A105KT tdk MRF6V4300N MRF6V4300NBR1 C3225JB2A105KT Resistor mttf JESD22-A113 C3225CH2A153JT
2007 - Not Available

Abstract: No abstract text available
Text: /Application Notes - AN1955. © Freescale Semiconductor, Inc., 2007. All rights reserved. RF Device Data , /Application Software/Calculators to access the MTTF calculators by product. 2. Refer to AN1955 , Thermal , Packages • AN1955 : Thermal Measurement Methodology of RF Power Amplifiers • AN3263: Bolt Down


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PDF MRF6V2010N MRF6V2010NR1 MRF6V2010NBR1
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