TO-131 PACKAGE Search Results

4x40

Contextual Info: ^ÎD NT801-131 d a t a t r o n ic s 10Base-T Filter Module NT801-131 Features Integrated module for multiport concentrators Low common mode emissions Transfer molded SMD package Pick and place compatible Designed to withstand infra-red reflow soldering with

C67078-A5002-A4

Abstract: GPT05155
Contextual Info: 1 TEMPFET BTS 131 Features ● ● ● ● ● N channel Logic level Enhancement mode Temperature sensor with thyristor characteristic The drain pin is electrically shorted to the tab 1 Pin 1 2 3 G D S Type VDS ID RDS on) Package Ordering Code BTS 131

TMS27C128

Abstract: 27C128 Texas Instruments 27PC128 TI 27C128 TMS27PC128 27C128-12 PC128-15 27c128 SMLS128E-OCTOBER
Contextual Info: TMS27C128 131 072-BIT UV ERASABLE PROGRAMMABLE READ-ONLY MEMORY TMS27PC128 131 072-BIT PROGRAMMABLE READ-ONLY MEMORY SMLS128E–OCTOBER 1984–REVISED JANUARY 1993 This Data Sheet is Applicable to All TMS27C128s and TMS27PC128s Symbolized with Code “B” as Described on Page 12.

common anode alphanumeric displays

Contextual Info: LED displays High efficiency, single-character alphanumeric displays LA-131 AK Series The LA-131 AK series are LED alphanumeric displays designed to be used in bright locations. The height of the character is 25.4 mm, and the color is bright red. These displays have been

CFPP-57

Contextual Info: CFPP-57, -131 ISSUE 2; 15 OCTOBER 2004 Outline in mm 14.0 Delivery Options Tri-state HCMOS/TTL 5.0V (CFPP-57, -57I) 3 1 2 25pF HCMOS < 66.0MHz 50pF HCMOS > 66.0 to 150.0MHz 25pF 4.7±0.2 50pF 1.52 Tri-state HCMOS (3.3V) (CFPP-131, -131I) 5.08 Maximum Capacitive Load for:

CFPP-57

Abstract: IN4148
Contextual Info: CFPP-57, -131 ISSUE 3; 21 JULY 2005 Outline in mm 14.0 Delivery Options Tri-state HCMOS/TTL 5.0V (CFPP-57, -57I) 3 1 2 25pF HCMOS < 66.0MHz 50pF HCMOS > 66.0 to 150.0MHz 25pF 4.7±0.2 50pF 1.52 Tri-state HCMOS (3.3V) (CFPP-131, -131I) 5.08 Maximum Capacitive Load for:

27C128JL

Abstract: L27C128 tms27c128 27PC128NL tms27pc128 tms27c128j SMJ27C128
Contextual Info: TMS27C128 131 072-BIT UV ERASABLE PROGRAMMABLE READ-ONLY MEMORY TMS27PC128 131 072-BIT PROGRAMMABLE READ-ONLY MEMORY REV A - S M L S 128D — O C T O B E R 1984 This Data Sheet is Applicable to A ll TMS27C128S and TMS27PC128S Symbolized with Code “B" as Described on Page 7-12.

TIP130

Abstract: TIP132 TIP131 NPN POWER DARLINGTON TRANSISTORS
Contextual Info: SavantIC Semiconductor Product Specification Silicon NPN Darlington Power Transistors TIP130/131/132 DESCRIPTION •With TO-220C package ·DARLINGTON ·Collector saturation voltage ·Complement to type TIP135/136/137 APPLICATIONS ·Designed for general-purpose amplifier

TIP135

Abstract: TIP137 TIP136 tip137 equivalent Darlington 6A
Contextual Info: SavantIC Semiconductor Product Specification Silicon PNP Darlington Power Transistors TIP135/136/137 DESCRIPTION •With TO-220C package ·DARLINGTON ·Collector saturation voltage ·Complement to type TIP130/131/132 APPLICATIONS ·Designed for general-purpose amplifier

1A122

Abstract: 27C128-30 27C128-15
Contextual Info: SMJ27C128 131 072-BIT UV ERASABLE PROGRAMMABLE READ-ONLY MEMORY SGMS006C-AUGUST 1986-REVISED FEBRUARY 1993 Military Operating Temperature R a n g e . -5 5 °C to 125°C J PACKAGET TOP VIEW Processed to MIL-STD-883, Class B Organization . . . 16K x Vpp[

LM117

Abstract: LT117 R047 RH117 10659
Contextual Info: RELIABILITY DATA LM117 / 317 LT117 / 317 / RH117 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE HERMETIC TO-3 TO-220 NEWEST DATE CODE 3,485 8301 1,720 8401 378 8515 5,583 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE

LM137

Abstract: LT137 RH137
Contextual Info: RELIABILITY DATA LM137 / 337 LT137 / 337 RH137 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE HERMETIC TO-3 TO-220 NEWEST DATE CODE 2,240 8344 906 8410 133 8344 3,279 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE

40432

Abstract: 74900 74470 LT1431
Contextual Info: RELIABILITY DATA LT1431 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP TO-92 NEWEST DATE CODE 245 9109 698 9013 943 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE TO-92

LT1074

Abstract: LT1076 LT1176 R117 LT1176 equivalent
Contextual Info: RELIABILITY DATA LT1074 / LT1076 / LT1176 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE TO-3 DD PACK TO-220 NEWEST DATE CODE 77 0318 838 9148 1,598 9125 2,513 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE

LT1038

Abstract: K 9927 LT138 8613
Contextual Info: RELIABILITY DATA LT138/338 LM138/338 LT1038 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE TO-3 TO-220 NEWEST DATE CODE 694 8344 91 8601 785 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE

dd pack

Abstract: LT1580 0617
Contextual Info: RELIABILITY DATA LT1580 / 1581 / 1584 / 1585 / 1587 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE DD PACK TO-220 NEWEST DATE CODE 15 9542 915 9426 930 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE

LT1004

Abstract: 40173 R030 R-030
Contextual Info: RELIABILITY DATA LT1004 / LM185/285/385 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE HERMETIC SOIC/SOT/MSOP TO-92 NEWEST DATE CODE 890 8317 212 8601 4,456 8416 5,558 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE

interrupts of arm9

Abstract: KS8695PX M66EN ARM9
Contextual Info: Application Note 131 KS8695PX Configuration as PCI Guest Mode KS8695PX General Description The KS8695PX, Multi-Port PCI Gateway Solution, delivers a high level of networking integration, performance, and overall BOM cost savings, enabling original equipment manufacturers OEMs to

82439TX

Abstract: A3126
Contextual Info: 82439TX System Controller MTXC 39.0 Electrical Characteristics 39.1 Absolute Maximum Ratings Table 131. Absolute Maximum Ratings Parameter Warning: 39.2 Value Case Temperature under Bias 0°C to +85°C Storage Temperature -55°C to +150°C Voltage on 5 V tolerant pins with respect to ground

equivalent lm336

Abstract: LM336 22.5 lm3368 8449 C 331 to-92 LM136 LM236 LM336 LT1009 9327
Contextual Info: RELIABILITY DATA LT1009 / LM136 / LM236 / LM336 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE HERMETIC SOIC/SOT/MSOP TO-92 NEWEST DATE CODE 3,237 8311 84 9224 36,017 8301 39,338 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH

Contextual Info: 4BSS4S2 DD1S13D 131 • INR PD-9.738 International i»R Rectifier _IRFI634G HEXFET Pow er M O S F E T INTERNATIONAL RECTIFIER • • • • • Isolated Package High Voltage lsolation= 2.5KVRMS Sink to Lead Creepage Dist.= 4.8mm Dynamic dv/dt Rating

LT1034

Contextual Info: RELIABILITY DATA LT1034 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE HERMETIC SOIC/SOT/MSOP TO-92 NEWEST DATE CODE 104 8601 230 9513 5,604 8841 5,938 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE

LXES2TBCC4-028

Contextual Info: Silicon ESD protection device LXESxxB series Document No. LX–1-1122 Rev1.0 p1/35 1. Application This specification shall be applied to the ESD Protection Device. LXES03BAA1-110 LXES03BAA1-131 LXES1UBAB1-007 LXES1UBBB1-008 LXES1UBAA1-096 LXES1TBCC2-004 LXES1TBBB2-013

LXES2TBCC4-028

Contextual Info: Silicon ESD protection device LXESxxB series Document No. LX–1-1122 Rev1.0 p1/35 1. Application This specification shall be applied to the ESD Protection Device. LXES03BAA1-110 LXES03BAA1-131 LXES1UBAB1-007 LXES1UBBB1-008 LXES1UBAA1-096 LXES1TBCC2-004 LXES1TBBB2-013