TESTING Search Results
TESTING Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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FO-50LPBMTRJ0-001 |
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Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m | |||
SF-SFPPLOOPBK-003.5 |
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Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation | |||
FO-62.5LPBLC0-001 |
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Amphenol FO-62.5LPBLC0-001 LC Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m | |||
SF-SFP28LPB1W-0DB |
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Amphenol SF-SFP28LPB1W-0DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 0dB Attenuation & 1W Power Consumption | |||
SF-SFPPLOOPBK-0DB |
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Amphenol SF-SFPPLOOPBK-0DB SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 0dB Attenuation & 0W Power Consumption |
TESTING Datasheets (1)
Part | ECAD Model | Manufacturer | Description | Datasheet Type | PDF Size | Page count | |
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Testing and specifying FAST logic |
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AN202 - Testing and specifying FAST logic | Original | 77.84KB | 8 |
TESTING Price and Stock
Honeywell Sensing and Control GROUP-B-TESTINGGROUP B TESTING ES1177 |
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Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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GROUP-B-TESTING | Bulk | 10 |
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GROUP-B-TESTING |
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GROUP-B-TESTING |
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Micross Components AS21001R/XT-TESTING CHARGE- Virtual or Non-Physical Inventory (Software & Literature) (Alt: AS21001R/XT-TESTING CHARGE) |
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Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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AS21001R/XT-TESTING CHARGE | No Container | 8 Weeks | 1 |
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Amphenol Corporation GROUP A & B TESTING- Bulk (Alt: GROUP A & B TESTING) |
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Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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GROUP A & B TESTING | Bulk | 1 |
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Systium Technologies TERADYNE-526-SAFETY-EMC-TESTING- Virtual or Non-Physical Inventory (Software & Literature) (Alt: TERADYNE-526-SAFETY-EMC-TESTING) |
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Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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TERADYNE-526-SAFETY-EMC-TESTING | No Container | 1 |
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Sensitron Semiconductors FAI TESTING 1N6065AJAN- Virtual or Non-Physical Inventory (Software & Literature) (Alt: FAI TESTING 1N6065AJAN) |
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Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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FAI TESTING 1N6065AJAN | No Container | 16 Weeks | 1 |
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Get Quote |
TESTING Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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Upscreening
Abstract: ACT-5271SC-F10-M21C AMPF-128MDA coil gold detector military mcm cpu
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MIL-PRF-38534 Upscreening ACT-5271SC-F10-M21C AMPF-128MDA coil gold detector military mcm cpu | |
Contextual Info: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TSOP-6 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 1040 520 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 4045 408 010 130 C, 85 % RH 0.00 |
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M2003 08-May-12 | |
Contextual Info: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR MICRO FOOT STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS HAST 2805 280 500 130 °C, 85 % RH 0.00 Pressure Pot 1900 182 400 121°, 15 PSIG 0.00 Temp. Cycle |
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08-May-12 | |
Contextual Info: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR DPAK, TO-252, TO-251 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 40 20 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 1691 169 100 130 C, 85 % RH |
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O-252, O-251 M2003 08-May-12 | |
Contextual Info: Package Reliability www.vishay.com Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR SC-89 STRESS SAMPLE SIZE DEVICE HR./CYC CONDITION TOTAL FAILS BOND INT 160 80 000 200 C + N2 FAIL PERCENTAGE 0.00 HAST 1705 180 500 130 C, 85 % RH 0.00 0.00 |
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SC-89 M2003 08-May-12 | |
AQV25P
Abstract: AQV257 AQV252A AQV255A AQV257A AQV253A aqv252ax
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AQV25P) AQV25P AQV251) AQV251, AQV252 AQV253 AQV254 AQV259; AQV253H AQV25P AQV257 AQV252A AQV255A AQV257A AQV253A aqv252ax | |
*216EH
Abstract: AQW212EH
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AQW21PEH) AQW21PEH EN41003, EN60950 AQW210EH AQW214EH AQW216EH AQW212EH aqw21eh: *216EH AQW212EH | |
Contextual Info: Product Number: 19276 TESTER, X3 COMBO, WITH DUAL PLATE Features & Benefits: • • • • • • • • Simultaneous Testing Of Wrist Strap* And Foot Wear In Up To 3 Seconds Reduces time spent testing personal grounding devices* used in ESD Control Plans |
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Multimeter fluke 114
Abstract: N10140 4000 Counts Digital Multimeter
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Fluke-114 -36-FLUKE Multimeter fluke 114 N10140 4000 Counts Digital Multimeter | |
AQY412
Abstract: led cross reference AQY410
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AQY41S) AQY410S, AQY412S) 0V/350V/400V AQY41S AQY410S AQY414S AQY412S AQY412 led cross reference AQY410 | |
Contextual Info: 6235 POWER INDUCTORS High-Reliability Power Inductors ML512PJB • High temperature materials allow operation in ambient temperatures up to 155°C. ■ Special construction allows it to pass vibration testing to 80 G and shock testing to 1000 G. Core material Ferrite |
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ML512PJB ML587-1â | |
Contextual Info: 6020 POWER INDUCTORS High Reliability Power Inductors MS483PYA • High temperature materials allow operation in ambient temperatures up to 155°C ■ Passes vibration testing to 80 G and shock testing to 1000 G ■ Exceptionally low DCR – 1.6 mOhm ■ Soft saturation makes them ideal for VRM/VRD applications. |
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MS483PYA MS801-3â | |
Contextual Info: 4040 POWER INDUCTORS OutgassingCompliantPowerInductors AE465PYA • Exceptionally low DCR; soft saturation ■ Passes NASA low outgassing specifications ■ High temperature materials allow operation in ambient temperatures up to 155°C. ■ Passes vibration testing to 80 G and shock testing to 1000 G |
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AE465PYA AE803-3â | |
Contextual Info: 7070 POWER INDUCTORS High-Reliability Power Inductors ML541PYA • High temperature materials allow operation in ambient temperatures up to 155°C ■ Passes vibration testing to 80 G and shock testing to 1000 G ■ High current and very low DCR ■ Soft saturation makes them ideal for VRM/VRD applications. |
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ML541PYA ML856-4â | |
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how to make an ide to usb adapter
Abstract: 4313-DAPB how to make an ide to usb adapter ec3 Si4010C2 4010-DKPB434-BM si4010 Silabs DKEB bUTTON PCB 4pin Keil uVision 4 user manual
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Si4010-Key Si4010 4010-DKKF Si4010-C2-GS 4010-DKPB434-BM CRD2032 how to make an ide to usb adapter 4313-DAPB how to make an ide to usb adapter ec3 Si4010C2 Silabs DKEB bUTTON PCB 4pin Keil uVision 4 user manual | |
474 3.5v
Abstract: c2012 0805 cc0402 x7r CGA Series 475 16V 104 630v 2r2 101 tdk CGA4 TDK X7R 630V CGA3
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C2012/CC0805 474 3.5v c2012 0805 cc0402 x7r CGA Series 475 16V 104 630v 2r2 101 tdk CGA4 TDK X7R 630V CGA3 | |
loudness control
Abstract: j-900
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TAS5508B SLES162C TAS5508B SLES162C loudness control j-900 | |
AQV21EH
Abstract: AQV210E AQV214
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AQV210E, AQV21EH) AQV21E, AQV214E AQV210E AQV210EH, AQV214EH aqv21e: AQV21EH AQV210E AQV214 | |
MIKROContextual Info: All Mikroelektronika’s development systems feature a large number of peripheral modules expanding microcontroller’s range of application and making the process of program testing easier. In addition to these modules, it is also possible to use numerous additional modules linked to the development system |
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932-MIKROE-605 MIKROE-605 MIKRO | |
MS16106-1
Abstract: 9AC12-3 2AC59 MS16106-2 9AC4 MS16106-5 MS-16106-1 23ac1 ms16106 MS16106-3
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UL1054 MS16106-3) 22AC1 22AC2 23AC1 23AC2 24AC1 24AC2 4AC54* MS16106-2) MS16106-1 9AC12-3 2AC59 MS16106-2 9AC4 MS16106-5 MS-16106-1 ms16106 MS16106-3 | |
AGN20
Abstract: AGN20024 938M AGN2004H
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100mW 500gf} 010811J AGN20 AGN20024 938M AGN2004H | |
pogo pinsContextual Info: CRYSTAL OSCILLATOR TEST & BURN IN SOCKET AXS-7050-06-13 Precision test socket for 7x5mm, Pb RoHS 6 pad crystal oscillator packages. Compliant FEATURES: | | | | | | | | | | | | | | | APPLICATIONS: APPLICATIONS: APPLICATIONS: • Accurate and reliable testing of frequency control devices |
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AXS-7050-06-13 815-AXS-7050-06-13 pogo pins | |
Contextual Info: Coaxial Amplifier 50Ω High Isolation ZFL-2HAD 50 to 1000 MHz Features • wideband, 50 to 1000 MHz • active directivity isolation-gain , 30 dB typ. at 50-500 MHz Applications CASE STYLE: SS98 • VHF/UHF • cellular • receivers • two-tone, 3rd order IM testing |
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Contextual Info: Coaxial Amplifier 50Ω High Isolation ZFL-1HAD 10 to 500 MHz Features • wideband, 10 to 500 MHz • active directivity isolation-gain , 30 dB typ. Applications • VHF/UHF • laboratory use • receivers • two-tone, 3rd order IM testing CASE STYLE: SS98 |
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