TEST METHODOLOGY Search Results

Test Methodology

Abstract: M3500 VCO micronetics M3500 QUALCOMM Reference design nomograph M3500 M3500-0612 is nomograph micronetics vco micronetics M3500-0916s
Contextual Info: TEST METHODOLOGY TEST CONFIGURATION 1 TEST CONFIGURATIONAND PERFORMANCE Test Configurations 1,2,3 & 4 illustrate the actual test methods used for collecting the test data for all M3500 VCO versions. The performance curves of figures 2 A-M pages 9-22 were

credence tester

Abstract: SENTRY-21
Contextual Info: Test-3.6-07/98 Test Gate Array/Embedded Array Verification . 3-2 Methodology . 3-2

Willamette

Abstract: project transistor tester
Contextual Info: Intel Technology Journal Q1’99 Defect-Based Test: A Key Enabler for Successful Migration to Structural Test Sanjay Sengupta, MPG Test Technology, Intel Corp. Sandip Kundu, MPG Test Technology, Intel Corp. Sreejit Chakravarty, MPG Test Technology, Intel Corp.

SN54ACT8997

Abstract: SN74ACT8997
Contextual Info: Chapter 6 Suggested Design-for-Test Flow The designer of any new product must plan for testing at any time in the life cycle of the product. This process is called design for test DFT . The test methodology, defined by IEEE Std 1149.1, is used to ease problems

E6601A

Abstract: sl 100 sem aclr filter
Contextual Info: Agilent E6835A TD-SCDMA Calibration Application For the E6601A Wireless Communications Test Set Data Sheet The next generation of mobile phone manufacturing test. The E6601A is the newest test set from Agilent Technologies, designed especially for high-volume, test-mode manufacturing.

Types of Radar Antenna

Contextual Info: Aeroflex Product Capabilities Synthetic Test Systems Progressive companies in the test and measurement industry are working to meet the challenges of developing an approach that cost effectively meets today’s test demands while preserving the investment of test in the future. Synthetic

0300BB

Abstract: TPR50 TPX250 HP-3577A hi pot all transformer
Contextual Info: TEST METHODS FOR PULSE 10BASE-T MODULES Application Note Scope This application note depicts PULSE’s test methodology for 10Base-T. Test methods are in compliance with the IEEE Std 802.3i-1993, which addresses both the 10Base-T chip as well as the 10Base-T module specifications. Module is defined as a single package component that includes

"3 Bit Shift Register"

Abstract: I426 SD4 diode i437 ATL60 sdi verilog code OM32muxl0
Contextual Info: Test Compiler Scan Insertion and ATPG Development via  Synopsys Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys Test Compiler , version

U2002

Abstract: ATL60
Contextual Info: Test Compiler Scan Insertion and ATPG Development via Synopsys• Test Compiler This application note presents Atmel’s design guidelines, then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys• Test Compiler• , version

E6601A

Abstract: IMT-2000 UMTS800 UMTS2600
Contextual Info: Agilent E6832A W-CDMA Calibration Application For the E6601A Wireless Communications Test Set Data Sheet The next generation of mobile phone manufacturing test. E6601A/E6890A Features and General Specifications E6601A is the newest test set from Agilent Technologies,

MUX21

Contextual Info: Cell-Based IC Compiled Megacell Testing Overview BIST Circuitry This Engineering Application Note describes a test methodology for compiled megacells if Built-in Self-test BIST circuitry is not included. • • Introduction ATMEL includes in its libraries compiled

High Volume Test Methodology for HBT Device Ruggedness Characterization

Abstract: kopin
Contextual Info: High Volume Test Methodology for HBT Device Ruggedness Characterization Cristian Cismaru, Hal Banbrook, and Peter J. Zampardi Skyworks Solutions, Inc., 2427 Hillcrest Drive, Newbury Park, CA 91320 cristian.cismaru@skyworksinc.com, 805.480.4663 Keywords: BVceo, snap-back, HBT, high-volume test, ruggedness

E6601A

Abstract: IMT-2000 mobile phone repair
Contextual Info: Agilent E6833A cdma2000/1xEV-DO Calibration Application For the E6601A Wireless Communications Test Set Data Sheet The next generation of mobile phone manufacturing test. E6601A/E6890A Features and General Specifications The Agilent E6601A is the new, one-box test set that expedites

ASTM-E668

Abstract: radiation-hardened, Diodes Transistors manual table
Contextual Info: N RADIATION OWNER’S MANUAL Table of Contents – Radiation Testing Page Test Philosophy National’s Radiation Effects Laboratories All About National’s South Portland, Maine, REL Certification – Maine Test Methodology – Maine The Step-by-Step Process – Maine

CL8000

Contextual Info: CL8000 TEST METHODOLOGY Introduction Clear Logic’s CL8000 family of Laser-Configured ASICs LASICs provide a turnkey ASIC conversion of Altera’s FLEX 8000 family of Field Programmable Gate Arrays (FPGAs). Clear Logic’s NoFault™ test method provides 100% stuck-at fault

Contextual Info: Agilent E7478A GPRS Drive Test System Product Overview Quickly deploy your GPRS netw orks and manage multiformat environments Our drive test solution doesn’t just uncover problems on your GPRS netw ork – it allow s you to fix them quickly. Agilent’s GPRS and data test

GSM480

Contextual Info: Agilent E6831A GSM/GPRS/EGPRS Calibration Application For the E6601A Wireless Communications Test Set Data Sheet E6601A Features • • • • • • • • • • • • The next generation of mobile phone manufacturing test E6601A is the newest test set from Agilent Technologies,

Contextual Info: Compiled Megacell Testing Overview Cell-Based ASIC This application note describes a test methodology for compiled megacells if Built-in Self-test BIST circuitry is not used. Introduction Application Note Atmel includes in its libraries compiled megacells for ARAM, ROM, dual-port RAM and

parameters of FR4 substrate with dielectric const

Abstract: mt 6612 8710-1582 IPC-2141 HP54754A CITS500S APC7 connector 2041-6204-00 General Instrument 312 diode MaCom SMA Female 2 Hole
Contextual Info: R Printed Circuit Board PCB Test Methodology User Guide Revision 1.6 January 2000 Order Number: 298179 - 001 Printed Circuit Board (PCB) Test Methodology R Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual

esata

Abstract: sata connector DSA70604 MAX4951 MAX4951B
Contextual Info: Measurement methodology eSATA Rev 1.2 1 PHY testing methodology – DUT must be placed into a test mode, typically a BIST built-in self-test mode using outside stimulus or a hardware/software utility. • Special BIST sequences generated by AWGs, on-board software, or compliance load

FLUKE 8840a specification

Contextual Info: AN770 S i826 X 5 K V I SOLATOR TEST R EPORT S UMMARY 1. Introduction This application note summarizes various performance, quality, and reliability test results for the Si826x isolator family. A summary of tests and their results is listed in Table 1. For more details on a particular test, see the

SI8710

Contextual Info: AN742 Si87 XX 5 K V I SOLATOR TEST R EPORT S UMMARY 1. Introduction This application note summarizes various performance, quality, and reliability test results for the Si87xx isolator family. A summary of tests and their results is listed in Table 1. For more details on a particular test, see the

Bi-directional shift register

Abstract: AT6005
Contextual Info: FPGA IEEE 1149.1-1990 Standard Test Access Port and Boundary-Scan Field Programmable Gate Array Introduction For system or board diagnostics, AT6000 Series devices can be programmed with the 1149.1 standard test logic and then reprogrammed for normal operation when the diagnostics are complete. The area and performance overhead of the test logic does not

INAP125

Abstract: apix ashell CRC-24 INAP125T24 INAP125R24 CRC24 spartan camera link apix XC3S1200E Head-Up Displays
Contextual Info: APIX AShell August 11, 2008 Product Specification AllianceCORE Facts Provided with Core Documentation User Guide Design File Formats Encrypted NGC netlist Constraints Files Verification APIX_AShell.ucf Test Bench, Test Vectors Instantiation Templates INOVA Semiconductors GmbH