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    RELIABILITY REPORT 2012 Search Results

    RELIABILITY REPORT 2012 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MD28F020-12/B
    		Rochester Electronics LLC 28F020 - 2048K (256K x 8) CMOS Flash Memory PDF Buy
    MD28F020-12/R
    		Rochester Electronics LLC 28F020 - 2048K (256K x 8) CMOS Flash Memory PDF Buy
    20121C00BD
    		Amphenol Communications Solutions Elite Backplane connectors, BMA 12pair, 8position, NiS PDF
    LP395Z/LFT1
    		Texas Instruments Ultra Reliable Power Transistor 3-TO-92 Visit Texas Instruments Buy
    10127819-20121LF
    		Amphenol Communications Solutions Minitek® Pwr 4.2, Dual Row, Right Angle Through Hole Header, Gold Flash plating, Black Color, 20 Positions, Non GW Compatible Nylon66, Tray Packing. PDF

    RELIABILITY REPORT 2012 Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    LTC5540

    Abstract: LTC5585 LTC5541 LTC5592 DATE code LTC5544 LTC5593 LTC5590 LTC5584 LTC5567
    Contextual Info: Reliability Data Report Product Family R550 LTC5540 / LTC5541 / LTC5542 / LTC5543 / LTC5544 / LTC5567 / LTC5582 / LTC5583 / LTC5584 / LTC5585 / LTC5588 / LTC5590 / LTC5591 / LTC5592 / LTC5593 Reliability Data Report Report Number: R550 Report generated on: Wed Oct 03 18:48:41 PDT 2012


    Original     		LTC5540 LTC5541 LTC5542 LTC5543 LTC5544 LTC5567 LTC5582 LTC5583 LTC5584 LTC5585 LTC5592 DATE code LTC5593 LTC5590 PDF

    1001

    Abstract: DATE code
    Contextual Info: Reliability Data Report Product Family R549 LTC2364 / LTC2367 / LTC2368 / LTC2370 / LTC2376 / LTC2377 / LTC2378 / LTC2379 / LTC2380 / LTC2381 / LTC2382 / LTC2383 / LTC2389 / LTC2391 / LTC2392 / LTC2393 Reliability Data Report Report Number: R549 Report generated on: Wed Oct 03 18:18:05 PDT 2012


    Original     		LTC2364 LTC2367 LTC2368 LTC2370 LTC2376 LTC2377 LTC2378 LTC2379 LTC2380 LTC2381 1001 DATE code PDF

    8501 equivalent

    Abstract: 9443 r003
    Contextual Info: Reliability Data Report Product Family R003 LT1021 LT1031 LT1236 LH0070 Reliability Data Report Report Number: R003 Report generated on: Wed Sep 19 09:54:13 PDT 2012 OPERATING LIFE TEST PACKAGE TYPE HERMETIC PLASTIC DIP SOIC/SOT/MSOP TO-92 FLATPACK Totals


    Original     		LT1021 LT1031 LT1236 LH0070 No346 J-STD-020 8501 equivalent 9443 r003 PDF

    in-coming quality control

    Abstract: "Dallas Semiconductor" TOP MARKING
    Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/97 NOTICE RELIABILITY MONITOR PROGRAM CHANGE Starting with the Third Quarter 96 Report, the Reliability Monitor will


    Original     		MIL-STD-883, in-coming quality control "Dallas Semiconductor" TOP MARKING PDF

    DS1868

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1996 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/20/97 NOTICE RELIABILITY MONITOR PROGRAM CHANGE Starting with the Third Quarter 96 Report, the Reliability Monitor will


    Original     		MIL-STD-883, DS1868 PDF

    0952

    Abstract: R457
    Contextual Info: Reliability Data Report Product Family R457 LTC3113 LTC3411/16/17/18/19 LTC3520/27/28 LTC3539/58/62 LTC3606/12/14/15/16/17/19 LTC3672/77 Reliability Data Report Report Number: R457 Report generated on: Thu Sep 20 13:37:42 PDT 2012 OPERATING LIFE TEST PACKAGE TYPE


    Original     		LTC3113 LTC3411/16/17/18/19 LTC3520/27/28 LTC3539/58/62 LTC3606/12/14/15/16/17/19 LTC3672/77 J-STD-020 0952 R457 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/29/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/30/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		MIL-STD-883, PDF

    TR-TSY-000357

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1996 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/96 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		MIL-STD-883, TR-TSY-000357 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/23/97 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1996 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/96 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 11/20/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/23/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 02/26/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    reliability report 2012

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, reliability report 2012 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 01/18/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 8/14/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		MIL-STD-883, PDF

    quality acceptance plan

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, quality acceptance plan PDF

    JESD22 B100

    Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 2004 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 04/20/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, JESD22 B100 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1997 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/97 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		MIL-STD-883, PDF

    reliability testing report

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, reliability testing report PDF