RCA 40 CMOS IC Search Results

applications 4046b

Abstract: unbuffered cmos logic application note 4001UB UNBUFFERED-CD400IUB RCA CD4069UB CD4001* using NAND gates 4011UB CD4007 ICAN-6558 CD4002UB
Contextual Info: ICAN-6558 Understanding Buffered and Unbuffered CMOS Characteristics by R. E. Funk INTRODUCTION Both buffered and unbuffered CMOS B-series gates, inverters, and high-current IC products are available from RCA; each pro­ duct classification has application advantages

CD45038

Abstract: CD4039 CD45158 cd45128 cd40538 CD40148 cd40518 CD40528 CD40678 ic cd4020, 16 bit ripple counter
Contextual Info: It- General Guide to RCA High-Reliability IC Products Irldex to RCA High-Reliability IC's Hi,gh-Voltage CD4000B-Series CMOS IC's 8(3e pages 27 through 52 for technical data Tlrp No. Description CD4000B CD4000UB CD4001B CD4001UB CD4002B CC4002UB CC4006B

CD22777

Abstract: CD22777E ICAN-6525 cd2277
Contextual Info: VtCil Solid State CD22777 Types Advance Information/ Preliminary Data CMOS Logic ICs TOP VIEW 1 B O SC ILLATO R IN P U T 2 7 “ OSC ILLATO R OUTPUT “ ALA R M O UTPUT MOTOR OUTPUT 1“ _ MOTOR OUTPUT 2 92CS - 4 0 5 5 3 TERMINAL ASSIGNMENT CMOS 32 kHz Quartz Analog

CD40678

Abstract: cd45148 CD40528 cd40114 CD45118 CD45038 RCA cmos databook cd40538 CD401078 CD45158
Contextual Info: It- General Guide to RCA High-Reliability IC Products Irldex to RCA High-Reliability IC's Hi,gh-Voltage CD4000B-Series CMOS IC's 8(3e pages 27 through 52 for technical data Tlrp No. Description CD4000B CD4000UB CD4001B CD4001UB CD4002B CC4002UB CC4006B

JRC 45600

Abstract: YD 803 SGS 45600 JRC TDA 7277 TDA 5072 krp power source sps 6360 2904 JRC Sony SHA T90 SA philips HFE 4541
Contextual Info: I SEMICON INDEXES Contents and Introduction Manufacturers' Information V O LU M E 3 INTERNATIONAL INTEGRATED CIRCUITS INDEX 15th EDITION 1997 Numerical Listing of Integrated Circuits Substitution Guide U D C 621.382.3 Diagram s THE S E M IC O N INTERNATIONAL INDEXES

CD4519BE

Abstract: rca 40 cmos ic CD4519B RCA S ICAN-6525
Contextual Info: ItCil State Solid i *•> :' \ : 000828 , y 1 CD4519B Types ? £cr CMOS Logic ICs CMOS 4-Bit AND/OR Selector, Quad 2-Channel Data Selector, or Quad Exclusive NOR Gate H igh-Voltage Types 20-Volt Rating 9 2 C S -3 9 3 0 3 FUNCTIONAL DIAGRAM Features: ■ Standardized, symmetrical output

ICAN-6525

Abstract: CD4049 CD4049 equivalent SCR PNP NPN emitter area electrostatic discharge
Contextual Info: ICAN-6525 Guide to Better Handling and Operation of CMOS Integrated Circuits by J. Flood and H. L. Pujol QV00 This Note recommends specific handling and operating practices that minimize the probability of damage to CMOS integrated circuits in the manufacturing operation and

Contextual Info: High-Reliabilily High-Speed CMOS Logic ICs CD54HC40103/3A CD54HCT40103/3A 4302S71 GGabObS ^ 37E D HARRIS SEHICOND SECTOR Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, = 6 ns) CHARACTERISTIC

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC40103/3A CD54HCT40103/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS ( C l = 50 pF, Input tr, t, = 6 ns) CHARACTERISTIC SYMBOL Propagation Delay CP to TC (Async Preset)

Contextual Info: 37E D Hlgh-Reliability High-Speed CMOS Logic IC s * Dynam ic . • "P 4 S Z 3 - 7 Burn-In Test-Circuit Connections CD54HC/HCT4020 M3G2S71 0G2bG13 1 ■ HAS HARRIS SEMICOND SECTOR CD54HC4020/3A CD54HCT4020/3A Static ■ - (Use S tatic II fo r /3A burn-in and D ynam ic fo r Life Test.

HCT4046A equivalent

Contextual Info: 37 E D • M3 0 2 2 7 1 H arris s e k c o m G0 2 b Q 2 G =1 B H A S High-Reliabilily High-Speed CMOS Logic ICs . X sector CD54HC4046A/3A .S 0 - 1 7 " F S 2 -M Burn-In Test-Circuit Connections Static CD54HC/HCT4046A OPEN 1,2,4,6,7, 10-13,15 CD54HCT4046A/3A

Contextual Info: _ High-Reliabllity High-Speed CMOS Logic ICs CD54HC4046A/3A CD54HCT4046A/3A Burn-In Test-Circuit Connections Static CD54HC/HCT4046A Dynamic CD54HC/HCT4046A OPEN 1,2.4,6,7, 10-13,15 Use Static II for /3A burn-in and Dynamic for Life Test.

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC4514/3A CD54HCT4514/3A 4-to-16-Line Decoder/Demultiplexer w/Input Latches The RCA CD54HC4514 and CD54HCT4514 are high-speed silicon-gate devices consisting of a 4-bit strobed latch and a 4-to-16-line decoder. The^ selected output is enabled by a

Contextual Info: 37E D High-Reliability High-Speed CMOS Logic ICs M3D2271 Ga2bQ21 0 HARRIS SEfllCOND SECTOR CD54HC4049/3A ""P 5 2 .- t í Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, = 6 ns) CHARACTERISTIC

Contextual Info: High-Reliability High-Speed CMOS Logic ICs . CD54HC4020/3A CD54HCT4020/3A Burn-ln Test-Circuit Connections Static CD 54H C /H C T4020 Dynamic CD 54H C /H C T4020 Use Static II for /3A burn-in and Dynamic for Life Test. STATIC BURN-IN I GROUND Vcc <6V) OPEN

54HC

Abstract: CD54HC4514 CD54HCT4514 demultiplexing
Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC4514/3A CD54HCT 4514/3A 4-to-16-Line Decoder/Demultiplexer w/Input Latches The RCA CD54HC4514 and CD54HCT4514 are high-speed silicon-gate devices consisting of a 4-bit strobed latch and a 4-to-16-line decoder. The^ selected output is enabled by a

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC173/3A CD54HC173/3A Burn-ln Test-Circuit Connections Static STATIC BURN-IN I GROUND Vcc 6V 1,2,7-15 16 OPEN 3-6 CD54HC/HCT173 Dynamic OPEN GROUND 1/2 Vcc (3V) Vcc (6V) — 1,2,8-10,15 3-6 16 CD54HC/HCT173

Contextual Info: High-Reliability High-Speed CMOS Logic ICs . CD54HC4060/3A CD54HCT4060/3A Switching Speed Lim its with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (C L - 50 pF, Input t„ t, - 6 ns) CHARACTERISTIC SYMBOL Vcc V 2 4.5 tpLH tpHL 6 Propagation Delay

92CS-JM50B

Contextual Info: 37E » 14302271 □□2t>ai2 T « H A S High-Reliability High-Speed CMOS Logic ICs H A RR IS S E M I C O N D S E C T O R CD54HC4020/3A CD54HCT4020/3A n^MS'Zvr? ' 14-Stage Binary Ripple Counter The RCA CD54HC4020 and CD54HCT4020 are 14-stage rlpple-carry binary counters. All counter stages are masterslave flip-flops. The state of the stage advances one count

Difference between LS, HC, HCT devices

Abstract: TRANSISTOR A120M Difference between LS, HC, HCT, H 74 HC Series ICs Hct cable
Contextual Info: Application Notes Replacing LSTTL with Q M O S High-Speed Logic IC s by J. Nadolski Until the development of RCA HC and HCT high-speedCMOS logic ICs, high-speed logic devices were available only in the high-power-consuming bipolar technology. The HC/HC T QMOS fam ily features LSTTL speed a lo n g with

Contextual Info: H i g h - R e l ia b i l it y A S I C s PA50000 Series These data sheets are provided fo r technical guidance only. The final device performance may vary depending upon the final device design and configuration. Silicon-Gate CMOS Logic Arrays Features: • Silicon-gate 3-m icron CMOS technology

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC165/3A CD54HCT165/3A Burn-ln Test-Circuit Connections Static OPEN CD54HC/HCT165 7,9 Dynamic Use Static II fo r/3 A burn-in and Dynamic fo r Life Test. STATIC BURN-IN I GROUND Vcc (6V) 1-6,8,10-15 16 OPEN GROUND

54hc binary counters

Abstract: 54HC CD54HC4020 CD54HCT4020
Contextual Info: High-Reliability High-Speed CMOS Logic ICs C D 54H C 4020/3A C D 54H C T4020/3A 14-Stage Binary Ripple Counter The RCA CD54HC4020 and CD54HCT4020 are 14-stage ripple-carry binary counters. All counter stages are master­ slave flip-flops. The state of the stage advances one count

Contextual Info: High-Reliability High-Speed CMOS Logic ICs CD54HC4051/3A CD54HCT4051/3A Switching Speed Lim its w ith black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t„ t, = 6 ns) Maximum Switch Turn “ O ff" Delay from S or E to Switch Output