PROTON UP Search Results

Emcore solar cell

Abstract: GaAs tunnel diode multi-junction "solar cell" NIEL proton tunnel diode tunnel diode GaAs GAAS multi-junction solar cell" NIEL for solar cell inp
Contextual Info: PROTON AND ELECTRON RADIATION ANALYSIS OF GaInP2/GaAs SOLAR CELLS P. R. Sharps, C. H. Thang, P. A. Martin, and H. Q. Hou EMCORE Photovoltaics 10420 Research Road SE Albuquerque, NM 87112 ABSTRACT Electron and proton radiation damage analysis of solar cells is extremely important for predicting the response of

prisma

Abstract: smartcard visa SMARTCARD CEPS proton aspic e purse ISO7816 "electronic purse"
Contextual Info: Proton PRISMA Latest-generation smartcard solutions for banking, government and public transport www.st.com/smartcard Key benefits • Ideal for finance, government and public transport applications ■ Seamless migration to multi-application functionality

Contextual Info: Application Note 1851 Single-Event Performance of the ISL75052SEH Introduction Part Description The intense proton and heavy ion environment encountered in space applications can cause a variety of Single-Event Effects SEE in electronic circuitry, including Single-Event Upset (SEU),

prisma

Abstract: proton EMV CARDS DDA quality control payment CARDS
Contextual Info: EMVPlus Credit/debit application on ST Proton PRISMA technology www.st.com/smartcard • Multi-brands ■ Extended risk management ■ SDA, DDA, CDA mechanisms ■ One-time password ■ Card-manufacturer independent ■ Simplified personalization ■ Future-proof

Contextual Info: Application Note 1938 Single Event Effects SEE Testing of the ISL71091SEHxx Precision Voltage References Family Introduction SEE Test Objectives The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects

4N49

Contextual Info: 66260 PROTON RADIATION TOLERANT OPTOCOUPLER MICROPAC Single Channel, Electrically Similar to 4N49 OTOELECTRONIC PRODUCTS DIVISION 01/05/05 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor

Pentium III Developer

Contextual Info: Managing Multiple Code Paths 10/23/98 updated 3/1/99 Copyright 1998, Intel Corporation. All rights reserved. G-Number This presentation discusses a technology introduced in the Intel® C+ Compiler (Proton/VTune Performance Analyzer tool compiler) release

Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 05/31/2013 Features: Applications: •       High Reliability Base lead provided for conventional transistor biasing Rugged package

vcsel spice model

Abstract: 1310nm led Modulating VCSELs 1310nm photodiode 6 Ghz 10Gbps TOcan
Contextual Info: APPLICATION NOTE Modulating Finisar Oxide VCSELs INTRODUCTION In the last decade, proton isolated VCSELs have become the industry standard for short wavelength 850nm gigabit data communications links on multimode fiber. As the speeds have increased beyond 2Gbps, however, the oxide isolated

Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 06/15/2012 Features: Applications: •          High Reliability Base lead provided for conventional transistor biasing

6 pin Optocoupler

Abstract: 66266-105 66266-300 4N49 850 nm LED
Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 06/21/2010 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing

Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 02/10/2011 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing

Contextual Info: Test Report 004 Single Event Effects SEE Testing of the ISL71840SEH 16:1 30V Mux Introduction SEE Test Objectives The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU),

proton up

Abstract: 4N48
Contextual Info: 66260 6 PIN GULL WING PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION 12/23/2009 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing Rugged package Stability over wide temperature

Contextual Info: 66260 6 PIN GULL WING PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION 05/31/2013 Features: Applications: •          High Reliability Base lead provided for conventional transistor biasing Rugged package Stability over wide temperature

66266-001

Abstract: 66266 66266-105 4N49 66266-00 proton up 850 nm LED
Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 01/21/2010 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing

Contextual Info: Application Note 1961 Single Event Effects SEE Testing of the ISL70244SEH, Dual 40V Radiation Hardened Precision Operational Amplifier Introduction SEE Test Facility The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects

66266-300

Abstract: 66266 66266-105 proton up optocoupler
Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 12/17/2012 Features: Applications: •          High Reliability Base lead provided for conventional transistor biasing

Contextual Info: Test Report 007 Single Event Effects SEE Testing of the ISL71841SEH 32:1 30V Multiplexer Introduction SEE Test Facility The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU),

Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 10/04/2012 Features: Applications: •          High Reliability Base lead provided for conventional transistor biasing

Contextual Info: 3.75-6.5 Watt Hybrid Features SINGLE OUTPUT DEVICES • Rad Hard: TID > 100kRad Si • 2:1 margin: Operates beyond 200kRad TID • No SEE: LET > 82MeV*cm2/mg • Proton Resistant: No optocouplers used • Specifically designed for redundant or individual space applications

Contextual Info: 19.5-40 Watt Hybrid Features SINGLE OUTPUT DEVICES 7193-S03.3 26.4W • Rad Hard: TID > 100kRad(Si) • 2:1 margin: Operates beyond 200kRad TID • No SEE: LET > 82MeV*cm2/mg • Proton Resistant: No optocouplers used • Specifically engineered for 50 VDC

75184

Contextual Info: 19.5-40 Watt Hybrid Features SINGLE OUTPUT DEVICES 9193-S03.3 26.4W • Rad Hard: TID > 100kRad(Si) • 2:1 margin: Operates beyond 200kRad TID • No SEE: LET > 82MeV*cm2/mg • Proton Resistant: No optocouplers used • Specifically designed for 100 VDC

Contextual Info: Application Note 1894 Author: Nick van Vonno Single Event Effects SEE Testing of the ISL71590SEH Temperature Sensor Introduction The intense proton and heavy ion environment encountered in space applications can cause a variety of destructive and nondestructive single-event effects in electronic circuitry,