PROTON UP Search Results

Emcore solar cell

Abstract: GaAs tunnel diode multi-junction "solar cell" NIEL proton tunnel diode tunnel diode GaAs GAAS multi-junction solar cell" NIEL for solar cell inp
Contextual Info: PROTON AND ELECTRON RADIATION ANALYSIS OF GaInP2/GaAs SOLAR CELLS P. R. Sharps, C. H. Thang, P. A. Martin, and H. Q. Hou EMCORE Photovoltaics 10420 Research Road SE Albuquerque, NM 87112 ABSTRACT Electron and proton radiation damage analysis of solar cells is extremely important for predicting the response of

prisma

Abstract: smartcard visa SMARTCARD CEPS proton aspic e purse ISO7816 "electronic purse"
Contextual Info: Proton PRISMA Latest-generation smartcard solutions for banking, government and public transport www.st.com/smartcard Key benefits • Ideal for finance, government and public transport applications ■ Seamless migration to multi-application functionality

Contextual Info: Application Note 1851 Single-Event Performance of the ISL75052SEH Introduction Part Description The intense proton and heavy ion environment encountered in space applications can cause a variety of Single-Event Effects SEE in electronic circuitry, including Single-Event Upset (SEU),

prisma

Abstract: proton EMV CARDS DDA quality control payment CARDS
Contextual Info: EMVPlus Credit/debit application on ST Proton PRISMA technology www.st.com/smartcard • Multi-brands ■ Extended risk management ■ SDA, DDA, CDA mechanisms ■ One-time password ■ Card-manufacturer independent ■ Simplified personalization ■ Future-proof

Contextual Info: Application Note 1938 Single Event Effects SEE Testing of the ISL71091SEHxx Precision Voltage References Family Introduction SEE Test Objectives The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects

vcsel spice model

Abstract: 1310nm led Modulating VCSELs 1310nm photodiode 6 Ghz 10Gbps TOcan
Contextual Info: APPLICATION NOTE Modulating Finisar Oxide VCSELs INTRODUCTION In the last decade, proton isolated VCSELs have become the industry standard for short wavelength 850nm gigabit data communications links on multimode fiber. As the speeds have increased beyond 2Gbps, however, the oxide isolated

Contextual Info: Test Report 004 Single Event Effects SEE Testing of the ISL71840SEH 16:1 30V Mux Introduction SEE Test Objectives The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU),

proton up

Abstract: 4N48
Contextual Info: 66260 6 PIN GULL WING PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION 12/23/2009 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing Rugged package Stability over wide temperature

Contextual Info: 66260 6 PIN GULL WING PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION 05/31/2013 Features: Applications: •          High Reliability Base lead provided for conventional transistor biasing Rugged package Stability over wide temperature

66266-001

Abstract: 66266 66266-105 4N49 66266-00 proton up 850 nm LED
Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 01/21/2010 Features: Applications: • • • • • • • • • • High Reliability Base lead provided for conventional transistor biasing

Contextual Info: Application Note 1961 Single Event Effects SEE Testing of the ISL70244SEH, Dual 40V Radiation Hardened Precision Operational Amplifier Introduction SEE Test Facility The intense proton and heavy ion environment encountered in space applications can cause a variety of single event effects

Contextual Info: Test Report 007 Single Event Effects SEE Testing of the ISL71841SEH 32:1 30V Multiplexer Introduction SEE Test Facility The intense proton and heavy ion environment encountered in space applications can cause a variety of Single Event Effects (SEE) in electronic circuitry, including Single Event Upset (SEU),

Contextual Info: 6 PIN GULL WING 66266 PROTON RADIATION TOLERANT OPTOCOUPLER OPTOELECTRONIC PRODUCTS DIVISION WITH 850 nm LED 10/04/2012 Features: Applications: •          High Reliability Base lead provided for conventional transistor biasing

Contextual Info: Application Note 1894 Author: Nick van Vonno Single Event Effects SEE Testing of the ISL71590SEH Temperature Sensor Introduction The intense proton and heavy ion environment encountered in space applications can cause a variety of destructive and nondestructive single-event effects in electronic circuitry,

Contextual Info: CYRS1542AV18 CYRS1544AV18 72-Mbit QDR II+ SRAM Two-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Two-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

Contextual Info: CYRS1543AV18 CYRS1545AV18 72-Mbit QDR II+ SRAM Four-Word Burst Architecture with RadStop Technology 72-Mbit QDR® II+ SRAM Four-Word Burst Architecture with RadStop™ Technology Radiation Performance Radiation Data • Total Dose =300 Krad ■ Soft error rate both Heavy Ion and proton

DMILL

Abstract: RAD HARD TRENCH TRANSISTOR BPSG HEP transistors hep silicon diode 1E14 temic jfet jfet n channel ultra low noise nuclear Neutron Radiation Detector
Contextual Info: 10MRAD Si DMILL Mixed Analog/Digital Radiation Hard BiCMOS An emerging need in HEP MPW The decision to develop new equipment for High Energy Physics (HEP) research has led the need for ultra rad hard technology. The radiation tolerance for detector electronics adjacent to proton collision

supercapacitor chip

Abstract: supercapacitor supercapacitor separator balancing circuit for supercapacitor 1F polymer capacitor supercapacitor applications
Contextual Info: Proton Polymer - The Key to Low ESR Double Layer Supercapacitors for High Voltage Applications By Chris Reynolds, AVX Applications Engineer Abstract The turn of the century saw the introduction of a new double layer supercapacitor technology. Since its introduction, there has been much success in pulse supercapacitor applications due to

gemplus

Abstract: AT83C21GC SSOP24 emv 7816 smart card atmel tape and reel
Contextual Info: Features • Smart Card Interface • • • • – Compliance with Standards • ISO/IEC 7816-1, 2, 3 and 4 • EMV 2000 • CB • Mondex , Proton, ZKA, Other: Contact Gemplus® – Supported Smart Cards • Number of Smart Cards Supported: 1 • Asynchronous Cards: T=0 and T=1

AT83C5121

Abstract: AT83C21GC ISO/IEC 7816-1 QFN32 SSOP24 gemplus AT83C21GCxxx-PURUL gemplus and card qfn32 tray
Contextual Info: Features • Smart Card Interface • • • • – Compliance with Standards • ISO/IEC 7816-1, 2, 3 and 4 • EMV 2000 • CB • Mondex , Proton, ZKA, Other: Contact Gemplus® – Supported Smart Cards • Number of Smart Cards Supported: 1 • Asynchronous Cards: T=0 and T=1

CREME96

Abstract: cots fpga radiation 115641 fpga radiation COTS radiation cots cmos RAM SEU proton XQVR300
Contextual Info: Radiation Testing Update, SEU Mitigation, and Availability Analysis of the Virtex FPGA for Space Reconfigurable Computing † Earl Fuller2, Michael Caffrey1, Anthony Salazar1, Carl Carmichael3, Joe Fabula 3 1 Los Alamos National Laboratory 2 Novus Technologies, Inc.

fpga radiation

Abstract: SRAM Cross References Upset XQR4036XL RAM SEU UPS control circuitry RAM EDAC SEU Upsets Single Event Upset FPGA
Contextual Info: Single Event Effects Testing of Xilinx FPGAs Dr. Gary Lum Lockheed Martin, Sunnyvale, CA and Glen Vandenboom Xilinx, Inc. San Jose, CA Introduction Advanced Field Programmable Gate Arrays FPGAs operating at 3.3V were tested for single event effects (SEE) by

TIBC

Abstract: advantis crypto smartcard visa TIBC 3.0 data access CEPS PKCS11 EMV CARDS DDA TIBC 3.0 implementation data access prisma carte moneo
Contextual Info: System-on-Chip solutions for finance Latest-generation smartcard solutions for banking STMicroelectronics is a world leader in the development and delivery of chip products and solutions for the banking sector. This is the result of over 20 years in the industry, delivering

LiNbO3 phase modulator

Contextual Info: NIR-LN series LiNb03 intensity and phase modulators for 1064 nm and near infrared NIR-LN series LiNb03 intensity and phase modulators for 1064 nm and near infrared Product family 1550 nm & 1300 nm windows 1550 nm & 1300 nm windows NIR window description data rates