7408, 7404, 7486, 7432
Abstract: RF400U functional diagram of 7400 and cd 4011 ls 7404 180 nm CMOS standard cell library TEXAS INSTRUMENTS 74191 4BITS s273 buffer 74374 7408 CMOS cmos 7404
Contextual Info: TGC100 Series CMOS Gate Arrays RELEASE 3.0, REVISED JANUARY 1990 • Twelve Arrays with up to 26K Available Gates • Fast Prototype Turnaround Time • Extensive Design Support - Design Libraries Compatible with Daisy, Valid, and Mentor CAE Systems - Tl Regional ASIC Design Centers
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OCR Scan
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TGC100
20-mA
Sink/12mA
TDB10LJ
120LJ
TDC11LJ
TDN11LJ
100MHz
7408, 7404, 7486, 7432
RF400U
functional diagram of 7400 and cd 4011
ls 7404
180 nm CMOS standard cell library TEXAS INSTRUMENTS
74191 4BITS
s273
buffer 74374
7408 CMOS
cmos 7404
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PDF
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434 289
Abstract: 54175 S085 54151 gen 24lJ IPI04LJ NA220 DTB20
Contextual Info: TGC100M MILITARY SERIES 1-/im CMOS GATE ARRAYS Release 2.0, A PR IL 1989 * AC PERFORMANCE TEST STRUCTURE Fully Characterized for M ilitary Applications — Product Fully Compliant w ith the Requirements of M IL -S T D -883 Paragraph 1.2.1 Is Available — Production Processing Is in Accordance
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OCR Scan
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TGC100M
0010LJ
LH110LJ
434 289
54175
S085
54151 gen
24lJ
IPI04LJ
NA220
DTB20
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PDF
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TSC500
Abstract: 324 EZ 948 BU221 bf063 ST EZ 728 358 ez 802 bfs 417 130 nm CMOS standard cell library ST BF080 bf068
Contextual Info: TSC500 SERIES 1-pm CMOS STANDARD CELLS RELEASE 1.2, APRIL 1989 • High-Performance, 1-pin EPIC CMOS Efficiently Achieves System-Level Designs BOND PAD COMPILER RAM MSI FUNCTION • TSC500 Library Includes Macros for - Static RAMs, Register Files - First-In First-Out Memories
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OCR Scan
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TSC500
64-mA
TP000LJ
TP006LJ
TP008LJ
TP009LJ
TP010LJ
324 EZ 948
BU221
bf063
ST EZ 728
358 ez 802
bfs 417
130 nm CMOS standard cell library ST
BF080
bf068
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PDF
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0221l
Abstract: APPLICATION NOTES CD 7474 IC bit-slice TGC119 TGC100 IPF 830 RC02X ci 7432 ttl DTN20 tsg 271
Contextual Info: TGC100 Series 1-|im CMOS Gate Arrays RELEASE 4.0. REVISED SEPTEMBER 1991 14 Arrays with up to 26K Available Gates C E LL C O LU M N Fast Prototype Turnaround Time W IR IN G C H A N N E L Extensive Design Support -Design Libraries Compatible With Valid,u and Mentor CAE Systems
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OCR Scan
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TGC100
16-mA
Slnk/12-mA
0221l
APPLICATION NOTES CD 7474 IC
bit-slice
TGC119
IPF 830
RC02X
ci 7432 ttl
DTN20
tsg 271
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PDF
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TGC100
Abstract: TGC103
Contextual Info: 0 ^1723 7 ~ 4 Z -!/-O Y TGC100 SERIES 1-/tm CMOS GATE ARRAYS It u s ^32 DD7ÔD31 D 3 0 1 5 , OCTOBER 1 9 8 7 -R E V IS E D OCTOBER 1 98 8 Six Arrays with Up to 16,758 Useable Gates AC PERFORMANCE TEST STRUCTURE CELL COLUMN W |R|NQ CHANNEL Fast Prototype Turn-Around Time
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OCR Scan
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TGC100
20-mA
TGC103
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PDF
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