ONE GATE TTL Search Results

14572U

Contextual Info: H D 14572U B Hex Gate 4 - ln v e r e r 2 - i n p u t NOR Gate 2 - i n p u t N A N D Gate The HD14572UB hex functional gate finds primary use where low power dissipation and/or high noise immunity is desired. The chip contains four inverters, one NOR gate and one NAND gate.

TC4000BP

Contextual Info: C2MOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC4000BP TC4000BP DUAL 3-INPUT NOR GATE PLUS INVERTER The TC4000BP is a combined gate which contains dual 3-input positive NOR gate plus inverter in one package. Since all the outputs of this gate are provided with

TC4000BP

Contextual Info: C2MOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC4000BP TC4000BP DUAL 3-INPUT NOR GATE PLUS INVERTER The TC4000BP is a combined gate which contains dual 3-input positive NOR gate plus inverter in one package. Since all the outputs of this gate are provided with

TC4501BP

Contextual Info: Q2M0S DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC450ÎBP TC4501BP T R IP L E GATE Dual 4 - In p u t NAND Gate and 2 - I n p u t NOR/OR Gate o r 8 -In p u t AND/NAND G a te The TC4501BP is a combined gate which contains dual 4-input NAND gate and 2-input NOR/OR gate in one

b04g

Contextual Info: SN74AHCT1G04 www.ti.com SCLS319O – MARCH 1996 – REVISED OCTOBER 2013 SINGLE INVERTER GATE Check for Samples: SN74AHCT1G04 FEATURES DESCRIPTION • • • • • • The SN74AHCT1G04 contains one gate. The device performs the Boolean function Y = A. 1

b04g

Contextual Info: SN74AHCT1G04 www.ti.com SCLS319O – MARCH 1996 – REVISED OCTOBER 2013 SINGLE INVERTER GATE Check for Samples: SN74AHCT1G04 FEATURES DESCRIPTION • • • • • • The SN74AHCT1G04 contains one gate. The device performs the Boolean function Y = A. 1

Contextual Info: TOSHIBA TC4S30F TOSHIBA CMOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC4S30F EXCLUSIVE-OR GATE TC4S30F contains one circuit of exclusive OR gate. Since the buffers of two stage inverters are provided for all the outputs, the input/output voltage characteristic

Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing

Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing

microgate

Abstract: SN74AHC1G00 SN74AHC1G04 SN74AHC1G08 SN74AHC1G14 SN74AHC1G32 SN74AHC1G86 SN74AHC1GU04 SN74AHCT1G00 SN74AHCT1G04
Contextual Info: Single-gate Logic Devices Save Space in Mobile Systems and Enhance ASIC Functionality DALLAS June 24, 1996 - A new family of one-gate logic devices from Texas Instruments (TI) helps developers of mobile systems such as portable computers, camcorders, remote control

74LVC1G3157GV

Abstract: 74LVC1G3157GW 74LVC1G3157 74LVC1G3157GF 74LVC1G3157GM JESD22-A114E
Contextual Info: 74LVC1G3157 2-channel analog multiplexer/demultiplexer Rev. 02 — 18 September 2007 Product data sheet 1. General description The 74LVC1G3157 is a low-power, low-voltage, high-speed Si-gate CMOS device. The 74LVC1G3157 provides one analog multiplexer/demultiplexer with one digital select

Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing

Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible D Controlled Baseline D D D D − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing

TC4000BP

Contextual Info: TC4000BP C 2M O S DIGITAL IN T E G RA T E D CIRCUIT S IL IC O N M ON OLITH IC TC4000BP DUAL 3-INPUT NOR GATE PLUS INVERTER The TC4000BP is a combined gate which contains dual 3-input positive NOR gate plus inverter in one package. Since all the outputs of this gate are provided with

Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

CD74ACT86

Abstract: CD74ACT86MDREP CD74ACT86-EP
Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

CD74ACT86-EP

Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

CD74ACT86-EP

Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

CD74ACT86-EP

Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

CD74ACT86-EP

Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

CD74ACT86-EP

Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

CD74ACT86-EP

Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

CD74ACT86-EP

Contextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C