ONE GATE TTL Search Results
ONE GATE TTL Result Highlights (5)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
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| 27S185DM/B |
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27S185 - OTP ROM, 2KX4, 55ns, TTL, CDIP18 |
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| 54F00/BCA |
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54F00 - NAND Gate, F/FAST Series, 4-Func, 2-Input, TTL, CDIP14 - Dual marked (M38510/33001BCA) |
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| 54F10/BCA |
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54F10 - NAND Gate, F/FAST Series, 3-Func, 3-Input, TTL, CDIP14 - Dual marked (M38510/33003BCA) |
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| 54F32/B2A |
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54F32 - OR Gate, F/FAST Series, 4-Func, 2-Input, TTL - Dual marked (M38510/33501B2A) |
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| 54F32/BCA |
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54F32 - OR Gate, F/FAST Series, 4-Func, 2-Input, TTL - Dual marked (M38510/33501BCA) |
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ONE GATE TTL Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
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MC74VHC1GT125DFT1
Abstract: MC74VHC1G50DFT1 CMOS TTL Logic Family Specifications level shifter . CMOS to TTL MC74VHC1GT50DFT1 MC74VHC1GT08DFT1 MC74VHC1GT86DFT1 DATA SHEET transistor sc 308 ttl buffer MC74VHC1GT00DFT1
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Mar-2000 MC74VHC1GXXXDFT1 OT-23/SC59 SC-88A/SOT-353) r14525 MC74VHC1GT125DFT1 MC74VHC1G50DFT1 CMOS TTL Logic Family Specifications level shifter . CMOS to TTL MC74VHC1GT50DFT1 MC74VHC1GT08DFT1 MC74VHC1GT86DFT1 DATA SHEET transistor sc 308 ttl buffer MC74VHC1GT00DFT1 | |
14572UContextual Info: H D 14572U B Hex Gate 4 - ln v e r e r 2 - i n p u t NOR Gate 2 - i n p u t N A N D Gate The HD14572UB hex functional gate finds primary use where low power dissipation and/or high noise immunity is desired. The chip contains four inverters, one NOR gate and one NAND gate. |
OCR Scan |
14572U HD14572UB | |
TC4000BPContextual Info: C2MOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC4000BP TC4000BP DUAL 3-INPUT NOR GATE PLUS INVERTER The TC4000BP is a combined gate which contains dual 3-input positive NOR gate plus inverter in one package. Since all the outputs of this gate are provided with |
OCR Scan |
TC4000BP TC4000BP | |
TC4000BPContextual Info: C2MOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC4000BP TC4000BP DUAL 3-INPUT NOR GATE PLUS INVERTER The TC4000BP is a combined gate which contains dual 3-input positive NOR gate plus inverter in one package. Since all the outputs of this gate are provided with |
OCR Scan |
TC4000BP TC4000BP | |
ON Semiconductor marking
Abstract: fairchild marking codes sot-23 W2D SOT23 diode w2d SOT-353 MARKING L5 marking code vk, sot-363 va sot-353 1C SOT353 MC74VHC1G135 vsop8 package outline
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DLD601/D Mar-2001 r14525 DLD601 ON Semiconductor marking fairchild marking codes sot-23 W2D SOT23 diode w2d SOT-353 MARKING L5 marking code vk, sot-363 va sot-353 1C SOT353 MC74VHC1G135 vsop8 package outline | |
TC4501BPContextual Info: Q2M0S DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC450ÎBP TC4501BP T R IP L E GATE Dual 4 - In p u t NAND Gate and 2 - I n p u t NOR/OR Gate o r 8 -In p u t AND/NAND G a te The TC4501BP is a combined gate which contains dual 4-input NAND gate and 2-input NOR/OR gate in one |
OCR Scan |
TC450 TC4501BP TC4501BP -K-50* | |
b04gContextual Info: SN74AHCT1G04 www.ti.com SCLS319O – MARCH 1996 – REVISED OCTOBER 2013 SINGLE INVERTER GATE Check for Samples: SN74AHCT1G04 FEATURES DESCRIPTION • • • • • • The SN74AHCT1G04 contains one gate. The device performs the Boolean function Y = A. 1 |
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SN74AHCT1G04 SCLS319O SN74AHCT1G04 b04g | |
b04gContextual Info: SN74AHCT1G04 www.ti.com SCLS319O – MARCH 1996 – REVISED OCTOBER 2013 SINGLE INVERTER GATE Check for Samples: SN74AHCT1G04 FEATURES DESCRIPTION • • • • • • The SN74AHCT1G04 contains one gate. The device performs the Boolean function Y = A. 1 |
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SN74AHCT1G04 SCLS319O SN74AHCT1G04 b04g | |
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Contextual Info: TOSHIBA TC4S30F TOSHIBA CMOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC4S30F EXCLUSIVE-OR GATE TC4S30F contains one circuit of exclusive OR gate. Since the buffers of two stage inverters are provided for all the outputs, the input/output voltage characteristic |
OCR Scan |
TC4S30F TC4S30F | |
TC4S30FContextual Info: TOSHIBA TC4S30F TOSHIBA CMOS DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC TC4S30F EXCLUSIVE-OR GATE TC4S30F contains one circuit of exclusive OR gate. Since the buffers of two stage inverters are provided for all the outputs, the input/output voltage characteristic |
OCR Scan |
TC4S30F TC4S30F | |
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Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing |
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SN74ACT08EP SCAS779 | |
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Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing |
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SN74ACT08EP SCAS779 | |
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Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing |
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SN74ACT08EP SCAS779 | |
microgate
Abstract: SN74AHC1G00 SN74AHC1G04 SN74AHC1G08 SN74AHC1G14 SN74AHC1G32 SN74AHC1G86 SN74AHC1GU04 SN74AHCT1G00 SN74AHCT1G04
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SN74AHC1G00 SN74AHC1G04 SN74AHC1GU04 SN74AHC1G08 SN74AHC1G14 SN74AHC1G32 SN74AHC1G86 SN74AHCT1G00 SN74AHCT1G04 SN74AHCT1G08 microgate SN74AHC1G00 SN74AHC1G04 SN74AHC1G08 SN74AHC1G14 SN74AHC1G32 SN74AHC1G86 SN74AHC1GU04 SN74AHCT1G00 SN74AHCT1G04 | |
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Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing |
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SN74ACT08Ä SCAS779 | |
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Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Controlled Baseline D D D D D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing |
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SN74ACT08Ä SCAS779 | |
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Contextual Info: SN74ACT08ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆAND GATE SCAS779 − SEPTEMBER 2004 D Inputs Accept Voltages to 5.5 V D Max tpd of 10 ns at 5 V D Inputs Are TTL-Voltage Compatible D Controlled Baseline D D D D − One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing |
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SN74ACT08Ä SCAS779 | |
TC4000BPContextual Info: TC4000BP C 2M O S DIGITAL IN T E G RA T E D CIRCUIT S IL IC O N M ON OLITH IC TC4000BP DUAL 3-INPUT NOR GATE PLUS INVERTER The TC4000BP is a combined gate which contains dual 3-input positive NOR gate plus inverter in one package. Since all the outputs of this gate are provided with |
OCR Scan |
TC4000BP TC4000BP | |
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Contextual Info: SN74LVC86A-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCAS752A – DECEMBER 2003 – REVISED AUGUST 2005 FEATURES • • • • • • • • 1 Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –40°C |
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SN74LVC86A-EP SCAS752A | |
TC4086BP
Abstract: 5VDD-05
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OCR Scan |
TC4086BP TC40S6BP TC4086BP 5VDD-05 | |
CD74ACT86-EPContextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C |
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CD74ACT86-EP SCHS357 24-mA MIL-STD-883, CD74ACT86-EP | |
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Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C |
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SN74AHCT125Ä SCLS549 MIL-STD-883, | |
CD74ACT86-EPContextual Info: CD74ACT86-EP QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE www.ti.com SCHS357 – MARCH 2006 FEATURES • • • • • • • • • 1 • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C |
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CD74ACT86-EP SCHS357 24-mA | |
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Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C |
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SN74AHCT125Ä SCLS549 MIL-STD-883, | |