2001 - NR4500BP-CC
Abstract: NR7500BP-CC NR7800BP-CC NR8500BP-CC NR8501BP-CC STM-16 NR8501BP
Text: . Not all devices/types available in every country. Please check with local NEC representative for , 20 °C 1010 0 20 40 80 60 100 Reverse Voltage VR (V) 107 MULTIPLICATION , 102 20 °C +25 °C 101 +65 °C 1010 0 20 40 60 80 100 100 0 40 60 , Current, Multiplied Dark Current ID, IDM (A) NR8500BP-CC IDM 108 109 1010 1011 60 40 , 2.5 Gb/s: STM-16 Coaxial APD NR8500BP-CC REFERENCE Document Name Document No. NEC
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NR8500BP-CC
NR4500BP-CC
NR7500BP-CC
NR7800BP-CC
NR8501BP-CC
STM-16
NR8501BP
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PDF PIN APD DIODE DESCRIPTION
Abstract: NDL5531P NDL5531P1 NDL5531P1C NDL5531P1D NDL5531P2 NDL5531P2C NDL5531PC NDL5531PD nec 2501 m
Text: 107 TC = 85 °C 108 TC = 65 °C 109 TC = 25 °C TC = 20 °C 1010 106 0 20 40 , 109 1010 TC = 65 °C 102 TC = 20 °C TC = 25 °C 101 TC = 85 °C 100 0 20 40 , CURRENT 106 = 1 300 nm ID @ VR = 0.9 V(BR)R 107 IDM 108 109 1010 1011 60 40 , HANDLING PRECAUTION for PD/APD MODULE The NEC PD/APD module has heat shrink tubing to protect the ferrule , the fiber and/or optical coupling degradation, NEC recommends the following handling precautions. 1
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NDL5531P
SM-9/125)
PDF PIN APD DIODE DESCRIPTION
NDL5531P1
NDL5531P1C
NDL5531P1D
NDL5531P2
NDL5531P2C
NDL5531PC
NDL5531PD
nec 2501 m
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NEC 2501
Abstract: NDL5551P1 NEC ndl5551pc nec 2501 LD NDL5551P NDL5551P1C NDL5551P1D NDL5551P2 NDL5551PC NDL5551PD
Text: 108 TC = 65 °C 109 TC = 25 °C TC = 20 °C 1010 0 20 106 40 60 80 Reverse , M Dark Current, Photo Current ID, lph (A) 10 107 108 ID 109 1010 0 20 , .) Dark Current, Multiplied Dark Current ID, IDM (A) NDL5551P Series 1010 1 10 , /APD MODULE The NEC PD/APD module has heat shrink tubing to protect the ferrule edge (*1) and the , coupling degradation, NEC recommends the following handling precautions. 1. Do not make the fiber bend
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NDL5551P
GI-50/125)
NDL5551P1
NDL5551P2
NEC 2501
NEC ndl5551pc
nec 2501 LD
NDL5551P1C
NDL5551P1D
NDL5551PC
NDL5551PD
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multiple wavelength laser att
Abstract: NDL7705P NDL7705P1 NDL7705P1C NDL7705P1D NDL7705P2 NDL7705P2C NDL7705PC NDL7705PD
Text: 109 1010 1010 1010 1011 back to back 1011 back to back 1011 back to , REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system C11159E Quality grades on NEC semiconductor devices C11531E Semiconductor device mounting , circumstances break the hermetic seal. NEC Corporation DANGER INVISIBLE LASER RADIATION AVOID DIRECT , AVOID EXPOSURE-Invisible Laser Radiation is emitted from this aperture NEC Building, 7-1, Shiba 5
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NDL7705P
multiple wavelength laser att
NDL7705P1
NDL7705P1C
NDL7705P1D
NDL7705P2
NDL7705P2C
NDL7705PC
NDL7705PD
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NDL5551P
Abstract: NDL5551P1 NDL5551P1C NDL5551P1D NDL5551P2 NDL5551PC NDL5551PD nec 2501 LD
Text: 5 TC = 85 °C 108 TC = 65 °C 109 TC = 25 °C TC = 20 °C 1010 0 20 106 , Multiplication Factor M Dark Current, Photo Current ID, lph (A) 10 107 108 ID 109 1010 , .) Dark Current, Multiplied Dark Current ID, IDM (A) NDL5551P Series 1010 1 10 , /APD MODULE The NEC PD/APD module has heat shrink tubing to protect the ferrule edge (*1) and the , coupling degradation, NEC recommends the following handling precautions. 1. Do not make the fiber bend
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NDL5551P
GI-50/125)
NDL5551P1
NDL5551P2
NDL5551P1C
NDL5551P1D
NDL5551PC
NDL5551PD
nec 2501 LD
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2000 - Not Available
Abstract: No abstract text available
Text: NEC representative for availability and additional information. Document No. P15233EJ2V0DS00 (2nd , Vp-p, Ib = Ith × 0.9 106 107 108 109 1010 TC = 25 °C, Ref = 14 dB, 622 Mbps-NRZ, 2 Vp-p, Ib = Ith × 0.9 106 107 108 109 1010 TC = 85 °C, Ref = 14 dB, 622 Mbps-NRZ, 2 Vp-p, Ib = Ith × 0.9 108 109 1010 1011 back to back 1011 back to back 1011 back to back , Devices Pamphlet Opto-Electronics Devices (CD-ROM) NEC semiconductor device reliability/quality control
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NX8504BE-CC
NX8504CE-CC
NX8504CE-CC
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1998 - P1026
Abstract: M50100
Text: 105 Dark Current, Photo Current ID, lph (A) Iph 109 TC = 25 °C TC = 20 °C 1010 106 0 , TC = 85 °C 1010 100 0 20 40 60 80 Reverse Voltage VR (V) 100 0 20 40 60 80 Reverse Voltage VR , 107 108 109 1010 1011 60 40 Dark Current, Multiplied Dark Current ID, IDM (A) TERMINAL , NDL5530 REFERENCE Document Name NEC semiconductor device reliability/quality control system Quality grades on NEC semiconductor devices Semiconductor device mounting technology manual Guide to quality
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NDL5530
NDL5530
P1026
M50100
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2001 - NR8500FR-CB
Abstract: NR8500CP-BC NR8500FP-BC NR8500FP-CC NR8500FR-BB
Text: /types available in every country. Please check with local NEC Compound Semiconductor Devices , revised points. © NEC Corporation 2001 © NEC Compound Semiconductor Devices 2002 NR8500 Series , 109 1 +25°C 20°C 1010 0 20 40 80 60 100 Reverse Voltage VR (V) 107 , +85°C 102 20°C +25°C 101 +65°C 1010 0 20 40 60 80 100 100 0 20 , 1010 1011 60 40 20 0 20 40 60 80 100 1.0 0 2.0 3.0 4.0 Case
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NR8500
GI-50
NR8500FR-CB
NR8500CP-BC
NR8500FP-BC
NR8500FP-CC
NR8500FR-BB
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2001 - NX8300CE-CC
Abstract: NX8303BG-CC NX8303CG-CC NX8304BE-CC NX8504BE-CC NX8504CE-CC NX8300BE-CC
Text: country. Please check with local NEC Compound Semiconductor Devices representative for availability and , Published July 2002 CP(K) Printed in Japan The mark · shows major revised points. © NEC Corporation 2001 © NEC Compound Semiconductor Devices 2002 NX8504BE-CC,NX8504CE-CC PACKAGE DIMENSIONS (UNIT , 0.9 107 108 108 108 109 109 109 1010 1010 1010 1011 , Opto-Electronics Devices (CD-ROM) P12944X NEC semiconductor device reliability/quality control system
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NX8504BE-CC
NX8504CE-CC
NX8504CE-CC
NX8300CE-CC
NX8303BG-CC
NX8303CG-CC
NX8304BE-CC
NX8300BE-CC
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2002 - TOSA MQW Laser diode SFP
Abstract: NX7314UA NX7315UA NX8311UD STM-16 NX7312UA NX7313UA
Text: in every country. Please check with local NEC Compound Semiconductor Devices representative for , CP(K) Printed in Japan The mark · shows major revised points. © NEC Compound Semiconductor , 40 km 108 109 1010 1011 1012 38 36 34 Relative Intensity (20 mV/div.) 10 , 105 106 back to back 107 after 40 km 108 109 1010 1011 1012 36 34 32 , 108 109 1010 1011 1012 37 35 33 31 Relative Intensity (20 mV/div.) 10
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NX8311UD
NX8311UD
STM-16
OC-48
TOSA MQW Laser diode SFP
NX7314UA
NX7315UA
STM-16
NX7312UA
NX7313UA
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2002 - GR-468-CORE
Abstract: NX7312UA NX7313UA NX7314UA NX7315UA STM-16
Text: every country. Please check with local NEC representative for availability and additional information , shows major revised points. NEC Compound Semiconductor Devices 2002, 2003 NX7315UA PACKAGE , 106 107 108 109 back to back 1010 11 after 5 km 10 1012 38 36 34 32 30 28 , , 2.48832 Gb/s, PRBS 2231 Bit Error Rate 104 105 106 107 108 109 back to back 1010 , 105 106 107 108 109 back to back 1010 after 5 km 1011 1012 38 36 34 32 30
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NX7315UA
NX7315UA
STM-16
OC-48
GR-468-CORE
NX7312UA
NX7313UA
NX7314UA
STM-16
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2000 - STM-16
Abstract: NX8300BE-CC NX8300CE-CC NX8303BG-CC NX8503BG-CC NX8504BE-CC NX8504CE-CC
Text: available in every country. Please check with local NEC representative for availability and additional , 109 109 109 1010 1010 1010 1011 back to back 1011 back to back , ,NX8504CE-CC REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system C11159E Quality grades on NEC semiconductor devices C11531E Semiconductor device , hermetic seal. NEC Corporation DANGER INVISIBLE LASER RADIATION AVOID DIRECT EXPOSURE TO BEAM
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NX8504BE-CC
NX8504CE-CC
NX8504CE-CC
-10ce
STM-16
NX8300BE-CC
NX8300CE-CC
NX8303BG-CC
NX8503BG-CC
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2001 - NR8500BP-BC
Abstract: NR8500BP-CC NR8500BR-BB NR8500BR-CB NR8500CP-BC
Text: /types available in every country. Please check with local NEC representative for availability and , °C 109 +25 °C 1 20 °C 1010 0 20 40 80 60 100 Reverse Voltage VR (V , ID 109 TC = +85 °C 102 20 °C +25 °C 101 +65 °C 1010 0 20 40 60 80 , IDM 108 109 1010 1011 60 40 20 0 20 40 60 80 100 1.0 0 2.0 , Devices (CD-ROM) P12944X NEC semiconductor device reliability/quality control system C11159E
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NR8500
GI-50
NR8500BP-BC
NR8500BP-CC
NR8500BR-BB
NR8500BR-CB
NR8500CP-BC
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TLD 521
Abstract: IC UPC 354 TLD 721 upc 577 NX8567SA NX8567SAM NX8567SAS 2N 1564 19275
Text: NEC 'S EA MODULATOR AND WAVELENGTH MONITOR INTEGRATED InGaAsP MQW DFB LASER DIODE MODULE FOR 2.5 , DESCRIPTION · INTEGRATED ELECTROABSORPTION MODULATOR NEC 's NX8567SA Series is an Electro-Absorption (EA , . 2.48832 Gb/s, PRBS 223 -1, VEA = Vcenter ±1/2 Vmod, IFLD = Iop, TLD = Tset, NEC Test System Vcenter : a , Please refer to ORDERING INFORMATION. 4. BER = 10-10 , NX8567SAS: 240 km (4320 ps/nm) BER = 10-10 , NX8567SAM: 360 km (6480 ps/nm) BER = 10-10 , NX8567SA: 600 km (10800 ps/nm) California Eastern
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NX8567SA
NX8567SA
UL1581VW-1
TLD 521
IC UPC 354
TLD 721
upc 577
NX8567SAM
NX8567SAS
2N 1564
19275
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2001 - Not Available
Abstract: No abstract text available
Text: latest version. Not all devices/types available in every country. Please check with local NEC , Error Rate 107 108 109 1010 1011 2.48832 Gb/s, = 1 550 nm, NRZ, PRBS = 223 1, BER = 1010 , ) NEC semiconductor device reliability/quality control system Quality grades on NEC semiconductor , prohibited without a license from that country. Please call an NEC sales representative. · The information , actual design-in, refer to the latest publications of NEC 's data sheets or data books, etc., for the most
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NR4500BP-CC
NR4500CP-CC
NR4500CP-CC
STM-16,
NR4500BP-CC
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2002 - C11531E
Abstract: NR8300FP-CC
Text: . Please check with local NEC Compound Semiconductor Devices representative for availability and , in Japan © NEC Compound Semiconductor Devices 2002 NR8300FP-CC PACKAGE DIMENSIONS (UNIT: mm , Iph 105 107 TC = +85°C 108 +65°C 109 +25°C 20°C 1010 0 106 20 40 80 , ) NR8300FP-CC IDM 108 109 3 0 3 6 1010 9 11 10 60 40 20 0 20 40 , Opto-Electronics Devices Pamphlet P13623E Opto-Electronics Devices (CD-ROM) P12944X NEC semiconductor
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NR8300FP-CC
NR8300FP-CC
SM-9/125)
C11531E
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2001 - C1115
Abstract: NR4500BP-CC NR7500BP-CC NR7800BP-CC NR8500BP-CC NR8501BP-CC STM-16
Text: /types available in every country. Please check with local NEC representative for availability and , 20 108 109 1010 1011 10 10 Reverse Voltage VR (V) DARK CURRENT and PHOTO , Current, Photo Current ID, lph (A) 5 1010 1011 1 310 nm ( ), 1 550 nm ( ) f = 35 MHz, B = 1 , -16 Coaxial APD NR8501BP-CC REFERENCE Document Name Document No. NEC semiconductor device reliability/quality control system C11159E Quality grades on NEC semiconductor devices C11531E
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NR8501BP-CC
NR8501BP-CC
STM-16
C1115
NR4500BP-CC
NR7500BP-CC
NR7800BP-CC
NR8500BP-CC
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InGaAs APD Pre-Amplifier
Abstract: NR4500BP-CC NR4500CP-CC PRBS223-1 STM-16 apd 1550, sensitivity 30 dBm
Text: NEC 's 50µm µ InGaAs APD WITH INTERNAL PREAMPLIFIER IN COAXIAL PACKAGE FOR 2.5 Gb/s APPLICATIONS NR4500BP-CC NR4500CP-CC FEATURES DESCRIPTION · HIGH DATA RATE CAPABILITY: 2.5 Gbps NEC , Maximum Optical Input Power,2.488320 Gbps, BER = 10-10 , PRBS = 223-1, Mark = 1/2, NRZ, M(VR) is set at , 10-10 , VR: Optimum 85°C 10-8 10 -9 200 10-10 100 70°C 25°C 0°C 10-11 0 0 , ) Signal Out Case Ground Life Support Applications These NEC products are not intended for use in life
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NR4500BP-CC
NR4500CP-CC
NR4500BP-CC
NR4500CP-CC
STM-16,
InGaAs APD Pre-Amplifier
PRBS223-1
STM-16
apd 1550, sensitivity 30 dBm
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2010 - PX10160E
Abstract: No abstract text available
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC , latest version. Not all products and/or types are available in every country. Please check with an NEC , +85°C 108 108 +25°C ID 9 9 10 10 1010 1010 0 20 40 60 80 , NEC Electronics data sheets, etc., for the most up-to-date specifications of NEC Electronics products. Not all products and/or types are available in every country. Please check with an NEC Electronics
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2002 - NX7312UA
Abstract: NX7313UA NX7314UA NX7315UA NX8311UD STM-16
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC , in every country. Please check with local NEC Compound Semiconductor Devices representative for , CP(K) Printed in Japan The mark · shows major revised points. © NEC Compound Semiconductor , 40 km 108 109 1010 1011 1012 38 36 34 Relative Intensity (20 mV/div.) 10 , 105 106 back to back 107 after 40 km 108 109 1010 1011 1012 36 34 32
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2001 - 2SC5603
Abstract: marking TW
Text: evaluation samples, consult your NEC sales representative. Unit sample quantity is 50 pcs. ABSOLUTE , devices/types available in every country. Please check with local NEC representative for availability and , 51.1 0.324 0.377 0.488 -109.8 -148.8 179.8 1.010 0.871 0.805 9.68 7.53 5.19 10 , 1.035 1.034 1.020 1.014 1.010 1.001 0.999 0.986 0.984 12.19 11.91 11.55 11.46 11.26 , 0.871 0.934 0.974 1.010 1.029 31.85 28.60 26.54 24.78 23.37 22.13 21.03 19.43 18.10
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2SC5603
S21e2
2SC5603-T1
2SC5603
marking TW
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2000 - NR3470MU
Abstract: NX8560LJ NX8560MC NX8560MCS NX8560SJ NX8564LE NX8565LE STM-64 10 gb laser diode NX8560MC Series
Text: country. Please check with local NEC Compound Semiconductor Devices representative for availability and , ) Printed in Japan The mark shows major revised points. NEC Compound Semiconductor Devices 2000 , , PRBS 223-1, VEA = Vcenter ± 1/2Vmod, IFLD = Iop, NEC Test System Vcenter : a certain point between , to ORDERING INFORMATION. *4 BER = 10-10 Data Sheet PL10110EJ04V0DS 5 NX8560LJ Series , 1010 25 0 1011 1012 22 5 10 15 20 20 18 16 14 12
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NX8560LJ
NR3470MU
NX8560MC
NX8560MCS
NX8560SJ
NX8564LE
NX8565LE
STM-64
10 gb laser diode
NX8560MC Series
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2001 - superlattice avalanche
Abstract: NR3470MU-CC NR4270MU-CC NR4500BP-CC NR4500CP-CC NR7500 STM-16 STM-64 10 gb PIN receiver 10 gb APD receiver
Text: /types available in every country. Please check with local NEC Compound Semiconductor Devices , Published November 2002 CP(K) Printed in Japan The mark ! shows major revised points. NEC Compound , Cuurent, Photo Current ID, Iph (A) 6 109 1010 100 50 0 50 VSS = 5.2 V, = 1 550 nm , , NRZ, PRBS = 231 1, VSS = 5.2 V, M = 10 108 109 1010 Relative Intensity (40 mV/div , PX10160E NEC semiconductor device reliability/quality control system Quality grades on NEC
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NR4270MU-CC
NR4270MU-CC
17-pin
OC-192
STM-64,
OC-192)
superlattice avalanche
NR3470MU-CC
NR4500BP-CC
NR4500CP-CC
NR7500
STM-16
STM-64
10 gb PIN receiver
10 gb APD receiver
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2001 - NX8300BE-CC
Abstract: NX8300CE-CC NX8303BG-CC NX8303CG-CC NX8304BE-CC NX8504BE-CC NX8504CE-CC 10 gb laser diode
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC , country. Please check with local NEC Compound Semiconductor Devices representative for availability and , Published July 2002 CP(K) Printed in Japan The mark · shows major revised points. © NEC Corporation 2001 © NEC Compound Semiconductor Devices 2002 NX8504BE-CC,NX8504CE-CC PACKAGE DIMENSIONS (UNIT , 0.9 107 108 108 108 109 109 109 1010 1010 1010 1011
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2009 - PX10160E
Abstract: NR6800SZ
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC , version. Not all products and/or types are available in every country. Please check with an NEC , 106 107 TC = +85°C 108 108 +25°C ID 9 9 10 10 1010 1010 0 , to the latest publications of NEC Electronics data sheets, etc., for the most up-to-date specifications of NEC Electronics products. Not all products and/or types are available in every country. Please
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