|
Contextual Info: Apr 11, 2000 mp00049.dwg If this document is printed it becomes uncontrolled. Check for the latest revision.
|
Original
|
mp00049
|
PDF
|
MP 1009 es
Abstract: BS-00001
Contextual Info: ^EDI B c e tro n lc D e s ig n i Inc. Reliability Program Quality Assurance Policy The Quality Standard at Electronic Designs Incorpo rated EDI is defect free work. No other standard is acceptable. This policy is reflected in the attention given to the
|
OCR Scan
|
MIL-STD-883.
MIL-STD-883
MP 1009 es
BS-00001
|
PDF
|
BS0001
Abstract: BS-0001 INCOMING RAW MATERIAL INSPECTION method centrifuge
Contextual Info: m o \ Reliability Program ELECTRONIC DESIGNS IN C . Quality Control Tests and Procedures Electronic Designs, Inc.'s continuing effort to be a leader in providing top quality products has lead us to com plete our m ission to become IS 09001 certified. The certification is the most comprehensive quality
|
OCR Scan
|
Hours/80
C/150
EP-00008
TP-00002
QP-00062
TP-00006
EP-00004,
EP-00005
QP-00062
BS0001
BS-0001
INCOMING RAW MATERIAL INSPECTION method
centrifuge
|
PDF
|
MP0402
Abstract: MP0002 MP0010 MP0022 MP0033 C4 MMIC MP0004
Contextual Info: M-Pulse Microwave Inc. 576 Charcot Ave. San Jose, Ca, 95131 Tel: 408 432-1480 Fax:(408) 432-1480 www.mpulsemw.com MIS CHIP CAPACITORS Tolerance = +/- 10 % on singles; Binary = +/- 20%. Metallization options: "A" = AuSn Attach and wire bondable pad "B" = AuGe attach (backside) and AuSn topside for FET or MMIC Mounting (self bias)
|
Original
|
MP0001
MP0002
MP0003
MP0004
MP0005
MP0010
MP0015
MP0022
MP0033
MP0047
MP0402
MP0002
MP0010
MP0022
MP0033
C4 MMIC
MP0004
|
PDF
|
m-pulse tunnel diode
Abstract: Mp2407 MP4033 MP2923 M-PULSE
Contextual Info: Microwave Table of Contents DIODES Mircowave Schottky Diodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Zero bias Schottky Diodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
|
Original
|
|
PDF
|
