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    JP002 CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINE Search Results

    JP002 CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINE Result Highlights (5)

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    UDS2983R/B
    Rochester Electronics LLC UDS2983 - High Voltage, High Current Source Driver PDF Buy
    UDS2981R/B
    Rochester Electronics LLC UDS2981 - High Voltage, High Current Source Driver PDF Buy
    CLC432A/BPA
    Rochester Electronics LLC CLC432 - AMPLIFIER, CURRENT FEEDBACK - Dual marked (5962-9472502MPA) PDF Buy
    LM1578AH/883
    Rochester Electronics LLC LM1578 - Switching Regulator, Current-mode, 0.75A, 100kHz Switching Freq-Max, MBCY8 - Dual marked (5962-8958602GA) PDF Buy
    CLC400A/BPA
    Rochester Electronics LLC CLC400 - OP AMP, WIDEBAND, FAST SETTLING, CURRENT FEEDBACK - Dual marked (5962-8997001PA) PDF Buy

    JP002 CURRENT TIN WHISKERS THEORY AND MITIGATION PRACTICES GUIDELINE Datasheets Context Search

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    Whisker growth

    Abstract: JESD22a121 JP002 Current tin whiskers theory and mitigation practices guideline JP002 QFN leadframe IC-HAUS BGA cte
    Contextual Info: ASiC / ASSP CUSTOMER INFORMATION #10 Seite 1/1 Whisker growth in RoHS-compliant packages The growth of whiskers on tin-plated surfaces is a phenomenon engineers are familiar with and one which can pose a risk to electronics units if, for example, neighboring pins short circuit. It is believed that these crystalline


    Original
    JESD22A121 D-55294 Whisker growth JP002 Current tin whiskers theory and mitigation practices guideline JP002 QFN leadframe IC-HAUS BGA cte PDF