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    JESD22 B100 Search Results

    JESD22 B100 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MP-64RJ45UNNB-100
    		Amphenol Cables on Demand Amphenol MP-64RJ45UNNB-100 Cat6 UTP Patch Cable (550-MHz) with Snagless RJ45 Connectors - Blue 100ft PDF
    G88MPB10002C1EU
    		Amphenol Communications Solutions Micro Power Plus 3.0 Connector System - G88MP Series, Wire to Board connector, Right Angle, Single row, 3.0mm pitch, 10 positions, 100u\\ Tin, 2.10mm tail length, LCP, Black, TRAY PDF
    F51H-1A7H1-11004-B100
    		Amphenol Communications Solutions Flex Connector, 1.00mm Pitch, Height 4.20mm, Vertical, NON-ZIF, 4 position, A type, Without Fixed plate, With MYLAR PDF
    F51H-1A7H1-11006-B100
    		Amphenol Communications Solutions Flex Connector, 1.00mm Pitch, Height 4.20mm, Vertical, NON-ZIF, 6 position, A type, Without Fixed plate, With MYLAR PDF
    F52L1A7A111009B100
    		Amphenol Communications Solutions Flex Connector, 1.00mm Pitch, Height 5.04mm, Vertical, NON-ZIF, 9 position, with Mylar PDF

    JESD22 B100 Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    JESD22

    Contextual Info: RELIABILITY REPORT Date: 7/27/11 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ8842PMBL AM QUAL VEHICLES PACKAGE TYPE : ASSEMBLY FAB PROCESS KSZ8842PMBL AM 100 LFBGA OSE TSMC 0.15 um KSZ8842PMQL AM 128L PQFP ASE TSMC 0.15 um AEC Q100 GROUP A QUALIFICATION RESULTS:


    Original     		KSZ8842PMBL KSZ8842PMQL JESD22 121C/100% -50C/ KSZ8842PMBL GFS0028 JESD22 PDF

    Contextual Info: QUALIFICATION REPORT Date: 3/28/12 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ8864RMN/RMNI/RMNU Qual vehicles PACKAGE TYPE : ASSEMBLY FAB LOC PROCESS 64L MLF QFN TICP DONGBU, TAIWAN 0.13um KSZ8864RMNU QUALIFICATION RESULTS: Test # Reference Test Conditions


    Original     		KSZ8864RMN/RMNI/RMNU KSZ8864RMNU JESD22 AEC-Q100008 AEC-Q100002 AEC-Q100001 Mil-STD883 PDF

    Contextual Info: QUALIFICATION REPORT Update Date: 9/23/11 QUALITY ENG : PART NUMBER MICREL QA/REL KSZ885116MLL/MLLI/MLLU Qual vehicles PACKAGE TYPE : ASSEMBLY FAB LOC PROCESS 48L LQFP TICP, Taiwan DONGBU 0.18um KSZ8851-16MLLU MOLD COMPOUND CEL9200HF QUALIFICATION RESULTS:


    Original     		KSZ885116MLL/MLLI/MLLU KSZ8851-16MLLU CEL9200HF JESD22 AEC-Q100008 AEC-Q100002 Mil-STD883 M111W471MEA PDF

    delco

    Abstract: Mil-Std-202F 215j JIS-C-6429 28F0818 28F0448-6T0 Q-1000-211 28c0236 0bw 10 28R3149-000 28F0303-0T0 laird 6429
    Contextual Info: AUTOMOTIVE RELIABILITY TESTING www.lairdtech.com SIP-BRO-15-0208  Part Number Date Test Performed Test Source 25D0889-010 06/16/1999 1,3,5,6,7,14 Trace Laboratories 25S0670-000 06/16/1999 1,3,5,6,7,14 Trace Laboratories 28B0375-400 06/16/1999 1,3,5,6,7,14


    Original     		SIP-BRO-15-0208 25D0889-010 25S0670-000 28B0375-400 28B1020-100 28C0236-0BW 28F0121-0S0 delco Mil-Std-202F 215j JIS-C-6429 28F0818 28F0448-6T0 Q-1000-211 28c0236 0bw 10 28R3149-000 28F0303-0T0 laird 6429 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 02/26/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    JESD22 B100

    Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 2004 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 04/20/04 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, JESD22 B100 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 04/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    reliability report 2012

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 7/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, reliability report 2012 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 01/18/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    quality acceptance plan

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, quality acceptance plan PDF

    reliability testing report

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, reliability testing report PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 2/20/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    quality acceptance plan

    Abstract: in-coming quality control TR-TSY-000357
    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/29/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, quality acceptance plan in-coming quality control TR-TSY-000357 PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 8/17/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/23/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 06/18/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF

    Contextual Info: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those


    Original     		JESD22 MIL-STD-883, PDF