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Contextual Info: Application Note 1944 Single Event Effects Testing of the ISL70419SEH Introduction Key SEE Test Results The intense heavy ion environment encountered in space applications can cause a variety of transient and destructive effects in analog circuits, including single-event latch-up SEL , |
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ISL70419SEH ISL70419SEH. ISL70417SEHENG1 ISL70419SEH AN1944 |