IC TEST CLIP Search Results

D431000

Abstract: INTEL 87C196 USER MANUAL D75304GF AIC6360Q d431000agw aic-6360 INTEL PLCC 68 dimensions AIC-6360Q d431000ag NEC uPD71054
Contextual Info: IC Test Clips Test Clip Selection Made Easy To select the Pomona IC Test Clip specifically designed for your chip, find the table for your chip type and follow the selection procedure outlined in this section. SSOP/QSOP JEDEC QFP Pomona IC Test Clips are uniquely designed to provide

900714

Contextual Info: A P Products GmbH Standard DIP TEST-CLIP The IC Test-Clip for fast, safe access to DIP Leads Invented in 1967 by A P Products, our Test-Clip has remained the industry standard for faster easier DIP IC Testing, quality control inspection, and field service. A P Test-Clips have become an

XCS3201FN

Abstract: ATT92020 80386SL MC68HC11A1FU
Contextual Info: Pomona Innovative Solutions For IC Test Anc Development Expressly designed to facilitate testing of your surface-mounted devices, Pomona IC Test Clips and Pomona Solder-On Adapters are engineered in form and function to provide a convenient interface to logic analyzers for fast and reliable

D5923

Contextual Info: ITT Pomona Model 5923 Flying Leads for PLCC and SOIC Clip IC Test Clips Flying leads make connections to the upper contacts on PLCC test clips and SOIC Clip® test clips. The lead wires are flexible to reduce the forces applied to the test clips. These flying leads are perfect for

Contextual Info: Pomona Model 3785 Minigrabber® Test Clip To Stacking Pin Tip Plug Patch Cord FEATURES: • Allows fast and convenient connection between pin tip jacks and test terminals, axial leaded devices, IC Test Clips and other test points. • Grabber hook attaches to terminal sizes up to .060” 1,5mm O.D.

Contextual Info: Pomona Model 3785 Minigrabber® Test Clip To Stacking Pin Tip Plug Patch Cord FEATURES: • Allows fast and convenient connection between pin tip jacks and test terminals, axial leaded devices, IC Test Clips and other test points. • Grabber hook attaches to terminal sizes up to .060” 1,5mm O.D.

assmann AKSPLT

Contextual Info: ASSMANN J u m p e rs E le c tro n ic C o m p o n e n ts Plugs for shorting and addressing insulated, double sided contact, grid-spacing 5.08 mm and 2.54 mm With nut for test-pirts or test-clips With nut for test-pins or test-clips With nut for testpins or test-clips

LA-68

Contextual Info: 1C Test Clips 1C Test Clips Pomona’ Metric QFP Test Clips Fig. 1: Press-on d ip Fig. 2 : PGA interface* Fig. 4: Clip with internal locking feature No. Leads Body S iz e Lead P itc h M ax. H e ig h t C r it ic a l D im .t T y p ic a l A p p lic a t io n s

intel 87C196

Contextual Info: Illlllllllllll IC Test Clips rv1 D nm nnn FA* ON DEMAND This symbol indicates immediate JS C C V V C Dial U.S. (800) 444-6785, (Outside U.S.) (949) 253-3858. Enter the Pomona Access number (shown in italics) when prompted. IC Test Clips Pomona8 rOlflOIld Fax-On-Demand Technical Information is available.

MIL-C-17

Abstract: BU225 bu 302
Contextual Info: Mueller Insulated Test Accessories and Micro Clippers ÒMicro Plunger ClipsÓ, Mini-Plunger Clip and Plunger Clip Type BU-1010 test leads make difficult IC connections fast and easy. Spring-loaded beryllium copper conductor attaches to component leads and terminals. Type BU-1031 test clip to insulated mini-alligator clip. Type BU-1080 test clip to

Contextual Info: Model 3785 Minigrabber Test Clip To Stacking Pin Tip Plug Patch Cord ® Pomona • • • • • • • Allows fast and convenient connection between pin tip jacks and test terminals, axial leaded devices, IC Test Clips and other test points. Grabber hook attaches to terminal sizes up to .060” 1,5mm O.D.

d431000agw

Abstract: D75304GF AIC6360Q Actel a1280 intel 80386dx HG62G027 AIC-6360Q CL-SH260 L1A9349 5252 F 1002
Contextual Info: P o m o n a Electronics IC Test Clips Logic Scope Probe JEDEC PQFP Test Clips PomonaÕs JEDEC QFP test clips are designed to fit on surfacemounted plastic and ceramic JEDEC chips. Choose from four clip types specifically designed to give you optimum functionality and ease of use for testing, troubleshooting and

Contextual Info: Model 6174 Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 6263 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 6232A Modular Probe Set Qty 2 - 1 Red, 1 Black 6262 Extended Find Point Test Adapter Qty 2 - 1Red, 1 Black 5907A Test Lead Set Qty 2 - 1 Red, 1 Black

Contextual Info: Model 6174 Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 6263 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 6232A Modular Probe Set Qty 2 - 1 Red, 1 Black 6262 Extended Find Point Test Adapter Qty 2 - 1Red, 1 Black 6153 Spade Lugs Qty 2 5907A Test Lead Set

Type A USB

Abstract: transistor 2515
Contextual Info: 458-2012:QuarkCatalogTempNew 9/1/12 12:57 PM Page 458 ENCLOSURES A/V, TEST CONNECTORS & IC SOCKETS TEST & MEASUREMENT 2 USB, Strip, DIP, Grid, Transistor Sockets and Headers Standard Solder Tail DIP Sockets Open Frame A B .015-.025 .010*.018 Most popular line of standard low profile IC-Sockets. Open frame design leaves

Contextual Info: Pomona Model 6200 Test Companion Kit For HP 34401A Benchtop Multimeters MATERIALS: Model 5246: IC Test Tip Adapter: Insulation: Nylon, Tip: Stainless steel, Color: Black, Red, Green RATINGS: +80ºC. +176ºF. Max. Model 5548A: POP Jack Style Miniature Test Probe: Body: Brass, nickel Plated, Insulation: Nylon, Receptacle:

Contextual Info: Pomona Model 6200 Test Companion Kit For HP 34401A Benchtop Multimeters MATERIALS: Model 5246: IC Test Tip Adapter: Insulation: Nylon, Tip: Stainless steel, Color: Black, Red, Green RATINGS: +80ºC. +176ºF. Max. Model 5548A: POP Jack Style Miniature Test Probe: Body: Brass, nickel Plated, Insulation: Nylon, Receptacle:

d6090

Contextual Info: Pomona Model 6090 & 6091 Ultra-Thin Micrograbber® Test Clip Patch Cords FEATURES: • Pincer style of grabber attaches to surface mount .050" 1,27 mm lead pitch devices. • Test clip’s narrow 3,2 mm (.13") flat body allows side by side stacking when testing high density IC

d6090

Abstract: 6091l D609
Contextual Info: Pomona Model 6090 & 6091 Ultra-Thin Micrograbber® Test Clip Patch Cords FEATURES: • Pincer style of grabber attaches to surface mount .050" 1,27 mm lead pitch devices. • Test clip’s narrow 3,2 mm (.13") flat body allows side by side stacking when testing high density IC

d6090

Abstract: C 6090 transistor c 6090
Contextual Info: Pomona Model 6090 & 6091 Ultra-Thin Micrograbber® Test Clip Patch Cords FEATURES: • Pincer style of grabber attaches to surface mount .050" 1,27 mm lead pitch devices. • Test clip’s narrow 3,2 mm (.13") flat body allows side by side stacking when testing high density IC

Contextual Info: Model 6345 Deluxe Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 5133 Interchangeable Probe Tips Qty 2 of each 5688 4174 4988 5246 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 5689A Modular Probe Set Qty 2 - 1 Red, 1 Black 5682 Extended Find Point Test Adapter

Multimeter

Abstract: banana jack
Contextual Info: Model 6345 Deluxe Electronic Test Companion Kit 5678 SMD Tweerer Qty 1 5133 Interchangeable Probe Tips Qty 2 of each 5688 4174 4988 5246 IC Test Probe Adapter Qty 2 -1 Red, 1 Black 5689A Modular Probe Set Qty 2 - 1 Red, 1 Black 5682 Extended Find Point Test Adapter

LOCTITE 384

Abstract: ECCOBOND 281 melcor 705TC Emerson Cuming tellurex abletherm E629 E710 mastersil
Contextual Info: ATE-A2 Cooling High Density, High Power Pin Electronics TEST AND MEASUREMENT PRODUCTS Overview With IC’s ever-increasing speeds and pin counts, the power density inside Automated Test Equipment is also increasing. Keeping the high-speed pin drivers and other

Contextual Info: The Value Leader Micro & Nano Surface Mount Test Clips Color Coded, Compact, Economical •Can access 0.3mm & 1.27mm Pitch Leads: Allows you to attached the clip to a lead on the smallest of surface mount IC’s for testing the input and/or output of the IC. Normal