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Contextual Info: ^ H S T ^ iTAT10Nr r With U kraHnJJ TestStation Duo Concurrent In-Circuit Test Systems Provides Fastest ICT Test Throughput, Lowers High Volume Production Costs Key Features: • Twice the through put of traditional in circuit testers ■ Lower capital equip |
OCR Scan |
iTAT10Nr 2011-All STG-TSDU0-2011-02 |