HELIUM LEAK RATES AND TESTING Search Results

Helium Leak Rates and Testing

Contextual Info: Introduction to Hermetic Connectors A Helium Leak Rates and Testing Hermeticity Hermeticity is defined as “the state or condition of being airtight”. Sophisticated military electronics enclosures can experience electrical failure from ingress of moisture. System engineers can design the enclosure to withstand exposure

IEC749

Abstract: Hybrid Memory Products Krypton-85 202F leak
Contextual Info: Hybrid Memory Products Ltd Hermeticity Testing TECHNICAL NOTE Summary A large portion of the failure mechanisms which are most active in electronic packages are either initiated or accelerated by the presence of moisture. In hermetic packages ceramic or metal this moisture can be locked inside the case during

Contextual Info: Gla ss-to -m e ta l s e a l hermetic connectors military qpl and commercial connectors for harsh environment air-tight-seal applications APRIL 2013 mission critical high pressure hermetics Resolve gas, moisture, and particle ingress problems with advanced performance glasssealed hermetic connectors—the world’s

IPC-T-50

Abstract: JEDEC JESD22-B116 free NCSL Z540.3 MIL-STD-883H EIA/JESD22-B116 ultrasonic atomizer Infant Radiant Warmer JESD22-B116 JEDEC JESD22-B116 free download Hybrid Microcircuits GENERAL INSTRUMENT
Contextual Info: The documentation and process conversion measures necessary to comply with this revision shall be completed by 30 September 2010. INCH - POUND MIL-STD-883H 26 February 2010 SUPERSEDING MIL-STD-883G 28 February 2006 DEPARTMENT OF DEFENSE TEST METHOD STANDARD

210895

Abstract: 22-0150
Contextual Info: warn H EW LETT f t "KM PA CK A RD Coaxial Pigtailed Laser Module Interim Qualification Report 2000 hours Reliability Data Summary This report summarizes the status of the LST292X Qualification testing to date (Up to and including 2000 hours). At the time of writing, the

210895

Abstract: hfbr series LST282X LST292X LST3821 LST3921 197412 HFBR 5000 CMAC 20063
Contextual Info: Coaxial Pigtailed Laser Module Interim Qualification Report 2000 hours Reliability Data Summary This report summarizes the status of the LST292X Qualification testing to date (Up to and including 2000 hours). At the time of writing, the qualification has passed.

in-process quality inspections

Abstract: mitsubishi metal oxide varistor 011AT phase controlled thyristers MITSUBISHI GATE TURN-OFF THYRISTOR gto thyristor handbook design GTO switching test mitsubishi conclusion of zener diode voltage report 4000BX-90DA zener diode reliability fit
Contextual Info: MITSUBISHI HIGH POWER SEMICONDUCTORS SEMICONDUCTOR DEVICE RELIABILITY 2. Basic Concepts of Semiconductor Device Reliability The failure rate of devices used in an average piece of equipment can be expressed by using the bathtub curve shown in Fig. 1, line a . Taken

capture and electronic packaging

Abstract: teledyne Microelectronics microwave transceiver specification Optical-Pressure-Sensor Optic-Pressure-Sensor military relay pro mechanica Arrayed Waveguide Grating DAR090709 TOSA
Contextual Info: AG100714 Opto Optoelectronics Products, Packaging & Engineering Services Approved for Export COMPANY PROPRIETARY DAR 07/22/10 12964 Panama Street • Los Angeles, CA 90066 • Phone: 310.822.8229 FAX: 310.822.3573 • microelectronics@teledyne.com • www.teledynemicro.com

Pi filter array design

Abstract: Pi capacitor tubular Tubular Pi type capacitor LC PI FILTER DESIGN mil-dtl-38999 assembly procedures Beacon ferrite space qualified Pi tubular capacitor MIL-DTL-38999 series II
Contextual Info: Introduction MIL-DTL-38999 Type Filter Connectors Overview Hermetic seals are qualified via various methodologies including helium testing and dye penetrant. The purpose of both types of tests is to detect and measure leakage under pressure. The dye penetrant method has the advantage

chn 610

Contextual Info: PRECISION BULK METAL FOIL “ TE CHN OL OG Y “ GLOSSARY a c o m p a n y V I S H A of Y VISHAY RESISTORS ACCURACY: The degree to which the measured value of resistance approximates the specified value of resistance. This is normally expressed in percent deviation but in precision resistor work, the percent is often so small that the results are

Contextual Info: APPLICATION NOTES 4 W HAT ARE JAN COM PONENTS? W HAT ARE JAN S COM PONENTS? JAN components are standard 1N" type devices, MIL quali­ fied and subjected to environmental and life sample tests to assure quality conformance. The JAN devices are 100% tested, lot traceable, and are subjected to other tests as

K1135A

Abstract: K1135B K1135 K1135C 8210 microprocessor ultrasonic receiver MOTOROLA ultrasonic generator 1 Mhz 5A/K1135
Contextual Info: K1135Series re p re s e n te d k o ttm e ie r by ASS0 ^ ^ p E ' s u it e ?470 W N C H B « R b Lv d .,008 CAMPBELL, 408 866-5153 Dual Baud Rate Generator 16 Synchronous/Asynchronous Baud Rates from 50 to 19,200 1.035" X .530" AREA .200” SEATED HEIGHT + 5V, + 12V dc INPUTS

TRU200D

Abstract: M1014 TRU200
Contextual Info: Data Sheet March 1992 H P AT&T TRU200 Clock Recovery and Data Retiming Modules Features • Output jitter typically 1 °rms ■ Low-cost modular solution ■ Choice of data rates from 44 Mbits/s to 315 Mbits/s ■ SONET compatible ■ 100K ECL compatible inputs and outputs

electrolytic ELITE

Contextual Info: QUALITY ASSURANCE and RELIABILITY PROGRAM 1. Introduction Samsung utilizes rigorous qualification and reliability programs to monitor the integrity of its devices. All industry stan­ dard {and various non-standard} stresses are run. Testing is done not only to collect data, but also to detect trends

K1135

Abstract: EK1135 K1135A K1135B
Contextual Info: K1135Series represented k o t t m e ie r - a sso ^ r ; r 408 BY T E S' 866-5153 s u it e Dual Baud Rate Generator 16 Synchronous/Asynchronous Baud Rates from 50 to 19,200 1 .0 3 5 " X . 530" A R E A .200" S E A T E D H E IG H T + 5V, + 1 2 V dc IN P U T S

dlva

Abstract: transmission line model orcad pspice 24 GHz Microwave Sensor surface mount htcc capture and electronic packaging E8257C manual 86142B 8703A E4407B Flip Chip on flex
Contextual Info: SC090624 RF & MW DAR060930 RF & Microwave Packaging Capabilities & Engineering Services Approved for Export DAR 6/30/09 12964 Panama Street • Los Angeles, CA 90066 • Phone: 310.822.8229 FAX: 310.822.3573 • microelectronics@teledyne.com • www.teledynemicro.com

Contextual Info: Glossary Vishay Foil Resistors Bulk Metal Foil Technology Glossary of Terms ACCEPTABLE QUALITY LEVEL AQL : The maximum percent defective (or maximum number of defects per hundred units) that, for the purpose of sampling inspection, can be considered satisfactory as a process average. Defects may be

Contextual Info: Quality and Reliabilty Introduction Superior integrated circuit device reliability is attained when it is an integral part of process devel­ opment, design and manufacturing. This section describes the methodology used by the IBM Micro­ electronics Division to achieve robust DRAM

Contextual Info: Quality and Reliabilty Introduction Superior integrated circuit device reliability is attained when it is an integral part of process devel­ opment, design and manufacturing. This section describes the methodology used by the IBM Micro­ electronics Division to achieve robust DRAM

he804

Abstract: ati connector HE809 smd diode ED MMSD32032602S-C-xx Microspire MB he807 eurofarad TCN30 MMEE08510804S-C-xx mmfl16016604s-c mmfl16016604s-d
Contextual Info: Edition 1.2. Space- & Military Level Components 2008/08 2 Introduction and Table of Contents If you are working on a program for military, industrial and/or space equipments & need product with extended temperature performance, MSA Components can help. To support the customer needs

cecc 50000

Contextual Info: RELIABILITY REPORT RELIABILITY AND FAILURE M ECHANISMS FUNDAM ENTALS In its sim plest form the failure rate at a given tem perature is: F.R. : -Through accelerated stresses we ascertain the value of the com ponents failure rates, in term s of how many devices (in percent) are expected to fail

Contextual Info: QUARTZ CRYSTALS GTS Reeves FREQUENCY PRODUCTS Crystal Product Summary The following is a brief summary of the crystal units offered by CTS Reeves. We offer a broad range of crystal products that include: • Low Frequency Crystals; NT, DT, 5X10 kHz to 1 MHz

arstech

Contextual Info: Proceedings of IPACK2007 ASME InterPACK '07 July 8-12, 2007, Vancouver, British Columbia, CANADA IPACK2007-33870 CLOSED LOOP LIQUID COOLING FOR HIGH PERFORMANCE COMPUTER SYSTEMS Sukhvinder Kang kang@aavid.com David Miller John Cennamo Aavid Thermalloy LLC,

atm lu 738

Contextual Info: RELIABILITY REPORT RELIABILITY AND FAILURE M ECHANISMS FUNDAM ENTALS -Through accelerated stresses we ascertain the value of the com ponents failure rates, in term s of how many devices in percent are expected to fail every 1000 hours of operation (X or F.R.)