HAMMING CODE-ERROR DETECTION CORRECTION Search Results
HAMMING CODE-ERROR DETECTION CORRECTION Equivalents
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HAMMING CODE-ERROR DETECTION CORRECTION Result Highlights (5)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
|---|---|---|---|---|---|
| TCTH022AE | Toshiba Electronic Devices & Storage Corporation | Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Push-pull type / FLAG signal latch function | Datasheet | ||
| TLP5214A | Toshiba Electronic Devices & Storage Corporation | Photocoupler (Gate Driver Coupler) DESAT Detection, OCP, AMC, 5000 Vrms, SO16L | Datasheet | ||
| TCTH022BE | Toshiba Electronic Devices & Storage Corporation | Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Open-drain type / FLAG signal latch function | Datasheet | ||
| TCTH021AE | Toshiba Electronic Devices & Storage Corporation | Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Push-pull type | Datasheet | ||
| TLP5214 | Toshiba Electronic Devices & Storage Corporation | Photocoupler (Gate Driver Coupler) DESAT Detection, OCP, AMC, 5000 Vrms, SO16L | Datasheet |
HAMMING CODE-ERROR DETECTION CORRECTION Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
E160
Abstract: E193 MC10193 SY100E193 SY10E193 SECDED
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sy10e193sy100e193sy10/100e193mc10193+7 | |
SECDED
Abstract: E160 E193 MC10193 SY100E193 SY10E193
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sy10e193sy100e193sy10/100e193mc10193+7 | |
E160
Abstract: E193 MC10193 SY100E193 SY10E193
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sy10e193sy100e193sy10/100e193mc10193+3 | |
74F632
Abstract: 74F632QC C1995 DB31 DP8406 DP8406QV V52A F632 Diode cbn 9579
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dp840674f63232-bit52-pin+10 | |
54HSC630Contextual Info: THIS DOCUMENT IS FOR MAINTENANCE PURPOSES ONLY AND IS NOT RECOMMENDED FOR NEW DESIGNS 54HSC/T630 APRIL 1995 DS3595-3.4 54HSC/T630 RADIATION HARD 16-BIT PARALLEL ERROR DETECTION & CORRECTION The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to |
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54hsc/t630ds3595-316-bit22-bit+1 | |
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Contextual Info: 632 54F/74F632 32-Bit Parallel Error Detection and Correction Circuit The 32-bit parallel error detection and correction circuit EDAC in p £ ka g e . The EDAC uses a modified Hamming code to generate a 7-fflinph<Kk w fljb ito m a 32-bit data word. This check word is |
OCR Scan |
54f/74f63232-bit | |
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Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SEMICONDUCTOR FEATURES DESCRIPTION • ■ ■ ■ ■ ■ Hamming code generation 8-bit wide Expandable for more width Provides parity register ESD protection of 2000V Fully compatible with industry standard 10KH, |
OCR Scan |
lnternal75ki2mc10e/100e193sy10e193sy100e193+4 | |
XTD22Contextual Info: AT&T Microelectronics Product Specification Sheet 1042BL initial Use 5ESS EDC32 Description The 1042BL EDC32 performs error detection and correction on a 32-bit data word using seven bits of correction code. The correction code generated by the device is a modified Hamming |
OCR Scan |
1042bledc3232-bitam29c660+2 | |
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Contextual Info: CM CO O £3 National ÆÆ Semiconductor 54F/74F632 32-Bit Parallel Error Detection and Correction Circuit General Description The ’F632 device is a 32-bit parallel error detection and correction circuit (EDAC in a 52-pin or 68-pin package. The EDAC uses a modified Hamming code to generate a 7-bit |
OCR Scan |
54f/74f63232-bit52-pin68-pin+1 | |
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Contextual Info: S i GEC PLESS EY S E M IC O ND U CTO RS DS3595-3.4 54HSC/T630 RADIATION HARD 16-BIT PARALLEL ERROR DETECTION & CORRECTION The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The |
OCR Scan |
ds3595-354hsc/t63016-bit22-bit+3 | |
hamming code
Abstract: "hamming code" 4 bit hamming code BU-203
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OCR Scan |
16-bitamz8160amz8000z8000+4 | |
Z8000
Abstract: "hamming code"
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OCR Scan |
am296016-bitam2960s32-bit+3 | |
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Contextual Info: GEC P L E S S E Y S E M I C O N D U C T O R S DS3595-3.3 54HSC/T630 RADIATION HARD 16-BIT PARALLEL ERROR DETECTION & CORRECTION The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The |
OCR Scan |
ds3595-354hsc/t63016-bit22-bit+3 | |
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Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH, |
OCR Scan |
sy10e193sy100e193lnternal75kmc10e/100e193+2 | |
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XG404
Abstract: DB10 DS3595-5 ds35954 DS3595
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54hsc/t63016-bitds3595-4ds3595-5+5 | |
f630
Abstract: bil3 hamming code
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OCR Scan |
54f/74f63016-bit22-bit25lsn+4 | |
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Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH, |
OCR Scan |
sy10e193sy100e193lnternal75kmc10e/100e193+2 | |
54HST630
Abstract: DB10 DS3595-5
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54hsc/t63016-bitds3595-522-bit+2 | |
block diagram code hamming
Abstract: ot 112 generate the parity after shift register block SECDED E160 E193 MC10193 SY100E193 SY10E193 p4350
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OCR Scan |
sy10e193sy100e193lnternal75kmc10e/100e193+13 | |
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Contextual Info: ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR DESCRIPTION FEATURES • Hamming code generation ■ Extended 100E V ee range of -4 .2 V to -5 .5 V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully com patible with industry standard 10KH, |
OCR Scan |
sy10e193sy100e193lnternal75kc10e/100e193+5 | |
MC10193
Abstract: E160 E193 SY100E193 SY101E193
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OCR Scan |
sy100e193sy101e193mc10e/100e193sy10e/100e/101e193+3 | |
49C460
Abstract: 7 bit hamming code 49C465 sd1623 XOR16 SD815
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an-15132-bit16-bit49c460+6 | |
block diagram code hamming
Abstract: SECDED 7 bit hamming code hamming code E160 E193 MC10193 SY100E193 SY10E193 generate the parity after shift register block
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OCR Scan |
sy10e193sy100e193lnternal75kiimc10e/100e193+10 | |
c1823.zip
Abstract: verilog code hamming an1823 flash hamming ecc 7 bit hamming code hamming code hamming code-error detection correction LP05 LP03 LP06
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an1823c1823c1823.zipverilog code hamming+7 | |