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    HAMMING CODE-ERROR DETECTION CORRECTION Search Results

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    HAMMING CODE-ERROR DETECTION CORRECTION Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    TCTH022AE
    Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Push-pull type / FLAG signal latch function Datasheet
    TLP5214A
    Toshiba Electronic Devices & Storage Corporation Photocoupler (Gate Driver Coupler) DESAT Detection, OCP, AMC, 5000 Vrms, SO16L Datasheet
    TCTH022BE
    Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Open-drain type / FLAG signal latch function Datasheet
    TCTH021AE
    Toshiba Electronic Devices & Storage Corporation Over Temperature Detection IC / VDD=1.7~5.5V / IPTCO=10μA / IDD=11.3μA / Push-pull type Datasheet
    TLP5214
    Toshiba Electronic Devices & Storage Corporation Photocoupler (Gate Driver Coupler) DESAT Detection, OCP, AMC, 5000 Vrms, SO16L Datasheet

    HAMMING CODE-ERROR DETECTION CORRECTION Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    E160

    Abstract: E193 MC10193 SY100E193 SY10E193 SECDED
    Contextual Info: SY10E193 SY100E193 FINAL ERROR DETECTION/ CORRECTION CIRCUIT FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E VEE range of –4.2V to –5.5V The SY10/100E193 are error detection and correction EDAC circuits designed for use in new, high- performance


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    sy10e193sy100e193sy10/100e193mc10193+712-bitsy100e193jcj28-1sy100e193jctre160e193secded PDF

    SECDED

    Abstract: E160 E193 MC10193 SY100E193 SY10E193
    Contextual Info: ERROR DETECTION/ CORRECTION CIRCUIT FEATURES SY10E193 SY100E193 DESCRIPTION • Hamming code generation ■ Extended 100E VEE range of –4.2V to –5.5V The SY10/100E193 are error detection and correction EDAC circuits designed for use in new, high- performance


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    sy10e193sy100e193sy10/100e193mc10193+712-bitsy100e193jcj28-1sy100e193jctrsecdede160e193 PDF

    E160

    Abstract: E193 MC10193 SY100E193 SY10E193
    Contextual Info: Micrel, Inc. SY10E193 SY100E193 SY10E193 ERROR DETECTION/ CORRECTION CIRCUIT FEATURES SY100E193 DESCRIPTION • Hamming code generation ■ Extended 100E VEE range of –4.2V to –5.5V The SY10/100E193 are error detection and correction EDAC circuits designed for use in new, high- performance


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    sy10e193sy100e193sy10/100e193mc10193+3m9999-032006e160e193 PDF

    74F632

    Abstract: 74F632QC C1995 DB31 DP8406 DP8406QV V52A F632 Diode cbn 9579
    Contextual Info: DP8406 54F 74F632 32-Bit Parallel Error Detection and Correction Circuit General Description The DP8406 device is a 32-bit parallel error detection and correction circuit (EDAC) in a 52-pin or 68-pin package The EDAC uses a modified Hamming code to generate a 7-bit


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    dp840674f63232-bit52-pin+1068-pin39-bit74f632qcc1995db31dp8406qvv52af632diode cbn9579 PDF

    54HSC630

    Contextual Info: THIS DOCUMENT IS FOR MAINTENANCE PURPOSES ONLY AND IS NOT RECOMMENDED FOR NEW DESIGNS 54HSC/T630 APRIL 1995 DS3595-3.4 54HSC/T630 RADIATION HARD 16-BIT PARALLEL ERROR DETECTION & CORRECTION The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to


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    54hsc/t630ds3595-316-bit22-bit+154hsc630 PDF

    Contextual Info: 632 54F/74F632 32-Bit Parallel Error Detection and Correction Circuit The 32-bit parallel error detection and correction circuit EDAC in p £ ka g e . The EDAC uses a modified Hamming code to generate a 7-fflinph<Kk w fljb ito m a 32-bit data word. This check word is


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    54f/74f63232-bit PDF

    Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SEMICONDUCTOR FEATURES DESCRIPTION • ■ ■ ■ ■ ■ Hamming code generation 8-bit wide Expandable for more width Provides parity register ESD protection of 2000V Fully compatible with industry standard 10KH,


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    lnternal75ki2mc10e/100e193sy10e193sy100e193+4pa850sy10e193jcj28-1sy100e193jc PDF

    XTD22

    Contextual Info: AT&T Microelectronics Product Specification Sheet 1042BL initial Use 5ESS EDC32 Description The 1042BL EDC32 performs error detection and correction on a 32-bit data word using seven bits of correction code. The correction code generated by the device is a modified Hamming


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    1042bledc3232-bitam29c660+268-pinxtd22 PDF

    Contextual Info: CM CO O £3 National ÆÆ Semiconductor 54F/74F632 32-Bit Parallel Error Detection and Correction Circuit General Description The ’F632 device is a 32-bit parallel error detection and correction circuit (EDAC in a 52-pin or 68-pin package. The EDAC uses a modified Hamming code to generate a 7-bit


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    54f/74f63232-bit52-pin68-pin+139-bit PDF

    Contextual Info: S i GEC PLESS EY S E M IC O ND U CTO RS DS3595-3.4 54HSC/T630 RADIATION HARD 16-BIT PARALLEL ERROR DETECTION & CORRECTION The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


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    ds3595-354hsc/t63016-bit22-bit+3mil-std-8833x1055x101 PDF

    hamming code

    Abstract: "hamming code" 4 bit hamming code BU-203
    Contextual Info: AmZ8160 Cascadable 16-Bit Error Detection and Correction Unit ADVANCED DATA DISTINCTIVE CHARACTERISTICS GENERAL DESCRIPTION • Modified Hamming Code Detects multiple errors and corrects single bit errors in a parallel data word. Ideal for use in dynamic memory


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    16-bitamz8160amz8000z8000+4am2960hamming code4 bit hamming codebu-203 PDF

    Z8000

    Abstract: "hamming code"
    Contextual Info: Am2960 Cascadable 16-Bit Error Detection and Correction Unit ADVANCED DATA DISTINCTIVE CHARACTERISTICS GENERAL DESCRIPTION • Modified Hamming Code Detects multiple errors and corrects single bit errors in a parallel data word. Ideal for use in dynam ic memory


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    am296016-bitam2960s32-bit+364-bitz8000hamming code PDF

    Contextual Info: GEC P L E S S E Y S E M I C O N D U C T O R S DS3595-3.3 54HSC/T630 RADIATION HARD 16-BIT PARALLEL ERROR DETECTION & CORRECTION The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


    OCR Scan
    ds3595-354hsc/t63016-bit22-bit+3cobalt-60mil-std-8833x1011rad PDF

    Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH,


    OCR Scan
    sy10e193sy100e193lnternal75kmc10e/100e193+228-pinsy10/100e193 PDF

    XG404

    Abstract: DB10 DS3595-5 ds35954 DS3595
    Contextual Info: 54HSC/T630 54HSC/T630 Radiation hard 16-Bit ParallelError Detection & Correction Replaces June 1999 version, DS3595-4.0 DS3595-5.0 January 2000 The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


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    54hsc/t63016-bitds3595-4ds3595-5+522-bitxg404db10ds35954ds3595 PDF

    f630

    Abstract: bil3 hamming code
    Contextual Info: 630 54F/74F630 Connection Diagrams 16-Bit Error Detection and Correction Circuit 3-State Outputs T— r '—'' D EFpr M jv c c DB q [~~2~ ~27] SEF Descrip D B il~3~ ÏÜ S , The 'F630 is a 16-bit Error Detection And Correction EDAC circuit with 3-state oufpu4PR*Uj£s a modified Hamming code to generate a 6-bit


    OCR Scan
    54f/74f63016-bit22-bit25lsn+454f/74ff630bil3hamming code PDF

    Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR FEATURES DESCRIPTION • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully compatible with industry standard 10KH,


    OCR Scan
    sy10e193sy100e193lnternal75kmc10e/100e193+228-pinsy10/100e193 PDF

    54HST630

    Abstract: DB10 DS3595-5
    Contextual Info: 54HSC/T630 54HSC/T630 Radiation hard 16-Bit ParallelError Detection & Correction Replaces January 2000 version, DS3595-5.0 DS3595-5.1 July 2002 The 54HSC/T630 is a 16-bit parallel Error Detection and Correction circuit. It uses a modified Hamming code to generate a 6-bit check word from each 16-bit data word. The


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    54hsc/t63016-bitds3595-522-bit+254hst630db10 PDF

    block diagram code hamming

    Abstract: ot 112 generate the parity after shift register block SECDED E160 E193 MC10193 SY100E193 SY10E193 p4350
    Contextual Info: * ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY S E M IC O N D U C T O R SY10E193 SY100E193 DESCRIPTION FEATURES • Hamming code generation ■ Extended 100E V ee range of -4.2V to -5.5V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register


    OCR Scan
    sy10e193sy100e193lnternal75kmc10e/100e193+13sy10/100e193sy10e193jcj28-1sy10e193jctrsy100e193jcblock diagram code hammingot 112generate the parity after shift register blocksecdede160e193mc10193p4350 PDF

    Contextual Info: ERROR DETECTION/ CORRECTION CIRCUIT SYNERGY SY10E193 SY100E193 SEMICONDUCTOR DESCRIPTION FEATURES • Hamming code generation ■ Extended 100E V ee range of -4 .2 V to -5 .5 V ■ 8-bit wide ■ Expandable for more width ■ Provides parity register ■ Fully com patible with industry standard 10KH,


    OCR Scan
    sy10e193sy100e193lnternal75kc10e/100e193+510/100esy10e193jcj28-1sy10e193jctrsy100e193jc PDF

    MC10193

    Abstract: E160 E193 SY100E193 SY101E193
    Contextual Info: A ERROR DETECTION/ CORRECTIVE CIRCUIT SYN ERG Y e v in n F ic n 1 y 101E193 _ SEMICONDUCTOR J D E S C R IP T IO N FEATURES Hamming Code Generation. 8 - Bit Wide. Expandable for more width. Provides Parity Register. ESD Protection of 2000V.


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    sy100e193sy101e193mc10e/100e193sy10e/100e/101e193+3mc10193e160e193 PDF

    49C460

    Abstract: 7 bit hamming code 49C465 sd1623 XOR16 SD815
    Contextual Info: APPLICATION NOTE AN-151 USING 32-BIT EDCS IN 8-BIT AND 16-BIT APPLICATIONS Integrated Device Technology, Inc. By Anupama Hegde INTRODUCTION The 49C460 and 49C465 are 32-bit error detection and correction EDC devices that use a modified Hamming code easily adaptable to 16 , 32 or 64-bit applications. 16-bit


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    an-15132-bit16-bit49c460+649c46564-bit7 bit hamming codesd1623xor16sd815 PDF

    block diagram code hamming

    Abstract: SECDED 7 bit hamming code hamming code E160 E193 MC10193 SY100E193 SY10E193 generate the parity after shift register block
    Contextual Info: *SYNERGY ERROR DETECTION/ CORRECTION CIRCUIT S E M IC O N D U C TO R FEATURES SY10E193 SY100E193 D E S C R IP T IO N I Hamming code generation i 8-bit wide Expandable for more width Provides parity register ESD protection of 2000V Fully compatible with Industry standard 10KH,


    OCR Scan
    sy10e193sy100e193lnternal75kiimc10e/100e193+10s0013a1000d7d2block diagram code hammingsecded7 bit hamming codehamming codee160e193mc10193generate the parity after shift register block PDF

    c1823.zip

    Abstract: verilog code hamming an1823 flash hamming ecc 7 bit hamming code hamming code hamming code-error detection correction LP05 LP03 LP06
    Contextual Info: AN1823 APPLICATION NOTE Error Correction Code in NAND Flash Memories This Application Note describes how to implement an Error Correction Code ECC , in ST NAND Flash memories, which can detect 2-bit errors and correct 1-bit errors per 256 Bytes. This Application Note should be downloaded with the c1823.zip file.


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    an1823c1823c1823.zipverilog code hamming+7flash hamming ecc7 bit hamming codehamming codehamming code-error detection correctionlp05lp03lp06 PDF