GENERIC FAILURE RATE Search Results

BELLCORE

Abstract: TR332 generic failure rate TR322 TR-332
Contextual Info: Document 235 F-I-T Calculation Chip Inductors Coilcraft uses the Bellcore method TR322 to calculate the failure rate for chip inductor products. Bellcore TR322 uses actual field failure history of devices to define the generic device failure rate (similar to mil std.217). This is then adjusted for:

transistor MTBF

Abstract: thyristor 106 generic failure rate failure rate fuse generic failure rate electronic device Thyristor SCR DSA00347 failure rate connector "failure rate" fuse thyristor MTBF
Contextual Info: MTBF Report KMS40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)

transistor MTBF

Abstract: generic failure rate electronic device generic failure rate
Contextual Info: MTBF Report KMS15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)

generic failure rate electronic device

Abstract: ferrite fuse Zener 224 TOGGLE CLIP generic failure rate electronic equipment generic failure rate Thyristor SCR failure rate fuse transistor MTBF thermistor 054
Contextual Info: MTBF Report KMD40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)

transistor MTBF

Abstract: failure rate fuse generic failure rate generic failure rate electronic device varistor rectifier generic failure rate electronic equipment Thyristor SCR
Contextual Info: MTBF Report KMT15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)

generic failure rate

Abstract: transistor MTBF Thyristor SCR ferrite fuse failure rate fuse "failure rate" fuse generic failure rate electronic equipment generic failure rate electronic device Quality Thermistor ceramics SCR 612
Contextual Info: MTBF Report KMT40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)

generic failure rate

Abstract: generic failure rate electronic device failure rate fuse 0638 ferrite fuse "failure rate" fuse
Contextual Info: MTBF Report KMD15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)

generic failure rate

Abstract: billion ENERGY LTC1695
Contextual Info: RELIABILITY DATA LTC1695 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SOIC/SOT/MSOP SAMPLE SIZE OLDEST DATE CODE 80 0001 80 1 Assumes Activation Energy = 0.7 Electron Volts (2) Not Enough Data to Predict Failure Rate (3) Refer to Rel Data Pack for Generic Product Family Data

metal oxide in capacitor

Abstract: capacitor porous
Contextual Info: V I S H A Y I N T E R T E C H N O L O G Y, I N C . DC LEAKAGE FAILURE MODE Abstract This paper is submitted as an educational medium for use by anyone who has interest in solid tantalum chip capacitor performance. It represents technical phenomena that are generic to all solid tantalum chip

VISHAY film resistors

Abstract: PFRR
Contextual Info: PFRR Vishay Sfernice ESCC 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< 35 dB) and voltage coefficient

0402 resistor ipc-7351

Abstract: PFRR
Contextual Info: PFRR www.vishay.com Vishay ESCC 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient

mil-std 883d method 1010

Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q1 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

tsop 928

Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

PFRR

Contextual Info: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient

VISHAY film resistors

Abstract: vishay 0603 SMD resistors vishay 0805 SMD resistors
Contextual Info: V is h ay I n tertec h n o l o g y, I n c . PFRR Key Benefits • ESA qualified • R Failure rate SMD chip resistor • TCR to 10ppm [–55 °C; +155 °C] • Tolerances down to 0.05 % • Load life stability: less than 0.25 % at Pn at 70 °C after 2000 hours

PFRR

Contextual Info: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient

Contextual Info: QUALITY & RELIABILITY CYPRESS 2000 Q4 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

cmos tsmc 0.18

Abstract: reliability data analysis report failure test report
Contextual Info: QUALITY & RELIABILITY CYPRESS 2000 Q3 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

cmos tsmc 0.18

Contextual Info: CYPRESS QUALITY & RELIABILITY 2000 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

PFRR

Contextual Info: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient

PFRR

Contextual Info: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< -35 dB) and voltage coefficient

CY7B9532V

Abstract: CY7C9536 OC48
Contextual Info: ADVANCE INFORMATION CY7C9536 Packet over SONET/SDH IC - POSIC Features • OC-48/STS-48/STM-16, OC-12/STS-12/STM-4, OC-3/STS3/STM-1 rates, Concatenated and Nonconcatenated — Complies with ITU-Standards G.707/Y.1322 & G.783 • Programmable Frame Tagging Engine, for packet preclassification, enables features such as:

IEC 68-2-30

Abstract: ESCC 4001 escc Vishay PHR Marking 4001 Vishay PFRR
Contextual Info: PFRR Vishay Sfernice ESCC 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< 35 dB) and voltage coefficient

ESCC 4001

Abstract: ESCC 4001/026 p0603 VMN-SG21 CS22 CS33 RMK22N RMK515N RMK55N VMN-SG2135-1007
Contextual Info: V i s h ay I n t e r t e c h n o l o g y, I n c . High Reliability Products Features • CECC qualified • ESCC qualified Space level and R Failure Rate • ESCC QML qualification • Products to Source Control Drawing APPLICATIONS • Space (satellites, launcher, International Space Station)