FAILURE RATE Search Results

mil-std 883d method 1010

Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q1 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

cmos tsmc 0.18

Abstract: reliability data analysis report failure test report
Contextual Info: QUALITY & RELIABILITY CYPRESS 2000 Q3 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

cmos tsmc 0.18

Contextual Info: CYPRESS QUALITY & RELIABILITY 2000 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

tsop 928

Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

Contextual Info: QUALITY & RELIABILITY CYPRESS 2000 Q4 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination

AC319

Abstract: 20.000 G HRS1
Contextual Info: Intrinsic Failure Rate Estimation from Life Test Results Device 60°C Equivalent Device Hours Ea = 0.8V Failure Failure Rate at 60°C Fit 2390 308.42 x 106 2 10.1 *60% confidence level. Reliability Test Results (1) Long Life Test Tfest Condition Device Hours

voltage acceleration

Abstract: billion failure
Contextual Info: Failure Rate Calculation Failure rate predictions are typically expressed in either FITS = Failures per billion device hours MTBF = Mean Time between Failures years = 1E9/FITS converted to years The Arrhenius relationship is used to extrapolate failure rates at highly accelerated

Silicon Technology Reliability

Abstract: 72476
Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2006 223 258 252 4.076 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

72483

Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2296 248 147 113 3.667 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

72560

Abstract: Silicon Technology Reliability
Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 850 112 368 583 8.098 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

transorb

Abstract: transorb failure transorb diode transorb applications notes transorb application note transorb failure rate MIL-STD-756 MIL-STD-1629 ACT8500 fighter
Contextual Info: Application Note Reliability Failure Mode Effects and Predicted Failure Rate Analysis for the ACT 8500 64-Channel Multiplexer Module Application Note AN8500-1 9/15/05 Rev C RESULTS AND SUMMARY The following Failure Mode Effects Analysis FMEA for the 64-CHANNEL MULTIPLEXER MODULE was

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2296 Equivalent Device Hours 657 038 279 Failure Rate in FIT 1.385 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability Vishay Siliconix BCD-18 TECHNOLOGY ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 82 3 566 796 255.131 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

failure rate

Abstract: 313 equivalent
Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,300 Equivalent Device Hours 313,492,812 Number of Total Failures Failure Rate in FIT 2.903 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

schottky diode FIT

Abstract: SCHOTTKY JESD85
Contextual Info: Silicon Technology Reliability Vishay Siliconix SCHOTTKY DIODE ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 410 46 028 658 19.770 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,199 Equivalent Device Hours 166,604,213 Number of Total Failures Failure Rate in FIT 5.462 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

failure rate

Abstract: AN 308 FIT rate
Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 308 Equivalent Device Hours 23,969,456 Number of Total Failures Failure Rate in FIT 38.0 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Silicon Technology Reliability

Abstract: reliability
Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2459 Equivalent Device Hours 278 826 325 Failure Rate in FIT 3.264 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 1886 Equivalent Device Hours 509 111 509 Failure Rate in FIT 1.787 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

JESD85

Contextual Info: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 3608 863 289 007 1.054 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

schottky diode FIT

Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix SCHOTTKY DIODE ACCELERATED OPERATING LIFE TEST RESULT Sample Size 1066 Equivalent Device Hours 127 555 429 Failure Rate in FIT 7.134 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Silicon Technology Reliability

Abstract: silicon
Contextual Info: Silicon Technology Reliability Vishay Siliconix VIS BCD PROCESS TECHNOLOGY 200901 to 201103 Sample Size Equivalent Device Hours Failure Rate in FIT 492 32 101 167 28.348 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

JESD85

Abstract: failure rate Reliability Test Methods for
Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2008 Equivalent Device Hours 342 536 204 Failure Rate in FIT 2.657 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

intel processor transistor count

Abstract: introduction to pentium pro features evolution of intel microprocessor cache
Contextual Info: An Overview of Advanced Failure Analysis Techniques for Pentium and Pentium Pro Microprocessors Yeoh Eng Hong, Intel Penang Microprocessor Failure Analysis Department, Malaysia Lim Seong Leong, Intel Penang Microprocessor Failure Analysis Department, Malaysia