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    FAILURE RATE Search Results

    FAILURE RATE Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MP-54RJ45DNNE-015
    Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-015 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 15ft PDF
    MP-54RJ45SNNE-050
    Amphenol Cables on Demand Amphenol MP-54RJ45SNNE-050 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 50ft PDF
    MP-54RJ45DNNE-010
    Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-010 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 10ft PDF
    MP-54RJ45SNNE-025
    Amphenol Cables on Demand Amphenol MP-54RJ45SNNE-025 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 25ft PDF
    MP-54RJ45DNNE-050
    Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-050 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 50ft PDF

    FAILURE RATE Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    mil-std 883d method 1010

    Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q1 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


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    cmos tsmc 0.18

    Abstract: reliability data analysis report failure test report
    Contextual Info: QUALITY & RELIABILITY CYPRESS 2000 Q3 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


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    cmos tsmc 0.18

    Contextual Info: CYPRESS QUALITY & RELIABILITY 2000 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


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    tsop 928

    Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


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    Contextual Info: QUALITY & RELIABILITY CYPRESS 2000 Q4 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


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    AC319

    Abstract: 20.000 G HRS1
    Contextual Info: Intrinsic Failure Rate Estimation from Life Test Results Device 60°C Equivalent Device Hours Ea = 0.8V Failure Failure Rate at 60°C Fit 2390 308.42 x 106 2 10.1 *60% confidence level. Reliability Test Results (1) Long Life Test Tfest Condition Device Hours


    OCR Scan
    30cycles MIL-STD-883C DIP-14 DIP-16 DIP-20 300mil 20-PIN 150mil 200mil 300mil AC319 20.000 G HRS1 PDF

    voltage acceleration

    Abstract: billion failure
    Contextual Info: Failure Rate Calculation Failure rate predictions are typically expressed in either FITS = Failures per billion device hours MTBF = Mean Time between Failures years = 1E9/FITS converted to years The Arrhenius relationship is used to extrapolate failure rates at highly accelerated


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    Silicon Technology Reliability

    Abstract: 72476
    Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2006 223 258 252 4.076 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 29-Jul-08 Silicon Technology Reliability 72476 PDF

    72483

    Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2296 248 147 113 3.667 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 28-Jul-08 18-Jul-08 72483 PDF

    72560

    Abstract: Silicon Technology Reliability
    Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 850 112 368 583 8.098 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 29-Jul-08 72560 Silicon Technology Reliability PDF

    transorb

    Abstract: transorb failure transorb diode transorb applications notes transorb application note transorb failure rate MIL-STD-756 MIL-STD-1629 ACT8500 fighter
    Contextual Info: Application Note Reliability Failure Mode Effects and Predicted Failure Rate Analysis for the ACT 8500 64-Channel Multiplexer Module Application Note AN8500-1 9/15/05 Rev C RESULTS AND SUMMARY The following Failure Mode Effects Analysis FMEA for the 64-CHANNEL MULTIPLEXER MODULE was


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    64-Channel AN8500-1 64-CHANNEL MIL-STD-1629, 16-Channel transorb transorb failure transorb diode transorb applications notes transorb application note transorb failure rate MIL-STD-756 MIL-STD-1629 ACT8500 fighter PDF

    Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2296 Equivalent Device Hours 657 038 279 Failure Rate in FIT 1.385 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 23-Apr-12 PDF

    Contextual Info: Silicon Technology Reliability Vishay Siliconix BCD-18 TECHNOLOGY ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 82 3 566 796 255.131 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    BCD-18 JESD85, 18-Nov-10 PDF

    failure rate

    Abstract: 313 equivalent
    Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,300 Equivalent Device Hours 313,492,812 Number of Total Failures Failure Rate in FIT 2.903 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 26-Jan-05 failure rate 313 equivalent PDF

    schottky diode FIT

    Abstract: SCHOTTKY JESD85
    Contextual Info: Silicon Technology Reliability Vishay Siliconix SCHOTTKY DIODE ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 410 46 028 658 19.770 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 28-Jul-08 schottky diode FIT SCHOTTKY JESD85 PDF

    Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,199 Equivalent Device Hours 166,604,213 Number of Total Failures Failure Rate in FIT 5.462 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 28-Jan-05 PDF

    failure rate

    Abstract: AN 308 FIT rate
    Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 308 Equivalent Device Hours 23,969,456 Number of Total Failures Failure Rate in FIT 38.0 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 22-Oct-03 failure rate AN 308 FIT rate PDF

    Silicon Technology Reliability

    Abstract: reliability
    Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2459 Equivalent Device Hours 278 826 325 Failure Rate in FIT 3.264 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 10-Jul-14 Silicon Technology Reliability reliability PDF

    Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 1886 Equivalent Device Hours 509 111 509 Failure Rate in FIT 1.787 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 23-Apr-12 PDF

    JESD85

    Contextual Info: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 3608 863 289 007 1.054 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 18-Aug-09 JESD85 PDF

    schottky diode FIT

    Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix SCHOTTKY DIODE ACCELERATED OPERATING LIFE TEST RESULT Sample Size 1066 Equivalent Device Hours 127 555 429 Failure Rate in FIT 7.134 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 23-Apr-12 schottky diode FIT PDF

    Silicon Technology Reliability

    Abstract: silicon
    Contextual Info: Silicon Technology Reliability Vishay Siliconix VIS BCD PROCESS TECHNOLOGY 200901 to 201103 Sample Size Equivalent Device Hours Failure Rate in FIT 492 32 101 167 28.348 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 31-Mar-11 Silicon Technology Reliability silicon PDF

    JESD85

    Abstract: failure rate Reliability Test Methods for
    Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2008 Equivalent Device Hours 342 536 204 Failure Rate in FIT 2.657 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,


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    JESD85, 15-May-12 JESD85 failure rate Reliability Test Methods for PDF

    intel processor transistor count

    Abstract: introduction to pentium pro features evolution of intel microprocessor cache
    Contextual Info: An Overview of Advanced Failure Analysis Techniques for Pentium and Pentium Pro Microprocessors Yeoh Eng Hong, Intel Penang Microprocessor Failure Analysis Department, Malaysia Lim Seong Leong, Intel Penang Microprocessor Failure Analysis Department, Malaysia


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