FAILURE RATE Search Results
FAILURE RATE Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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MP-54RJ45DNNE-015 |
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Amphenol MP-54RJ45DNNE-015 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 15ft | |||
MP-54RJ45SNNE-050 |
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Amphenol MP-54RJ45SNNE-050 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 50ft | |||
MP-54RJ45DNNE-010 |
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Amphenol MP-54RJ45DNNE-010 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 10ft | |||
MP-54RJ45SNNE-025 |
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Amphenol MP-54RJ45SNNE-025 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 25ft | |||
MP-54RJ45DNNE-050 |
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Amphenol MP-54RJ45DNNE-050 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 50ft |
FAILURE RATE Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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mil-std 883d method 1010Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q1 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination |
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cmos tsmc 0.18
Abstract: reliability data analysis report failure test report
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cmos tsmc 0.18Contextual Info: CYPRESS QUALITY & RELIABILITY 2000 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination |
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tsop 928Contextual Info: QUALITY & RELIABILITY CYPRESS 2001 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination |
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Contextual Info: QUALITY & RELIABILITY CYPRESS 2000 Q4 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination |
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AC319
Abstract: 20.000 G HRS1
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OCR Scan |
30cycles MIL-STD-883C DIP-14 DIP-16 DIP-20 300mil 20-PIN 150mil 200mil 300mil AC319 20.000 G HRS1 | |
voltage acceleration
Abstract: billion failure
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Silicon Technology Reliability
Abstract: 72476
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JESD85, 29-Jul-08 Silicon Technology Reliability 72476 | |
72483Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2296 248 147 113 3.667 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, |
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JESD85, 28-Jul-08 18-Jul-08 72483 | |
72560
Abstract: Silicon Technology Reliability
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JESD85, 29-Jul-08 72560 Silicon Technology Reliability | |
transorb
Abstract: transorb failure transorb diode transorb applications notes transorb application note transorb failure rate MIL-STD-756 MIL-STD-1629 ACT8500 fighter
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64-Channel AN8500-1 64-CHANNEL MIL-STD-1629, 16-Channel transorb transorb failure transorb diode transorb applications notes transorb application note transorb failure rate MIL-STD-756 MIL-STD-1629 ACT8500 fighter | |
Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2296 Equivalent Device Hours 657 038 279 Failure Rate in FIT 1.385 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, |
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JESD85, 23-Apr-12 | |
Contextual Info: Silicon Technology Reliability Vishay Siliconix BCD-18 TECHNOLOGY ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 82 3 566 796 255.131 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs, |
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BCD-18 JESD85, 18-Nov-10 | |
failure rate
Abstract: 313 equivalent
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JESD85, 26-Jan-05 failure rate 313 equivalent | |
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schottky diode FIT
Abstract: SCHOTTKY JESD85
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JESD85, 28-Jul-08 schottky diode FIT SCHOTTKY JESD85 | |
Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,199 Equivalent Device Hours 166,604,213 Number of Total Failures Failure Rate in FIT 5.462 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, |
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JESD85, 28-Jan-05 | |
failure rate
Abstract: AN 308 FIT rate
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JESD85, 22-Oct-03 failure rate AN 308 FIT rate | |
Silicon Technology Reliability
Abstract: reliability
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JESD85, 10-Jul-14 Silicon Technology Reliability reliability | |
Contextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 1886 Equivalent Device Hours 509 111 509 Failure Rate in FIT 1.787 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, |
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JESD85, 23-Apr-12 | |
JESD85Contextual Info: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 3608 863 289 007 1.054 Failure Rate in FIT is calculated according to JEDEC standard JESD85, Methods for Calculating Failure Rates in Units of FITs, |
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JESD85, 18-Aug-09 JESD85 | |
schottky diode FITContextual Info: Silicon Technology Reliability www.vishay.com Vishay Siliconix SCHOTTKY DIODE ACCELERATED OPERATING LIFE TEST RESULT Sample Size 1066 Equivalent Device Hours 127 555 429 Failure Rate in FIT 7.134 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, |
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JESD85, 23-Apr-12 schottky diode FIT | |
Silicon Technology Reliability
Abstract: silicon
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JESD85, 31-Mar-11 Silicon Technology Reliability silicon | |
JESD85
Abstract: failure rate Reliability Test Methods for
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JESD85, 15-May-12 JESD85 failure rate Reliability Test Methods for | |
intel processor transistor count
Abstract: introduction to pentium pro features evolution of intel microprocessor cache
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