ESD TEST PLAN Search Results

D2103

Abstract: MIL-PRF81705D DS-1131 PET FILM ASTM D2103
Contextual Info: STATSHIELD M/O SERIES Specifications: Electrical Properties Surface Resistance: Outer Surface Aluminum Layer Inner Surface Typical Values Test Procedures/Method <108 ohms <102 ohms <1011 ohms EOS/ESD S11.11 EOS/ESD S11.11 EOS/ESD S11.11 EOS/ESD S11.31 Modified Incline Plane

ASTM-F-150

Abstract: fashion garment ASTMF-150 EIA-625 ESD-ADV53 esd 20.20 MIL-HDBK-263A
Contextual Info: TECHNICAL BULLETIN TB-3014 Surface Resistance Test Kit Operation and Maintenance Made in America • • • • • Footwear - ESD S9.1 - Footwear Resistive Characterization Garments - ESD STM2.1 Garments Seating - ESD STM12.1- Seating Resistive Measurement

SI02-07

Contextual Info: SI02-07 Surging Ideas TVS Diode Application Note PROTECTION PRODUCTS IEC 61000-4-2 ESD Review and Test Setup electronic or electrical product that can be conceived. The IEC 61000-4-2 ESD test setup is diagrammed in Figure 1. The standard requires air and contact

Contextual Info: SI02-07 Surging Ideas TVS Diode Application Note PROTECTION PRODUCTS IEC 61000-4-2 ESD Review and Test Setup electronic or electrical product that can be conceived. The IEC 61000-4-2 ESD test setup is diagrammed in Figure 1. The standard requires air and contact

AOZ8304

Abstract: 3.3V TVS diode AOS date code System
Contextual Info: AOZ8304 Low Capacitance 3.3V TVS Diode Array General Description Features The AOZ8304 is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● ESD protection for high-speed data lines: – IEC 61000-4-2, level 4 ESD immunity test

D882

Abstract: ASTM 1249
Contextual Info: STATFREE ESD ULTRA CLEAR BAG Low Charging Polyethylene Zipper Specifications: Zipper Color is ESD Yellow Electrical Properties Surface Resisitance: both surfaces @ 50%RH Charge Generation: Teflon Quartz Typical Value Test Procedures/Method <10E11 ohms

MIL-D-3464

Abstract: D1876 MIL-D3464 MILD-3464 MIL-D-3464 type 2 D1876-93 MIL-D-3464 type 1 MIL-STD-3010 D-1876 FTMS-101C
Contextual Info: STATSHIELD STANDARD MOISTURE BARRIER BAG Specifications: Electrical Properties Typical Values Test Procedures/Method Surface Resistance both surfaces @ 12%RH ANSI/ESD STM11.11 <10E11ohms Static Shielding ANSI/ESD STM11.31 <10 nJ Static Shielding EIA 541

ASTM-F-150

Abstract: fashion garment ASTMF-150 3014 LED 1X10E12 3014 LEDs ESD-ADV53 50560 led liquid level meter circuit diagram TB3014
Contextual Info: TECHNICAL BULLETIN TB-3014 Surface Resistance Test Kit Operation and Maintenance Made in the United States ofAmerica • • Floors - ANSI/ESD S7.1- Resistive Characterization of Materials Floor Materials Footwear - ESD S9.2 - Footwear Resistive Characterization

ASTM D2103

Abstract: ASTM F1249 ESD S11.11 ESD-DS11 PET FILM ASTM D2103 - 10
Contextual Info: Low Charging Polyethylene Zipper STATSHIELD M/O SERIES Specifications: Electrical Properties Surface Resistance: Outer Surface Aluminum Layer Inner Surface Typical Values Test Procedures/Method <108 ohms <102 ohms <1011 ohms EOS/ESD S11.11 EOS/ESD S11.11

Contextual Info: s r ; Mta SI97-01 Note TEL: 805-498-2111 F A X : 805-498-3804 Electrostatic Discharge ESD Protection for Ethernet Transceivers This application note illustrates how to implement ESD protection for Ethernet transceivers. The protection technique shown may be used to aid in meeting the test

AOZ8001K

Abstract: AOZ8001KI AOZ8001KIL SC-89
Contextual Info: AOZ8001K Ultra-Low Capacitance TVS Diode Array General Description Features The AOZ8001K is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. ● – IEC 61000-4-2, level 4 ESD immunity test – ±15kV (air discharge) and ±8kV (contact discharge)

hb125ep

Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74AHCT126ĆEP QUADRUPLE BUS BUFFER GATES WITH 3ĆSTATE OUTPUTS SCLS551 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74LVCC3245AĆEP OCTAL BUS TRANSCEIVER WITH ADJUSTABLE OUTPUT VOLTAGE AND 3ĆSTATE OUTPUTS SCAS773A − JUNE 2004 − REVISED MARCH 2005 D Controlled Baseline D D D D D D D D ESD Protection Exceeds JESD 22 − One Assembly/Test Site, One Fabrication Site

Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74AHCT126ĆEP QUADRUPLE BUS BUFFER GATES WITH 3ĆSTATE OUTPUTS SCLS551 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74AHCT125ĆEP QUADRUPLE BUS BUFFER GATE WITH 3ĆSTATE OUTPUTS SCLS549 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74AHCT126ĆEP QUADRUPLE BUS BUFFER GATES WITH 3ĆSTATE OUTPUTS SCLS551 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

MA3232C

Abstract: MA3232 MAX3232 MAX3232MDBREP MAX3232MPWREP
Contextual Info: MAX3232-EP www.ti.com SGLS337 – APRIL 2006 3-V TO 5.5-V MULTICHANNEL RS-232 LINE DRIVER/RECEIVER WITH ±15-kV ESD PROTECTION FEATURES • Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C

Contextual Info: SN74AHCT126ĆEP QUADRUPLE BUS BUFFER GATES WITH 3ĆSTATE OUTPUTS SCLS551 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74AHCT126ĆEP QUADRUPLE BUS BUFFER GATES WITH 3ĆSTATE OUTPUTS SCLS551 − DECEMBER 2003 D Controlled Baseline D D D D D ESD Protection Exceeds 2000 V Per − One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of −40°C to 125°C

Contextual Info: SN74LVCC3245AĆEP OCTAL BUS TRANSCEIVER WITH ADJUSTABLE OUTPUT VOLTAGE AND 3ĆSTATE OUTPUTS SCAS773A − JUNE 2004 − REVISED MARCH 2005 D Controlled Baseline D D D D D D D D ESD Protection Exceeds JESD 22 − One Assembly/Test Site, One Fabrication Site

Contextual Info: SN74LVCC3245AĆEP OCTAL BUS TRANSCEIVER WITH ADJUSTABLE OUTPUT VOLTAGE AND 3ĆSTATE OUTPUTS SCAS773A − JUNE 2004 − REVISED MARCH 2005 D Controlled Baseline D D D D D D D D ESD Protection Exceeds JESD 22 − One Assembly/Test Site, One Fabrication Site