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    Intel Corporation EPM570GT144I5N

    IC CPLD 440MC 5.4NS 144TQFP
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    DigiKey EPM570GT144I5N Tray 180
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    Altera Corporation EPM570GT144I5N

    CPLD - Complex Programmable Logic Devices
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    Mouser Electronics EPM570GT144I5N
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    EPM570GT144I5N Datasheets (2)

    Part ECAD Model Manufacturer Description Curated Type PDF
    EPM570GT144I5N Altera Embedded - CPLDs (Complex Programmable Logic Devices), Integrated Circuits (ICs), IC CPLD 440MC 5.4NS 144TQFP Original PDF
    EPM570GT144I5N Altera MAX II Instant-On, Non-Volatile CPLDs: The Lowest-Power, Lowest-Cost CPLDs Ever; 144 pin TQFP; -40 to 105°C Original PDF

    EPM570GT144I5N Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    PCN0813

    Abstract: EPM240T100C5N EP1C3T144C8N EPM240T100I5N EPM1270T144C5N EPM570T144C5N EPM240T100C5 EPM570T100C5N EPM2210F256A5N f324
    Text: Revision: 1.0.0 PROCESS CHANGE NOTIFICATION PCN0813 POLYIMIDE WAFER COAT REMOVAL FOR SELECTED ALTERA DEVICES Change Description Altera is implementing a change to the wafer coat on selected product lines fabricated at Taiwan Semiconductor Manufacturing Co. TSMC . This change includes the exclusion of the existing


    Original     		PDF PCN0813 PM2210GF256C5N EPM2210GF256C5RR EPM2210GF256I5 EPM2210GF256I5N EPM2210GF324C3 EPM2210GF324C3N EPM2210GF324C4 EPM2210GF324C4N EPM2210GF324C5 PCN0813 EPM240T100C5N EP1C3T144C8N EPM240T100I5N EPM1270T144C5N EPM570T144C5N EPM240T100C5 EPM570T100C5N EPM2210F256A5N f324

    EPM240T100C5N

    Abstract: EPM2210GF324C3N EPM1270T144I5 EPM570F256C5N EPM570T144C5N EPM570F256C3 EPM1270T144I5N EPM1270T144C5N EPM1270GT144i5 epm240gt100c5n
    Text: Section I. MAX II Device Family Data Sheet This section provides designers with the data sheet specifications for MAX II devices. The chapters contain feature definitions of the internal architecture, Joint Test Action Group JTAG and in-system programmability (ISP) information, DC operating conditions, AC timing


    Original     		PDF EPM2210GF256C5N EPM2210GF324C3 EPM2210G EPM2210GF324C3N EPM2210GF324C4 EPM2210GF324C4N EPM2210GF324C5 EPM2210GF324C5N EPM2210GF256I5 EPM2210GF256I5N EPM240T100C5N EPM1270T144I5 EPM570F256C5N EPM570T144C5N EPM570F256C3 EPM1270T144I5N EPM1270T144C5N EPM1270GT144i5 epm240gt100c5n

    CYCLONE 3 ep3c25f324* FPGA

    Abstract: FBGA-484 datasheet EP3C16F484I7N EPM570T144I5 EP3C10E144I7N EP3C25F324I7N EPM1270F256I5 EPM1270T144I5 EP2C5Q208I8N EP3C120F780I7N
    Text: Technical Brief Extended Temperature Support for Cyclone II, Cyclone III, and MAX II Devices Introduction Semiconductor devices undergo at least two types of testing: device characterization and production testing. Device characterization is used to verify the performance of a semiconductor design and its physical implementation.


    Original     		PDF