EIA-364-56 PROCEDURE 6 Search Results

samtec connector lc

Contextual Info: TEST REPORT #98150 QUALIFICATION TESTING mm*., , n nr., ‘I‘bW / >aw SAMTEC CORPORATION .: :, <’ AUGUST 13,1998 TEST REPORT #98150 QUALIFICATION TESTING TSW/SSW SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC.

6ES8

Abstract: EIA-364-TP-27
Contextual Info: CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing

Contextual Info: SEPTEMBER 29, 1995 TEST REPORT #95445 QUALIFICATION TESTING FTM/CLM SERIES SAMTEC CORPORATION APPROVED BY:' MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. I 1 Contech Research ’ , i .* ’ This is to certify that the evaluation described herein was

Contextual Info: NOVEMBER 25,1998 TEST REPORT #98406 QUALIFICATION TESTING MECl SAMTEC CORPORATION / , &v/M’/* APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

EIA-364 temperature rise

Contextual Info: NOVEMBER 25,1998 TEST REPORT #98406 QUALIFICATION TESTING MECl SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

Contextual Info: JANUARY 9,1997 TEST REPORT #97609 QUALIFICATION TESTING TLE/TMMH SAMTEC CORPORATION APPROVED BY: MAX PEEL ' PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc.

Contextual Info: JUNE 30,1998 TEST REPORT #98312 QUALIFICATION TESTING FTMH/MLE SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

PGA370 pinout

Abstract: pentium 3 pga370 MOTHERBOARD CIRCUIT diagram 370 socket pinout intel pentium 3 motherboard schematic diagram PGA370 PGA370 socket intel pentium 4 motherboard schematic diagram 8080 intel microprocessor pin diagram socket 370 pinout socket pga370
Contextual Info: 370-Pin Socket PGA370 Design Guidelines Order Number: 244410-002 April, 1999 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel's Terms and Conditions of Sale for such products, Intel

PGA370

Abstract: PGA370 pinout pentium 3 pga370 MOTHERBOARD CIRCUIT diagram 370 socket pinout socket pga370 intel pentium 4 motherboard schematic diagram intel traceability code pentium 4 motherboard schematic diagram ATX MOTHERBOARD schematic intel pentium 3 motherboard schematic diagram
Contextual Info: 370-Pin Socket PGA370 Design Guidelines Order Number: 244410-001 November, 1998 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel’s Terms and Conditions of Sale for such products, Intel assumes no liability

ec 6sl

Contextual Info: NOVEMBER 20, 1996 TEST REPORT #96281 QUALIFICATION TESTING CLT/TMM SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research . CERTIFICATION This is to certify that the evaluation described herein was

Socket 754

Abstract: AMD athlon socket 754 AMD socket s1 amd athlon 64 socket 754 AMD Socket 754 socket s1 Advanced Micro Devices EIA 364-60 EIA-364-103 socket S1 AMD Socket S1 PIN LAYOUT
Contextual Info: Socket 754 Design and Qualification Requirements Publication # 24850 Rev: 3.07 Issue Date: August 2003 2001–2003 Advanced Micro Devices, Inc. All rights reserved. The contents of this document are provided in connection with Advanced Micro Devices, Inc. “AMD” products. AMD makes no representations or

ZC-982

Contextual Info: / - DECEMBER 3, 1996 I I TEST REPORT #9628@ QUALIFICATION TESTING CLE/FTE SAMTEC CORPORATION I APPROVED BY: LUANNE WITT PROGRAM MANAGER CONTECH RESEARCH, INC. CJl!y!yR 1 Contech Research - CERTIFICATION This is to certify that the evaluation described herein was

intel 94v-0 MOTHERBOARD MANUAL

Abstract: ls 36 motherboard manual intel traceability idc connector 10 pin intel date code marking sn SMA EIA-364 ink cartridge chip Accelerometer 300g "pin to pin capacitance" A157
Contextual Info: 330-Contact Slot Connector SC330 Design Guidelines Release Date: September 1998 Order Number: 244428-001 330-Contact Slot Connector (SC330) Design Guidelines Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual

99093

Abstract: 3478A DFIS-100
Contextual Info: MAY 28,1999 TEST REPORT 1198643 QUALIFICATION TESTING PSS-23-01-T-S HFWS-20-01-T-S SAMTEC CORPOR4TION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

T40 16 ultrasonic

Contextual Info: L<. ru c: ” Ial c E: rl r 1 c $1 !‘7 I * plrasRvARY 18, X999 lu TEST REPORT #98689 . . . tar QUALIFICATLOM TESTING . X&T-075-05-L-D-A HItF-075-02-L-D-A SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVABTCED RESEARCH CONTECH RESEARCH, INC.

intel date code marking

Abstract: Accelerometer 300g AP-826 Connector 221 intel MOTHERBOARD pcb design in SC242 411C A121 Single Edge Contact (S.E.C.) Cartridge:
Contextual Info: SC242 Connector Design Guidelines August, 1998 Order Number: 243397-002 Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document. Except as provided in Intel's Terms and Conditions of Sale for such products, Intel assumes no liability

CL4 valve

Abstract: t122 25 3
Contextual Info: APRIL 7,1998 TEST REPORT #97626 QUALIFICATION TESTING CSB/MSB SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

intel d3001

Abstract: 243397 411C A121 B121 D3001 intel traceability code Single Edge Contact (S.E.C.) Cartridge:
Contextual Info: E Slot 1 Connector Design Guidelines August 1997 Order Number: 243397-001 9/15/97 11:58 AM 24339701.DOC INTEL CONFIDENTIAL until publication date E Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or

Contextual Info: MAY 30,1997 TEST REPORT #97144 QUALIFICATION TESTING SOLC/TOLC SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. L ~-Jqiijzii$ Contech Research CERTIFICATION This is to certify that the evaluation described herein was

EIA364

Abstract: EIA-364
Contextual Info: JUNE 30,1997 TEST REPORT #97236 QUALIFICATION TESTING FLE/FTSH SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

99218

Abstract: POM7-256C Fluke 54200 HLE-115
Contextual Info: JULY 14, 1999 TEST REPORT #99218 QUALIFICATION TESTING HLE-115-Ol-L-DV TSM-115-04-L-DV SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. L REVISION LEVEL DATE DESCRIPTION REVISION NO. - r INITIAL ISSUE

Contextual Info: CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing

Contextual Info: APRIL 21,1998 TEST REPORT #98093 QUALIFICATION TESTING SE1 CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor.

Contextual Info: BCcomponents COMPONENTS BCcomponents Product specification DCS 0 4 0 2 ; DCT 0 6 0 3 ; DCU 0 8 0 5 ; DCA 1206 T h ick film fla it site. A thick film is screen printed on a high grade alumina ceramic substrate to form the resistive layer. Pre-contacts are printed on both sides of the substrate. The resistors are laser