BCR 1A11 Search Results

SN54BCT8240A

Abstract: SN74BCT8240A
Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067C - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F240 and SN54/74BCT240 in the Normal­

F240

Abstract: SN54BCT8240A SN74BCT8240A BCT8240A DB471
Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D - FEBRUARY 1990 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products SN54BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE TOP VIEW

BCT8244A

Abstract: SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 SN 54BCT8244A . . . JT PACKAGE SN 74BCT8244A . . . DW OR NT PACKAGE TOP VIEW Members of the Texas Instruments SCOPE Family of Testability Products

SN54ABT18502

Abstract: H TR 1A60 texas instruments 486 TR 1A60
Contextual Info: SN54ABT18502 SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER SCBS109C - AU G U S T 1992 - RE V IS E D AU G U S T 1994 SCOPE Instruction Set - IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ - Parallel-Signature Analysis at Inputs With

SN54BCT8244A

Abstract: SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­

SN54ABT18245A

Abstract: SN74ABT18245A
Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS11OE - AUGUST 1992 - REVISED JANUARY 1995 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus™ Family SN54ABT18245A . . . WD PACKAGE

SN54ABT18245A

Abstract: SN74ABT18245A 1A41 ABT18245A DL - 10EA 1000502F
Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS _ SC BS110F-A U G U ST 1 9 9 2 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus™ Family

SN54ABT18640

Abstract: SN74ABT18640 55PHL
Contextual Info: SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267A-FEBRUARY 1994 - REVISED AUGUST 1994 S N 54A BT18640. . . WD PACKAGE SN74ABT18640 . . . DL PACKAGE TOP VIEW description The SN54ABT18640 and SN74ABT18640 scan test devices with 18-bit inverting bus transceivers

SN54ABT18245A

Abstract: SN74ABT18245A
Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110G - A U G U S T 1 9 9 2 - REVISED D ECE M B ER 1996 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus™ Family

Contextual Info: SN54LVT18245, SN54LVT182245, SN74LVT18245, SN74LVT182245 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS161B - AUGUST 1993 - REVISED AUGUST 1994 SN54LVT18245, SN54LVT182245 . . . WD PACKAGE SN74LVT18245, SN74LVT182245. . . DGG OR DL PACKAGE TOP VIEW

BT182

Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H - AUGUST 1992 - REVISED FEBRUARY 1999 Members of the Texas Instruments SCOPE Family of Testability Products SN54ABT18245A . . . W D PACKAGE S N74ABT18245A . . . DGG OR DL PACKAGE

SF 9001A

Abstract: 1A61
Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS S C 8 S 1 6 4 B -A U G U S T 1 9 9 3 -flE V IS E D M AR C H 1995 One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency

SN54ABT18245A

Abstract: SN74ABT18245A
Contextual Info: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110D - AUGUST 1992 - REVISED AUGUST 1994 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments Widebus™ Family Compatible With the IEEE Standard

Contextual Info: SN54LVT18646, SN54LVT182646, SN74LVT18646, SN74LVT182646 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS311A-MARCH 1 9 9 4 - REVISED JULY 1994 • Members of the Texas Instruments SCOPE Family of Testability Products • Members of the Texas Instruments

SN54ABTH182502A

Abstract: SN54ABTH18502A SN74ABTH182502A SN74ABTH18502A ABTH182502 ABTH182502A
Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS 5CBS164A-AUGUST 1 9 9 3 - REVISED AUGUST 1994 Members of the Texas Instruments SCOPE Family of Testability Products Members of the Texas Instruments

SN54LVT18502

Contextual Info: SN54LVT18502 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS669-JULY 1996 M e m b e r of the Te x a s I n s t r u m e n t s S C O P E F a mi l y o f Testabil ity P r o du c t s C o m p a t i b l e With the I EEE S t a n d a r d 11 4 9 . 1 - 19 9 0 J T A G Test A c c e s s P o r t and

ground nut seed

Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A, SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS164C - AUGUST 1993 - REVISED JULY 1996 One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency SCOPE Instruction Set

ap 4744

Contextual Info: SN54LVT18512, SN54LVT182512, SN74LVT18512, SN74LVT182512 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS711 - OCTOBER 1997 Members of the Texas Instruments SCOPE Family of Testability Products SN54LVT18512, SN54LVT182512 . . . HKC PACKAGE

ABTH18646A

Abstract: SN54ABTH182646A SN54ABTH18646A SN74ABTH182646A SN74ABTH18646A 1A41 tl 4226
Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166A - AUG UST 1993 - REVISED A U G U S T 1994 M em bers o f th e Texas In stru m e n ts SC O P E Fam ily o f T estab ility P rod ucts

74ABTH18646A

Contextual Info: SN54ABTH18646A, SN54ABTH182646A, SN74ABTH18646A, SN74ABTH182646A SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS SCBS166D - AUGUST 1993 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O

PASB

Abstract: ec ubt 4.8 t LVTH182502A LVTH18502A SN54LVTH182502A SN54LVTH18502A SN74LVTH182502A SN74LVTH18502A
Contextual Info: SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS S C B S 6 6 8 A -JULY 1 9 9 6 - REVISED DECEMBER 1996 Members of the Texas Instruments SCOPE Family of Testability Products

D1071

Abstract: LVTH182646A LVTH18646A SN54LVTH182646A SN54LVTH18646A SN74LVTH182646A SN74LVTH18646A
Contextual Info: SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS _ S C BS 311B-M AR C H 1994-R E V IS E D JULY 1996 •

SN54ABTH182652A

Abstract: SN54ABTH18652A SN74ABTH182652A SN74ABTH18652A
Contextual Info: SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS _ SCBS167A-AUGUST 1 9 9 3 - REVISED AUGUST 1994 Members of the Texas Instruments SCOPE Family of Testability Products

Contextual Info: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SC B S 164E -A U G U S T 1993-R E V IS E D DECEMBER 1996 Members of the Texas Instruments SCOPE Family of Testability Products One Boundary-Scan Cell Per I/O