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    BA1360F

    Abstract: BA1360 BA4558 dx tfk 811 s
    Contextual Info: IC /M onolithic ICs • IC Thermal Design < Bufis u, s * ! ^ * i£ S S S iZ k it, m + t f M k L t z u i£ c e e d e d , the d e vice p e rfo rm a n ce w ill d e te rio ra te and Z tft '& V tt o may be destroyed. It is n e ce ssary to co n sid e r te m p e ra ­


    OCR Scan     		ba1360fba1360ba4558 dxtfk 811 s PDF

    FIT4 diode

    Abstract: BA1360 BA1360F
    Contextual Info: i y U *> 7 ^ IC/'M onolithic ICs m m ±<D zm Precautions for Use • e * • m m m o it M • Storing and Transporting ICs 1 i C f ò i g t i m & T n M t t c z<r>W5±<r>t:ih, (1) To p revent lead oxidation w hen ICs are stored, s to r­ % * > '< < m a ge should be done as clo se to room te m p e ra tu re as


    OCR Scan     		fit4 diodeba1360ba1360f PDF