SN74BCT8240ADW
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Texas Instruments
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IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 |
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SNJ54BCT8240AJT
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Texas Instruments
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Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 |
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SNJ54BCT8240AFK
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Texas Instruments
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Scan Test Devices With Octal Buffers 28-LCCC -55 to 125 |
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ISL8240MIRZ
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Renesas Electronics Corporation
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Dual 20A/Single 40A Step-Down Power Module |
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ISL8240MEVAL3Z
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Renesas Electronics Corporation
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Dual 20A/Single 40A Step-Down Power Module Evaluation Board |
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ISL8240MEVAL4Z
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Renesas Electronics Corporation
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Dual 20A/Single 40A Step-Down Power Module Evaluation Board |
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