AUTOMATED PHASE NOISE MEASUREMENT SYSTEM Search Results

WPN9000

Abstract: PN8000 PN9500 PN9000 PN9348-10 Aeroflex PN9000
Contextual Info: Phase Noise PN8000 LOW COST automated crystal oscillator / PLL synthesizer phase noise test system The PN8000 is a low cost compact phase noise test set, designed for simple measurement of crystal oscillator and synthesizer source phase noise measurements.

PN9255

Abstract: PN9220-00 PN9000 pn9200 PN9230 PN9240 PN9250 PN9710 phase detector 10 khz crystal oscillator 42 MHz
Contextual Info: Tommorrow’s Phase Noise Testing Today MICROWAVE OUTPUT PN9000 AUTOMATED PHASE NOISE MEASUREMENT SYSTEM DOWNCONVERTER SERIES MICROWAVE OSCILLATORS DUT INPUT 1.7 TO 18.5 GHZ DRO LOCKED -10 dBm Min TIME BASE REF LOCKED 10 MHz IN Fc TUNE PN9250 PN9255 PN9240

PN9000

Abstract: Aeroflex PN9000 Application Note Digitizing pn9000 pn900 93-0001 Aeroflex PN9000
Contextual Info: Tommorrow’s Phase Noise Testing Today 35 South Service Road Plainview, NY 11803 TEL: 516-694-6700 FAX: 516-694-6771 APPLICATION NOTE #2 PN9000 Automated Phase Noise Measurement System 1 INTRODUCTION This Application Note describes the operational characteristics of the

PN9560

Abstract: 100 Hz crystal oscillator PN9530 automated phase noise measurement system
Contextual Info: ÛEROFLEX Tom m orrow's Phase Noise Testing Today COMSTRON PN9000 AUTOMATED PHASE NOISE MEASUREMENT SYSTEM LOW NOISE OSCILLATORS/SOURCES Ü ü CXO | CXO ^"0“ IÛ r xo | cxo o O O o o o Fc. TUNE Fc. TUNE Fc. TUNE Fc. TUNE Fc. TUNE Fc. TUNE * 0 INPUT INPUT

10 GHz rf delay line

Abstract: PN9000 Aeroflex PN9000 PN9240 PN9712 PN9711 rf delay line PN9710 PN9713 phase shifter
Contextual Info: Tommorrow’s Phase Noise Testing Today PN9000 AUTOMATED PHASE NOISE MEASUREMENT SYSTEM DELAY LINE OPTIONS DELAY LINE DELAY LINE TO RF 50Ω τ =100 INPUT TO LO 50Ω 50Ω TO DL INPUT 50Ω 50Ω φ 50Ω τ=20/140nS TO LO INPUT TO LO 0 dBm Min 50Ω 50Ω

PN9000

Abstract: PN9500 Introduction to Radar spectrum analyzer PN8000 Aeroflex PN9000 Application Note
Contextual Info: Application Note Aeroflex 3280 Series Spectrum Analyzers for Phase Noise Measurements This application note introduces the capabilities of the Aeroflex range of spectrum analyzers to easily and quickly characterize the phase noise behavior of a system under test.

PN9000

Abstract: Aeroflex PN9000 PN9650 PN9712 pn9000 Absolute Phase Noise Measurements programmable rf delay line Digitizing pn9000 PN9000 PN9000* Microwave detector diodes PN9560 PN9000 additive noise
Contextual Info: AUTOMATIC PHASE NOISE MEASUREMENT SYSTEM PN9000 Tomorrow’s Phase Noise Testing Today COMSTRON An Ideal Measurement System for: • RF and Microwave Devices Simple and Fast Measurements Complete Frequency Coverage • Absolute Phase Noise Measurements • Crystal Oscillators, Synthesizers, VCO’s, DRO’s etc.

PLL Synthesizer Modules

Contextual Info: M /A-CO M offers a wide range of surface mount V C O and syn­ thesizer modules to meet the frequency generation requirements of wireless systems design. The V C O modules incorporate a fundamental single ended oscillator design optimized for low phase noise

Contextual Info: Quality Radian Products RM-17 Portable Watthour Test System The RM-17 Portable Watthour Test System is the most accurate self-contained residential meter tester available. Unlike other residential meter testers, the RM-17 is not simply an electronic meter or a resistive load used as a

PCI-4474

Abstract: ni 4472 iepe Accelerometers PXI-4472 778415-01 iepe circuit SMB100 SMB110 778414 PXI-4472B
Contextual Info: 24-Bit, 102.4 kS/s, 8 and 4-Channel Dynamic Signal Acquisition NI 4472 Series, NI PCI-4474 Operating Systems • 24-bit resolution • 110 dB dynamic range • 102.4 kS/s maximum sampling rate • 45 kHz alias-free bandwidth • ±10 V range • AC/DC coupling

Contextual Info: Ultrafast Laser Systems 2014 Product Catalog Superior Reliability & Performance Ultrafast Laser Systems Introduction Applications: • Pump and Probe Studies • Time-domain Spectroscopy • Surface Sum Frequency Generation • EUV and X-ray Generation • Attosecond Pulse Generation

E4440A PSA Spectrum Analyzer

Abstract: N5244A 346C-K01 E4440 E8287D E8267D E7733A panel meter pm 435 E4446A N1912A
Contextual Info: Agilent’s Payload RF Test Solution System Overview New technology and instrument capabilities can provide significant improvements over current testers System Description Agilent’s Payload Test System Platform uses state of art measurement capability to provide customers

PM6665

Abstract: HP8563E of 8870 klystron FLUKE 112 HP-8563E
Contextual Info: Weinschel New Product-Preliminary Data Model 8870 0.01 to 18 GHz SIGNAL GENERATOR & ATTENUATOR CALIBRATION SYSTEM IEEE - 488 Custom Calibration System! Weinschel Corporation’s Model 8870 System and the SRCLab Windows software package provide the capability to perform the following measurements on a

amplitude demodulation matlab code

Contextual Info: Keysight M9290A CXA-m PXIe Signal Analyzer Product Fact Sheet Industries and Applications –– Military maintenance applications –– RF and microwave signal analysis up to 26.5 GHz –– Testing of components, devices, boards and systems –– Characterization of military and public-safety radios

APP2744

Abstract: AN274 lecroy
Contextual Info: Maxim > App Notes > High-speed interconnect Keywords: jitter, CLK generator, CLK synthesizer, clock jitter, cycle-to-cycle jitter, clock generators, synthesizers Sep 26, 2003 APPLICATION NOTE 2744 Jitter measurements for CLK generators or synthesizers Abstract: Clock CLK generators and synthesizers form the pulse of a complex digital system and errors in a clock's signal

PN9500

Abstract: PN9000 Digitizing pn9000 Aeroflex PN9000 phase detector 500 khz
Contextual Info: Phase Noise PN9500 Wideband noise and jitter analyzer The PN9500 is the only available system capable of measuring state of the art phase noise up to 500 MHz offset. The Modular design of the PN9500 issued from the PN9000 product line provides versatility and

Contextual Info: HP 8711B and HP 8713B RF Economy Scalar Network Analyzers Technical Specifications HP 8711B, 300 kHz to 1.3 GHz HP 8713B, 300 kHz to 3.0 GHz REFLECTION TRANSMISSION 2 Specifications Measurement Ports HP 8712B This table shows the residual HP 8712B and 8714B system

83496A

Abstract: 5989-9319EN testing of pll 83496B gpib Microsoft Excel 2007 vector generator Ghz 82357B PHASE LOCKED LOOP N4903A
Contextual Info: Agilent 86100CU-400 PLL and Jitter Spectrum Measurement Software Expect More from Your Test Equipment 86100CU-Option 400 for the 86100C Infiniium Digital Communication Analyzer DCA-J is an advanced software application that makes fast, accurate, and repeatable phase locked

Contextual Info: Agilent JS-1500 Clock/Data Jitter Solution In-depth jitter characterization of clock and data devices from 50 kHz to 20 GHz A fully integrated, turnkey solution The Agilent JS-1500 is a high-performance characterization and verification solution for testing electrical timing generators or timing recovery devices such as VCOs, clock multipliers

PXI-7813R

Abstract: CB-2180 PCI-4461 PCI-7813R PXI-4461 NI AUDIOMASTER TOSLINK bluetooth PXI-4462 CB-2181 PCI-4462
Contextual Info: Analog and Digital Audio Analyzer and Generator NI AudioMASTER for Analog and Digital Audio ◾◾ Comprehensive set of audio measurements using single and multiple tones, amplitude and frequency sweeps, and step response analysis ◾◾ Advanced limit testing capabilities

83496A

Contextual Info: Agilent 86100CU-400 Agilent 86100DU-400 PLL and Jitter Spectrum Measurement Software Expect More from Your Test Equipment Option 400 for the 86100 Series Infiniium Digital Communication Analyzer DCA-J or DCA-X is an advanced software application that makes fast,

"Step Recovery Diode"

Abstract: VSWR Bridge noise diode generator comb generator
Contextual Info: Testing Frequency Multipliers and Dividers Author: Adrian Jones Date: February 2000 Introduction Frequency multipliers and dividers are key components of modern radio frequency RF and microwave systems. They are generally used in signal generation and frequency synthesis

endevco accelerometer

Abstract: shakers laser doppler velocimetry motion DOPPLER nomograph shaker
Contextual Info: ENDEVCO ACCELEROMETER CALIBRATION WORKSHOP I. VIBRATION INTRODUCTION TO DYNAMIC MOTION Whole Body Motion vs Deformation Single Degree of Freedom System Free Vibration, Natural Frequency, Damping Forced Vibration, Resonance, Transmissibility Multiple Degrees of Freedom, Continuous Systems, Modal Analysis

Contextual Info: Agilent JS-500 Clock Jitter Solution In-depth jitter characterization of clocks from 50 kHz to 20 GHz A fully integrated, turnkey solution The Agilent JS-500 is a high-performance characterization and verification solution for testing electrical timing generators