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SN74ABT8374 Datasheets (1)

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Texas Instruments

Part	ECAD Model	Manufacturer	Description	Datasheet Type	PDF	PDF Size	Page count
SN74ABT8374		Texas Instruments	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS	Original	PDF	394.35KB	19

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SN54ABT8374 Abstract: shift register by using D flip-flop SN74ABT8374 Contextual Info: SN54ABT8374, SN74ABT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS486 – JULY 1994 • • • • CLK 1Q 2Q 3Q 4Q GND 5Q 6Q 7Q 8Q TDO TMS 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 OE 1D 2D 3D 4D 5D VCC 6D 7D	Original	SN54ABT8374, SN74ABT8374 SCBS486 SN54ABT8374 SN54ABT8374 SN74ABT8374 shift register by using D flip-flop	PDF

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SN54ABT8374

Abstract: shift register by using D flip-flop SN74ABT8374
Contextual Info: SN54ABT8374, SN74ABT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS486 – JULY 1994 • • • • CLK 1Q 2Q 3Q 4Q GND 5Q 6Q 7Q 8Q TDO TMS 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 OE 1D 2D 3D 4D 5D VCC 6D 7D

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SN54ABT8374, SN74ABT8374 SCBS486 SN54ABT8374 SN54ABT8374 SN74ABT8374 shift register by using D flip-flop

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