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2012 - ICS859S0212

Abstract: ICS859S0212I 859S0212BGILF S0212BIL
Text: x 5.0mm x 0.925mm package body G Package Top View SEL_OUT Pullup ICS859S0212BGI REVISION A , /Pulldown Resistor Test Conditions Minimum Typical 2 51 51 75 Maximum Units pF k k k ICS859S0212BGI , ] Low, High Normal Operation ICS859S0212BGI REVISION A JUNE 4, 2012 3 ©2012 Integrated Device , 2.625 76 5 Units V V mA mA ICS859S0212BGI REVISION A JUNE 4, 2012 ©2012 Integrated Device , VIH. NOTE 1: Outputs terminated with 50 to VCC ­ 2V. ICS859S0212BGI REVISION A JUNE 4, 2012 5


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2012 - Not Available

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Text: Pullup ICS859S0212BGI REVISION A JUNE 4, 2012 1 ©2012 Integrated Device Technology, Inc , RPullup/Pulldown Resistor 75 k ICS859S0212BGI REVISION A JUNE 4, 2012 Test Conditions 2 , ) ICS859S0212BGI REVISION A JUNE 4, 2012 3 Outputs Q[0:1], nQ[0:1] Low, High Normal Operation ©2012 , Power Supply Current 5 mA ICS859S0212BGI REVISION A JUNE 4, 2012 Test Conditions 4  , VCC – 2V. ICS859S0212BGI REVISION A JUNE 4, 2012 5 ©2012 Integrated Device Technology, Inc


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