C11200 Search Results

A5760

Abstract: C1808-03
Contextual Info: Picosecond Fluorescence Lifetime Measurement System C11200 Captures fluorescence phenomena with 5 ps temporal resolution using 2D photon counting method. Enables simultaneous fluorescence lifetime analysis and time-resolved spectrophotometry. Directly captures temporal variations of laser-excited

Contextual Info: GEC PLESSEY S I: M I (> IN D i; ( I ( K MA6561 High Speed 8 Bit Flash Analog-to-Digital Converter s (Preliminary Data) C11200FDS Issue 1.1 December 1990 Features Pin Out (Figure 1) • CMOS Silicon-on-Sapphire (LSB) DO [ 7 D1 C Z D2 E • 50MHz sample rate

Contextual Info: Standard optics A8110 series for the Picosecond fluorescence lifetime measurement system C11200 Including optics, base plate, sample holder and dewar unit *The A8110 used in combination with Sample holder for Organic chemistry sample A8114 Features Overview

C10627-01

Contextual Info: Picosecond Fluorescence Lifetime Measurement System C11200 Captures fluorescence phenomena with 5 ps temporal resolution using 2D photon counting method. Enables simultaneous fluorescence lifetime analysis and time-resolved spectrophotometry. Directly captures temporal variations of laser-excited

GEC Semiconductors

Contextual Info: GE C P L E S S E Y [SEMICONDUCTORS | _ PRELIMINARY INFORMATION C11200PDS-1.0 MA6561 HIGH SPEED 8-BIT FLASH ANALOG-TO-DIGITAL CONVERTER I CMOS Silicon-on Sapphire • 20MS/S sample rate ■ H ■ I H Low Input Capacitance 8-bit Tristate Data Output with Overflow Bit

A5760

Contextual Info: ピコ秒蛍光寿命測定装置 C11200 二次元フォトンカウンティング法により5 psの時間分解能で蛍光現象をとらえます。 蛍光寿命の解析と時間分解蛍光スペクトル測定が可能です。 Picosecond Fluorescence Lifetime Measurement System

Contextual Info: ピコ秒蛍光寿命測定装置 C11200用 標準光学系 A8110シリーズ 標準光学系/ベースプレート/ホルダ DNクライオスタット用､半導体ウェーハ用､有機化学試料用 /デュワユニット ※標準光学系 A8110とサンプルホルダ 有機化学試料用 A8114との組み合わせ例

U/25/20/TN26/15/850/C9920

Contextual Info: Absolute PL Quantum Yield Measurement System C9920-02,-02G,-03,-03G Absolute value of the photoluminescence quantum yield can be instantaneously measured for thin films, solutions, and powders. Absolute photo-luminescence quantum yield values as measured instantaneously for thin films, solutions and powders.

Contextual Info: 有機EL測定装置シリーズ 有機ELの材 料 開 発 からパ ネ ル 開 発まで さまざまな計測ニーズに応えます 。 浜 松ホトニクスで は、微 弱 光 測 光 、分 光 測 定 、光 学 測 定 、画 像 処 理 技 術 などを組 み 合 わ せ 、さま

U/25/20/TN26/15/850/C9920

Contextual Info: Absolute PL Quantum Yield Measurement System C9920-02,-02G,-03,-03G Absolute value of the photoluminescence quantum yield can be instantaneously measured for thin films, solutions, and powders. Absolute photo-luminescence quantum yield values as measured instantaneously for thin films, solutions and powders.

A11238

Contextual Info: 絶 対 P L量子 収 率 測 定 装 置 C9920-02-02G、-03、-03G 発光量子収率の絶対値を瞬時に測定。薄膜だけでなく溶液や粉末サンプルにも対応。 超高感度なCCDセンサによる多波長同時計測で瞬時に測定が可能

Contextual Info: 031 SERIES 032 SERIES Pari Number Page 031-0001-0001 031-0001-0003 031-0002-0001 031-0003-0001 031-0004-0001 031-0005-0001 031-0006-0001 031-0016-0001 031-0017-000’ 031-0018-0001 031-0019-0001 031-0020-0001 031-0021-0001 031-0024-000! 031-0032-0001 031-0033-0001