9701 SOIC Search Results

DD642

Contextual Info: RELIABILITY MONITOR PRODUCT MONITOR DATE DATE CODE ASSEMBLY FACILITY ASSEMBLY LOT NO PROCESS TYPE PACKAGE TYPE DS1669 Aug-97 9701 B3 OMEDATA DD642763AAC1 1.2µ OX/NI EEPROM 08 SOIC 208 STRESS/JOB NO. READPOINT Sample Size/No. of Fails Preconditioning (P/C):

LT1039

Contextual Info: RELIABILITY DATA LT1039 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP SIDEBRAZE PLASTIC DIP 516 8644 104 9701 136 8701 756 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SOIC/SOT/MSOP

LT1039

Contextual Info: RELIABILITY DATA LT1039 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP SIDEBRAZE PLASTIC DIP 516 8644 104 9701 136 8701 756 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SOIC/SOT/MSOP

LT1328

Abstract: LT1537 LT4351 9805
Contextual Info: RELIABILITY DATA LT1328 / LT1537 / LT4351 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SIDEBRAZE SOIC/SOT/MSOP 39 9636 205 9701 244 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP

9747

Abstract: LTC1473 LTC1479 R336
Contextual Info: RELIABILITY DATA LTC1473 / LTC1479 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE NEWEST DATE CODE SOIC/SOT/MSOP 50 9701 50 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SSOP/TSSOP 50 396 446

9805

Abstract: 9701 SOIC LT1328 LT1537 9531
Contextual Info: RELIABILITY DATA LT1328 / LT1537 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SIDEBRAZE SOIC/SOT/MSOP 39 9636 45 9701 84 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP 745 250 995

data sheet transistor 9747

Abstract: LTC1473 LTC1479 R336 7497
Contextual Info: RELIABILITY DATA LTC1473 / LTC1479 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 50 9701 50 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SSOP/TSSOP 50 346 396 • TEMP CYCLE FROM -65°C to +150°C

LT1124

Abstract: OP270 OP470 MSOP-9 op27
Contextual Info: RELIABILITY DATA LT1124 / 1125 / 1126 / 1127 / OP270 / OP470 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC PLASTIC DIP SOIC/SOT/MSOP 42 9101 80 9318 1,869 9207 228 9505 2,219 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH

LT1124

Abstract: OP270 OP470
Contextual Info: RELIABILITY DATA LT1124 / 1125 / 1126 / 1127 / OP270 / OP470 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC PLASTIC DIP SOIC/SOT/MSOP NEWEST DATE CODE 89 9101 80 9318 1,969 9207 459 9505 2,597 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH

P-20606

Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
Contextual Info: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97

m63044

Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
Contextual Info: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2

PLL52C59-14T

Abstract: PLL52C59
Contextual Info: PLL52C59-14T Sys tem Clock Gen er ator with In te grated Buff ers PIN INFORMATION FEATURES n Generates all clock frequencies for Pentium and CYRIX CPU. n Provides 4 copies of CPU clock, 6 copies of PCI clock, two system clocks, one 24Mhz and one 48Mhz clock.

LM119

Abstract: LM319 LT1123
Contextual Info: RELIABILITY DATA LM119 / LM319 / LT1123 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC HERMETIC PLASTIC DIP TO-92 1,058 8433 766 9109 1,934 8318 535 8411 630 8952 4,923 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH

H 9731

Abstract: 27.145Mhz remote control remote control car circuit diagram m1 series remote control toy car circuit diagram remote control car c945 REMOTE CONTROLLER toy car pc controlled car circuit diagram 27.145Mhz 27.145Mhz remote car remote control toy circuit diagram
Contextual Info: Data Sheet PT8A9701/9731 Duty Cycle Output Remote Controller |

toshiba tc 97101

Abstract: tc 97101 M7401 M73049 "256K x 16" SRAM PLCC M73002 M7206 M7-300 M72016 T 9722
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 3, 1997 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft QA Engineering Department Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT

MAX6809

Abstract: ST 9727 st 9635 st 9548 12x12 bga thermal resistance MAX232CWE 9846B MAX232 integrated chips 9836 maxim iso 9717
Contextual Info: November 1999 Surface-Mount Devices Reliability Report This report presents reliability data for Maxim’s surface-mount devices, including the results of extensive reliability stress tests performed solely on epoxy surface-mount packages since 1995. Maxim’s surface-mount packages are subjected to standard

74ACT11008pwle

Contextual Info: 74ACT11008 QUADRUPLE 2-INPUT POSITIVE-AND GATE SCAS013C – AUGUST 1987 – REVISED APRIL 1996 D D D, N, OR PW PACKAGE TOP VIEW Inputs Are TTL-Voltage Compatible Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise EPIC  (Enhanced-Performance Implanted

Contextual Info: SN54AC74, SN74AC74 DUAL POSITIVEĆEDGEĆTRIGGERED DĆTYPE FLIPĆFLOPS WITH CLEAR AND PRESET SCAS521F − AUGUST 1995 − REVISED OCTOBER 2003 D 2-V to 6-V VCC Operation D Inputs Accept Voltages to 6 V D Max tpd of 10 ns at 5 V SN54AC74 . . . J OR W PACKAGE

DS1868

Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
Contextual Info: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1

H9723

Abstract: h9740 l9718 L9712 L9709 L9727 T9934 l9731 L9706 l9735
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS April 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT April 1998 TABLE OF CONTENTS Section I: Introduction Section II:

97A8

Abstract: cable tv amplifier MAX496 MAX496CPE MAX496CSE MAX497
Contextual Info: 19-0373; Rev 1; 12/98 L MANUA ION KIT HEET T A U L EVA TA S WS DA FOLLO 375MHz Quad Closed-Loop Video Buffers, AV = +1 and +2 _Features The MAX496 and MAX497 are quad, closed-loop, ±5V video buffers that feature extremely high bandwidth and

H9723

Abstract: h9740 L9727 H9703 PJ 966 IV L9718 L9726 IC L9712 K961 L9712
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1998 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 QUALITY & RELIABILITY MONITOR REPORT July 1998 TABLE OF CONTENTS Section I: Introduction Section II:

MAX496

Abstract: MAX496CPE MAX496CSE MAX497 97A8
Contextual Info: 19-0373; Rev 1; 12/98 L MANUA ION KIT HEET T A U L EVA TA S WS DA FOLLO 375MHz Quad Closed-Loop Video Buffers, AV = +1 and +2 _Features The MAX496 and MAX497 are quad, closed-loop, ±5V video buffers that feature extremely high bandwidth and

ST 9427

Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Contextual Info: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and