9639 MAX Search Results

9638

Abstract: ir 9637 M 9639 521-9639 a 9639 ma 9639 led high brightness 9639 max
Contextual Info: 3mm Discrete LED High Brightness Tinted, Non-Diffused 4.45 [.175] 1.02 [.040] 3.30 [.130] 25.40 [1.00] MIN Dialight 521-9637, -9638, -9639 PART NO. 521-9637 521-9638 521-9639 1.02 [.040] MIN ANODE: -9636-16, -9637-16 CATHODE: -9638-16, -9639-16, & -9650-16

M 9639

Abstract: 9638
Contextual Info: 3mm Discrete LED High Brightness Tinted, Non-Diffused Dia light 521-9637, -9638, -9639 PART NO. 521-9637 521-9638 521-9639 Zìi & COLOR Red Green Yellow MOUNTING CLIP: 515-0006 located on page 4-65 Dimensions in mm [inches] Red Green Yellow -9637 -9638 -9639

m63044

Abstract: m64076 M64026 m7108 M64073 M63062 M64021 M71081 M63006 M71064
Contextual Info: RELIABILITY MONITOR SUMMARY QUARTERLY SUMMARY, QUARTER 1, 1997 April 17, 1997 PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION. CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY STANDARD STRESS TEST DESCRIPTIONS Test HTOL HTOL2

lem 25-p

Abstract: lem hy 10-p 20-P 25-P HY 20
Contextual Info: Current Transducers HY 5 to 25-P For the electronic measurement of currents : DC, AC, pulsed, mixed, with a galvanic isolation between the primary circuit high power and the secondary circuit (electronic circuit). IPN = 5 . 25 A Electrical data Primary nominal

M63064

Abstract: M63041 M63002 M63080 CY7C964-NC m63032 M63058 M63065 M63069 M63057
Contextual Info: RELIABILITY MONITOR SUMMARY Description of Data Table Column Headings AAA AAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA AAAAAAAA

MAX785

Abstract: st 9635 DG302 to220 MAX232CPE MAX232 integrated chips IC 9637 MAX333 equivalent max232 MTBF calculation MAX232 mtbf st 9548
Contextual Info: December 1997 RR-1K Product Reliability Report This report presents the product reliability data for Maxim’s analog products. The data was acquired from extensive reliability stress testing performed in 1996. It is separated into seven fabrication processes: 1 Standard

IC 9637

Abstract: A101 A102 A104 A106 A110 11256E pqfp100 71124X IDT QUALITY & RELIABILITY MONITOR REPORT
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS

lem hy 10-p

Abstract: 20-P 25-P HY-5
Contextual Info: Current Transducers HY 5.25-P IPN = 5 . 25 A For the electronic measurement of currents : DC, AC, pulsed, mixed, with a galvanic isolation between the primary circuit high power and the secondary circuit (electronic circuit). Electrical data Primary nominal

H9549

Abstract: h9627 79r3081 memory 9652 7015X Y9709 H9541 h961 MQUAD report on PLCC
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS

A101

Abstract: A102 A104 A106 A110 TQFP-64 PACKAGE thermal resistance 7025X quality and reliability report IDT QUALITY & RELIABILITY MONITOR REPORT
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS

D3512

Abstract: 980140
Contextual Info: SAW Bandpass Filter 251909B 1. Features z IF Bandpass Filter z High Attenuation z Single-Ended Operation z DIP Package z Maximum Storage Temperature Range : -40℃ ~ 85℃ z Electrostatics Sensitive Device ESD Package : D3512 2.5±0.2 25.4±0.2 7.6±0.2

PM108

Abstract: PM-108 PP 50.100
Contextual Info: v •1 QPSK MODULATORS MODELS PM-108/109/110 50-100 MHz Variety of Drivers: PM-108; Current, PM-109; ECL, PM-110; TTL Hermetic Module 2.5° Phase Deviation Guaranteed Specifications* From -5 5 °C to +85°C Frequency Range Insertion Loss VSWR Input Output

A101

Abstract: A102 A104 A106 A110 IDT QUALITY & RELIABILITY MONITOR REPORT
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS

H9549

Abstract: X9642 h954 A101 A102 A104 A106 A110 SBGA-272 h9610
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS

report on PLCC- II

Abstract: PLCC-52 TQFP-64 A101 A102 A104 A106 A110 ase korea on semiconductor 7132-S
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS

c9013

Abstract: 84 pin PBGA oscilloscope MTBF TSMC retention memory dc 8069 IS61C1024 IC Data-book Q-16 car radio 14x20 TSOP 8638
Contextual Info: ISSI Integrated Silicon Solution, Inc. Quality and Reliability 1997-1998 An ISO 9001 Company ISSI ® Quality System Manual QUALITY Reliabilty Report 1997-1998 RELIABILITY Integrated Silicon Solution, Inc. An ISO 9001 Company 1997 Integrated Silicon Solution, Inc.

Contextual Info: UA9639C DUAL DIFFERENTIAL LINE RECEIVER D 3 0 0 9 , OCTOBER 1 9 8 6 Meets EIA Standards RS-422-A and RS-423-A D . JG , OR P P A C K A G E T O P V IE W Meets Federal Standards 1020 and 1030 V CC C 1 OUT C 20U T C Operates from Single 5-V Power Supply Wide Common-Mode Voltage Range

BC 148 TRANSISTOR PIN CONFIGURATION

Abstract: diagram for test ic 8873 BYW52 U2403B symbol of Bc 148 transistor telefunken stm transistor Bc 540 pin
Contextual Info: U2403B TELEFUNKEN Semiconductors Charge Timer Description The monolithic integrated bipolar circuit U2403B is a time controlled constant current charger. Selection of charge current versus timing is according to external components at pins 2, 3 and 4. For high current

telefunken stm

Abstract: TRANSISTOR BC 136 4 pin TACT SWITCH TACT Switch with LED U2403B 1n4148 v4 NTC 6,8K 1N4148 BC 1098 BD135
Contextual Info: U2403B Charge Timer Description The U2403B is a monolithic, integrated-bipolar circuit which can be used in applications for time-controlled, constant-current charge. Selection of charge current versus timing is carried out by using the external circuit at Pins 2, 3 and 4. For high current requirement, an

transistor BD 240

Contextual Info: U2403B Charge Timer Description The U2403B is a monolithic, integrated-bipolar circuit which can be used in applications for time-controlled, constant-current charge. Selection of charge current versus timing is carried out by using the external circuit at Pins 2, 3 and 4. For high current requirement, an

CY62256LL-PC

Abstract: VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113
Contextual Info: Cypress Semiconductor Product Reliability 1997 Published June, 1997 CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM. 1 2.0 ELECTRICAL AVERAGE OUTGOING QUALITY. 2

A101

Abstract: A102 A104 A106 A110 P-DIP-18 PLCC-32 TQFP-64 9626 pot
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS July 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS

VIC068A-BC

Abstract: M71079 M7108 CY62256-VC m71070 LOGIC-R31 M72051 m7101 M72038 VIC068A-AC
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1997 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Marc Hartranft QA Engineering Department Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT

7206Y

Abstract: A101 A102 A104 A106 A110 9616P
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS January 1997 IDT QUALITY SERVICE QSP PERFORMANCE 2975 Stender Way, Santa Clara, CA 95054 TEL: 800 345-7015 FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS