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    74BCT8244A Search Results

    74BCT8244A Result Highlights (1)

    Part ECAD Model Manufacturer Description Download Buy
    SN74BCT8244ADW
    		Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 Visit Texas Instruments Buy
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    74BCT8244A Price and Stock

    Texas Instruments

    Texas Instruments SN74BCT8244ADW

    Specialty Function Logic Device w/Octal Buffe rs
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    Mouser Electronics SN74BCT8244ADW 825
    • 1 $20.71
    • 10 $16.41
    • 100 $14.15
    • 1000 $13.26
    • 10000 $13.26
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    Bristol Electronics SN74BCT8244ADW 2,463
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    Rochester Electronics SN74BCT8244ADW 47 1
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    • 100 $11.63
    • 1000 $10.40
    • 10000 $9.79
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    TME SN74BCT8244ADW 25
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    • 100 $14.50
    • 1000 $14.50
    • 10000 $14.50
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    Vyrian SN74BCT8244ADW 9,026
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    Texas Instruments SN74BCT8244ADWR

    Scan Test Device
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    Bristol Electronics SN74BCT8244ADWR 2,461
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    Rochester Electronics SN74BCT8244ADWR 2,000 1
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    • 100 $4.63
    • 1000 $4.14
    • 10000 $3.90
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    Texas Instruments SN74BCT8244ANT

    Boundary Scan Bus Driver, BCT/FBT Series, 2-Func, 4-Bit, True Output, BICMOS, PDIP24
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    Rochester Electronics SN74BCT8244ANT 6,630 1
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    • 100 $5.22
    • 1000 $4.67
    • 10000 $4.39
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    Texas Instruments 74BCT8244ADWR

    Specialized Function Logic Scan Test Device with Buffers 5.5V 8 Bits 24-SOIC T/R
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    ComSIT USA 74BCT8244ADWR 1,842
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    Texas Instruments SN74BCT8244ANTG4

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    Vyrian SN74BCT8244ANTG4 9,293
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    74BCT8244A Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    BCT8244A

    Abstract: SN54BCT8244A SN74BCT8244A
    Contextual Info: SN54BCT8244A, 74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 SN 54BCT8244A . . . JT PACKAGE SN 74BCT8244A . . . DW OR NT PACKAGE TOP VIEW Members of the Texas Instruments SCOPE Family of Testability Products


    OCR Scan     		SN54BCT8244A, SN74BCT8244A SCBS042D SN54/74F244 SN54/74BCT244 BCT8244A SN54BCT8244A PDF

    SN54BCT8244A

    Abstract: SN74BCT8244A
    Contextual Info: SN54BCT8244A, 74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­


    OCR Scan     		SN54BCT8244A, SN74BCT8244A SCBS042D SN54/74F244 SN54/74BCT244 752S5 SN54BCT8244A PDF