4-BIT BIDIRECTIONAL SHIFT REGISTER 74 194 Search Results

257975

Abstract: 257975,BOSE NT7066U COM16 NT7063B NT7065B 40S39 COM1-COM16 28.6000 neotec
Contextual Info: NT7063B NEOTEC SEMICONDUCTOR LTD. LCD Driver IC INTRODUCTION The NT7063B is a LCD driver LSI which is fabricated by low power CMOS technology. Basically this LSI consists of 40 x 2 bit bidrectional shift register, 40 x 2 bit data latch and 40 x 2 bit LCD driver refer to Fig 1 . This LSI can be used

SED1670

Abstract: SED1531 SED1606D SED1640D SED1670D0A SED1670D0B SED1670D1A SED1670D1B SED1670T0A 100-6 V4
Contextual Info: PF836-02 SED1670 SED1670 Dot Matrix High Duty LCD Driver ● 100 Output ● 1/64 to 1/300 in display duty ● CMOS High Voltage Resistant Process • OVERVIEW The SED1670 is a 100 output low-power resistance common row driver which is suitable for driving a very high

SED1531

Abstract: SED1606D SED1640D SED1670 SED1670D0A SED1670D0B SED1670D1A SED1670D1B SED1670T0A 100-6 V4
Contextual Info: PF836-02 SED1670 Dot Matrix High Duty LCD Driver ● 100 Output ● 1/64 to 1/300 in display duty ● CMOS High Voltage Resistant Process • OVERVIEW The SED1670 is a 100 output low-power resistance common row driver which is suitable for driving a very high

SED1190F

Abstract: led 5*7 dotmatrix led driver 8*8 led dot MATRIX Driver SED1200F yd 803 dfr 1601 LCD 1601 display SED1181F SED1610F seiko sed lcd
Contextual Info: MF425-04 s ie r e S rs e 0 riv D 6 D 1 C D E L lM a nic ch Te al S SEIKO EPSON CORPORATION u an NOTICE No part of this material may be reproduced or duplicated in any form or by any means without the written permission of Seiko Epson. Seiko Epson reserves the right to make changes to this material

lattice 1996

Contextual Info: Specifications ispLSI and pLSI 6192 ® ispLSI and pLSI 6192 High Density Programmable Logic with Dedicated Memory and Register/Counter Modules — 96 I/O Pins with Input Registers — Security Cell Prevents Unauthorized Design Copying Features • A FAMILY OF HIGHLY INTEGRATED, CELL-BASED,

Contextual Info: ispLSI 6192 High Density Programmable Logic with Dedicated Memory and Register/Counter Modules — 96 I/O Pins with Input Registers — Security Cell Prevents Unauthorized Design Copying Features • A FAMILY OF HIGHLY INTEGRATED, CELL-BASED, PROGRAMMABLE LOGIC DEVICES CONSISTING OF:

TAA141

Abstract: TAA 141
Contextual Info: Specifications ispLSI 6192 ispLSI 6192 High Density Programmable Logic with Dedicated Memory and Register/Counter Modules — 96 I/O Pins with Input Registers — Security Cell Prevents Unauthorized Design Copying Features • A FAMILY OF HIGHLY INTEGRATED, CELL-BASED,

TAA 141

Abstract: TAA141 6192F SEL02
Contextual Info: ispLSI 6192 High Density Programmable Logic with Dedicated Memory and Register/Counter Modules — 96 I/O Pins with Input Registers — Security Cell Prevents Unauthorized Design Copying Features • A FAMILY OF HIGHLY INTEGRATED, CELL-BASED, PROGRAMMABLE LOGIC DEVICES CONSISTING OF:

BEL 187 PIN DIAGRAM

Abstract: bc 147 equivalent bc 148 equivalent pin diagram of bc 187 MPC509 BEL 187 equivalent Bel 188 ct diagram motorola mpc509
Contextual Info: SECTION 9 IEEE 1149.1-COMPLIANT INTERFACE The MPC509 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development

g92.ctl

Abstract: G150 G151 G200 G203 G204 MPC823
Contextual Info: SECTION 21 IEEE 1149.1 TEST ACCESS PORT The MPC823 provides a dedicated user-accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led tothe

yd 803

Abstract: SEG NC3 Bidirectional shift registor S1D16702F SED1606D0A SED1606D0B SED1606F0A SED1640D0B S1D16702 SED1672F
Contextual Info: MF425-05 S1D16000 Series Technical Manual IEEE1394 LCD DRIVERS Controller S1R76801F00A S1D16000 Series Technical Manual S1D16000 Series Technical Manual ELECTRONIC DEVICES MARKETING DIVISION EPSON Electronic Devices Website http://www.epson.co.jp/device/ This manual was made with recycle paper,

Contextual Info: Features • High-performance, Low-power AVR 8-bit Microcontroller • RISC Architecture • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation – Up to 16 MIPS Throughput at 16 MHz

ATAR862-8

Abstract: BP23 SSO24 nte cross reference Transistor LM 7812 SC 2272 transmitter
Contextual Info: Features • • • • • • • • Single Package Fully-integrated ROM Mask 4-bit Microcontroller with RF Transmitter Low Power Consumption in Sleep Mode < 1 µA Typically Maximum Output Power with Low Supply Current 2.0V to 4.0V Operation Voltage for Single Li-cell Power Supply

ATAM862

Abstract: ATAM862-8 BP23 SSO24 13.5672
Contextual Info: Features • • • • • • • • Single Package Fully-integrated 4-bit Microcontroller with RF Transmitter Low Power Consumption in Sleep Mode < 1 µA Typically Flash Controller for Application Program Available Maximum Output Power with Low Supply Current

13.5672

Abstract: ATAR862-8 BP23 SSO24
Contextual Info: Features • • • • • • • • Single Package Fully-integrated ROM Mask 4-bit Microcontroller with RF Transmitter Low Power Consumption in Sleep Mode < 1 µA Typically Maximum Output Power (10 dBm) with Low Supply Current (9.5 mA Typically) 2.0 V to 4.0 V Operation Voltage for Single Li-cell Power Supply

SC 2272

Contextual Info: Features • • • • • • • • Single Package Fully-integrated 4-bit Microcontroller with RF Transmitter Low Power Consumption in Sleep Mode < 1 µA Typically Flash Controller for Application Program Available Maximum Output Power (10 dBm) with Low Supply Current (9.5 mA Typically)

Contextual Info: Features • • • • • • • • Single Package Fully-integrated ROM Mask 4-bit Microcontroller with RF Transmitter Low Power Consumption in Sleep Mode < 1 µA Typically Maximum Output Power with Low Supply Current 2.0V to 4.0V Operation Voltage for Single Li-cell Power Supply

MPC555

Abstract: G427
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development

G545

Abstract: MPC555 g545 b2 G306 G340 G409 G335 g307.ctl
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 / MPC556 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to

G337

Abstract: g545 MPC556 G409 MPC555 g229 G-403-C G-309-C G-405-C g307.ctl
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 / MPC556 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to

G545

Abstract: g545 b2 MPC555 G409C 74 164 14 PIN DIAGRAM g307.ctl 74HC7541DB G404 g408 chip g408.ctl
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture . Problems associated with testing high-density circuit boards have led to development

tqfp208

Abstract: BC 227 jtag 14 S 1149 212 MCF5307
Contextual Info: SECTION 17 IEEE 1149.1 TEST ACCESS PORT JTAG The MCF5307 includes dedicated user-accessible test logic that is fully compliant with the IEEE standard 1149.1 Standard Test Access Port and Boundary Scan Architecture. Use the following description in conjunction with the supporting IEEE document listed above. This

G150C

Abstract: G150 G200 G203 G204 MPC821 g80.ctl g84c
Contextual Info: SECTION 20 IEEE 1149.1 TEST ACCESS PORT The MPC821 provides a dedicated user—accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to

MPC860 jtag

Abstract: tms 1943 G150 G200 G203 G204 MPC860 MPC860 equivalent g80.ctl G100C
Contextual Info: SECTION 19 IEEE 1149.1 TEST ACCESS PORT The MPC860 provides a dedicated user—accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to