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Contextual Info: E-Frame Series Test & Development Platform FEATURES • Modular test & development platform • Versions supporting 3U or 6U cards • Architectures include CompactPCI, VME/64x, VPX, and VXS • Front accessible test points and monitoring LEDs for +3.3V, +/-5V, +/- 12V, +/- 24V, and +/- 48VDC |
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VME/64x, 48VDC VME64x 39E12LLXC8Y2VCMX 12-slot 39E12OPXC8Y2VCMX VME64x |