28JAN05 Search Results

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT - RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. LOC DIST G ALL RIGHTS RESERVED. REVISIONS 14 LTR DESCRIPTION REV PER 0G3A—083 2 —04 DATE DWN APVD 28JAN05 JR TM D D BODY U WIRE RANGE v i^ F IL E 1 6 - 1 4 AWG

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. - LOC DIST G ALL RIGHTS RESERVED. R E V IS IO N S 14 LTR DESCRIPTION REV PER 0G 3A—0 8 3 2 —0 4 DATE DWN APVD 28JAN05 JR TM D D U WIRE RANGE v i^ F IL E

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT - RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. DIST LOC G ALL RIGHTS RESERVED. R E V IS IO N S 14 LTR M DESCRIPTION DWN DATE REV PER 0G3A—083 2 —04 APVD JR TM 28JAN05 D D U WIRE RANGE BODY ±0.1 3 -

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. - DIST LOC G ALL RIGHTS RESERVED. R E V IS IO N S 14 LTR DESCRIPTION N BODY D REV PER 0G3A— 0832— 04 -] APVD JR TM 28JAN05 D 3 .5 6 0.1 3 1 4-0 + . 0 0 5

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. - LOC DIST G ALL RIGHTS RESERVED. R E V IS IO N S 14 LTR K DESCRIPTION REV PER 0G 3A—0 8 3 2 —0 4 DATE DWN APVD 28JAN05 JR TM D D U WIRE RANGE v i^ F IL E

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT - RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. LOC ALL RIGHTS RESERVED. DIST R E V IS IO N S 14 G LTR DESCRIPTION H REV PER 0G 3A —0 8 3 2 —0 4 DATE DWN APVD 28JAN05 JR TM D D U WIRE RANGE v i^ F IL E

B545

Abstract: E13288 LR7189
Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT - RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. DIST LOC G ALL RIGHTS RESERVED. R E V IS IO N S 14 LTR DESCRIPTION L DWN DATE REV PER 0G3A—083 2 —04 28JAN05 APVD JR TM D D U WIRE RANGE BODY A\ 7.1 4

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT - RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. LOC ALL RIGHTS RESERVED. G DIST R E V IS IO N S 14 LTR DESCRIPTION REV PER 0G3A—083 2 —04 DATE DWN APVD 28JAN05 JR TM D D BODY WIRE RANGE 27 [ .1 6 8 ] MIN DIA

Contextual Info: 7 THIS DRAWING IS UNPUBLISHED. COPYRIGHT - 6 5 4 2 3 RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. ALL RIGHTS RESERVED. REVISIONS LOC DIST AD 00 LTR H NNECTOR A AMPLARY LOA CONTAC DESCRIPTION REV PER EC 0 5 1 2 - 0 3 0 3 - 0 5 DATE DWN APVD 05APR06

Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,199 Equivalent Device Hours 166,604,213 Number of Total Failures Failure Rate in FIT 5.462 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability Vishay Siliconix P-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 820 Equivalent Device Hours 187,681,426 Number of Total Failures Failure Rate in FIT 4.849 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 22,058 Equivalent Device Hours 4,885,975,702 Number of Total Failures Failure Rate in FIT 0.186 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 48,189 Equivalent Device Hours 11,102,134,982 Number of Total Failures Failure Rate in FIT 0.082 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: Silicon Technology Reliability Vishay Siliconix N-CHANNEL ACCELERATED OPERATING LIFE TEST RESULT Sample Size 76,573 Equivalent Device Hours 14,239,876,296 Number of Total Failures Failure Rate in FIT 0.064 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

4425b

Abstract: V30114-T1 vishay siliconix code marking to-220 marking code 20L sot-23 sot23 to252 footprint wave soldering siliconix an808
Contextual Info: Si4421DY New Product Vishay Siliconix P-Channel 20-V D-S MOSFET FEATURES PRODUCT SUMMARY VDS (V) - 20 rDS(on) (W) ID (A) 0.00875 @ VGS = - 4.5 V - 14 0.01075 @ VGS = - 2.5 V - 12 0.0135 @ VGS = - 1.8 V - 11 D TrenchFETr Power MOSFET APPLICATIONS D Game Station

SOT-563 SOT-666

Abstract: marking 802 soic8 sot-563 MOSFET D1 20l sot-23 siliconix MARKING CODE mSOp-8 siliconix code marking to-220 marking code 20L sot-23 sot23 V30114-T1
Contextual Info: Si1024X Vishay Siliconix Dual N-Channel 20-V D-S MOSFET PRODUCT SUMMARY VDS (V) 20 rDS(on) (W) ID (mA) 0.70 @ VGS = 4.5 V 600 0.85 @ VGS = 2.5 V 500 1.25 @ VGS = 1.8 V 350 FEATURES D D D D D D D BENEFITS Very Small Footprint High-Side Switching Low On-Resistance: 0.7 W

EIA-364-8

Abstract: EIA-364-6 receiving inspection procedure EIA-364-28 EIA-364-18 EIA-364-26 EIA-364-32 MIL-W-22759 EIA-364-26 condition b
Contextual Info: Product Specification 108-2193 22Mar07 Rev B STRAO-THERM* Un-Insulated, No-Insulation Support, Heat Resistant Terminals 1. SCOPE 1.1. Content This specification covers performance, tests and quality requirements for nickel plated STRATO-THERM* un-insulated, no-insulation support, heat resistant terminals. Terminals covered by

Contextual Info: 7 THIS DRAWING IS UNPUBLISHED. COPYRIGHT - 6 5 4 2 3 RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. ALL RIGHTS RESERVED. REVISIONS LOC DIST AD 00 LTR B NNECTOR A AMPLARY LOA CONTAC DESCRIPTION REV PER EC 0 5 1 2 - 0 3 0 3 - 0 5 DATE DWN APVD 05APR06

ZZ22

Contextual Info: 7 8 THIS DRAWING IS UNPUBLISHED. COPYRIGHT - RELEASED FOR PUBLICATION BY TYCO ELECTRONIC5 CORPORATION. LOC ALL RIGHTS RESERVED. AD REVISIONS DIST 00 LTR DESCRIPTION DATE EC 0G3C 0218 05 IA APVD BSV JLG FOR 3 POSITION ONLY .215 WIDE . STANDOFFS: UP TO 9 P0S-(2 REQD) ON THE OUTSIDE ENDS OF THE HOUSING

Contextual Info: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 22,912 Equivalent Device Hours 6,455,317,008 Number of Total Failures Failure Rate in FIT 0.141 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT RELEASED FOR PUBLICATION ALL RIGHTS RESERVED. BY TYCO ELECTRONICS CORPORATION. SUGGESTED MATING S H O U L D E R MAY BE F NO T F E A S IB L E D LOC DIST AF 50 R E V IS IO N S LTR AE TAB E LIM IN A TE D D IM E N S IO N S

Contextual Info: THIS DRAWING IS UNPUBLISHED. COPYRIGHT - RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. DIST LOC G ALL RIGHTS RESERVED. R E V IS IO N S 14 LTR K DESCRIPTION REV PER 0G3A—083 2 —04 U WIRE RANGE BODY ±0.1 3 - /l\ 6.20 [ .2 4 4 ] 2. SEE

4-146257-0

Contextual Info: 7 8 THIS DRAWING IS UNPUBLISHED. COPYRIGHT RELEASED FOR PUBLICATION ALL RIGHTS RESERVED. - BY TYCO ELECTRONIC5 CORPORATION. 1 . ASSEMBLY MAY BE BROKEN TO THE DESIRED NUMBER OF POSITIONS 2. TRUE POSITION TOLERANCE OF THE POST TIPS APPLIES WHEN THE HEADER IS HELD FLAT AGAINST THE PRINTED CIRCUIT BOARD

Contextual Info: 7 THIS DRAWING IS UNPUBLISHED. COPYRIGHT - 5 6 RELEASED FOR PUBLICATION BY TYCO ELECTRONICS CORPORATION. ALL RIGHTS RESERVED. 1 . ASSEMBLY MAY BE BROKEN TO THE DESIRED NUMBER OF POSITIONS 2. TRUE POSITION TOLERANCE OF THE POST TIPS APPLIES WHEN THE HEADER