|
7UL2T125FK
|
|
Toshiba Electronic Devices & Storage Corporation
|
One-Gate Logic(L-MOS), Buffer, SOT-765 (US8), -40 to 85 degC |
|
|
|
7UL2T126FK
|
|
Toshiba Electronic Devices & Storage Corporation
|
One-Gate Logic(L-MOS), Buffer, SOT-765 (US8), -40 to 85 degC |
|
|
|
7UL1G07FU
|
|
Toshiba Electronic Devices & Storage Corporation
|
One-Gate Logic(L-MOS), Non-Inverter Buffer (Open Drain), USV, -40 to 85 degC |
|
|
|
5962-9174601Q3A
|
|
Texas Instruments
|
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125 |
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|
|
5962-9174601QLA
|
|
Texas Instruments
|
Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 |
|
|
|
SN74LS670NSR
|
|
Texas Instruments
|
4-by-4 register files with 3-state outputs 16-SO 0 to 70 |
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