0007I Search Results
0007I Price and Stock
Tripp Lite U360-007-INDUSB 3 CHARGING HUB 7-PORT X USB |
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Tripp Lite U360-007-INT7-PORT USB-A MINI HUB - USB 3.2 |
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Eaton Corporation 470-0007-ITMotor Drives ITDN012 |
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Netpatibles AT10007-ID-R-NPGBE SFP 1000BASELH 70KM 1550NM |
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Hioki USA PQ3100-04/6000-7IN KITHioki PQ3100-04/6000-7in KIT Power Quality Analyzer Kit, 6000A Clamp(4), 7", w/Case, PQ3000 Series |
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PQ3100-04/6000-7IN KIT |
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0007I Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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B272Contextual Info: ispLSI 3192 High Density Programmable Logic Features Functional Block Diagram • HIGH-DENSITY PROGRAMMABLE LOGIC — 192 I/O Pins — 9000 PLD Gates — 384 Registers — High Speed Global Interconnect — Wide Input Gating for Fast Counters, State Machines, Address Decoders, etc. |
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Faste14 3192-100LM 240-Pin 3192-100LB272 272-Ball 3192-70LM 3192-70LB272 3192-70LMI B272 | |
Contextual Info: MITSUBISHI MICROCOMPUTERS 3886 Group 4\P so'"®9 S IN G L E -C H IP 8 -B IT C M O S M IC R O C O M P U T E R F LA S H M E M O R Y V E R S IO N DESCRIPTION • Power dissipation The 3886 group is the 8-bit m icrocom puter based on the 740 fa m In high-speed m ode . 40 mW |
OCR Scan |
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Contextual Info: ispLSI 3256 High Density Programmable Logic Functional Block Diagram A1 OR Array A2 A3 B1 B2 B3 N C0 C1 C2 R D Q F1 Twin GLB F0 D Q E3 D Q E2 D Q E1 Global Routing Pool E0 C3 Output Routing Pool • 100% IEEE 1149.1 BOUNDARY SCAN COMPATIBLE F2 D Q Array |
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160-MQFP/3256 0212Aisp/3256 3256-70LM 160-Pin 3256-50LM 041A-08isp/3256 | |
PLSI 1016-60LJ
Abstract: PAL 007 pioneer pal16r8 programming algorithm PAL 008 pioneer lattice 1016-60LJ ISP Engineering Kit - Model 100 PLSI-2064-80LJ GAL16v8 programmer schematic GAL programming Guide ispLSI 2064-80LT
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1016E 1032E 20ters 48-Pin 304-Pin PLSI 1016-60LJ PAL 007 pioneer pal16r8 programming algorithm PAL 008 pioneer lattice 1016-60LJ ISP Engineering Kit - Model 100 PLSI-2064-80LJ GAL16v8 programmer schematic GAL programming Guide ispLSI 2064-80LT | |
3256EContextual Info: ispLSI 3256E High Density Programmable Logic Functional Block Diagram G3 H0 A0 A1 OR Array A2 A3 ORP ORP • IN-SYSTEM PROGRAMMABLE — 5V In-System Programmable ISP using Lattice ISP or Boundary Scan Test (IEEE 1149.1) Protocol — Increased Manufacturing Yields, Reduced Time-toMarket, and Improved Product Quality |
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3256E 3256E | |
IC 7481 pin configurationContextual Info: MITSUBISHI MICROCOMPUTERS 7480/7481 GROUP .•;• « •:*. ••:•; ^ H P '* * 'i.' * « > * SINGLE-CHIP 8-BIT CMOS MICROCOMPUTER DESCRIPTION PIN CONFIGURATION The 7480/7481 group is the single-chip microcomputer adopting the silicon gate CMOS process. In addition to its simple instruction |
OCR Scan |
16/SCLK^ KI-9711 GD37fi7fi IC 7481 pin configuration | |
lattice 1996Contextual Info: ispLSI and pLSI 2128 ® High-Density Programmable Logic Functional Block Diagram Output Routing Pool ORP Output Routing Pool (ORP) D7 D3 D5 fmax = 100 MHz Maximum Operating Frequency tpd = 10 ns Propagation Delay TTL Compatible Inputs and Outputs Electrically Erasable and Reprogrammable |
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Contextual Info: ispLSI 3256E In-System Programmable High Density PLD Functional Block Diagram G3 H0 A0 A1 OR Array A2 A3 ORP ORP • IN-SYSTEM PROGRAMMABLE — 5V In-System Programmable ISP using Lattice ISP or Boundary Scan Test (IEEE 1149.1) Protocol — Increased Manufacturing Yields, Reduced Time-toMarket, and Improved Product Quality |
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3256E 0212/3256E 3256E-100LM 3256E-100LB320 3256E-70LM 3256E-70LB320 304-Pin 320-Ball | |
3256EContextual Info: ispLSI 3256E In-System Programmable High Density PLD Functional Block Diagram G3 H0 A0 A1 OR Array A2 A3 ORP ORP • IN-SYSTEM PROGRAMMABLE — 5V In-System Programmable ISP using Lattice ISP or Boundary Scan Test (IEEE 1149.1) Protocol — Increased Manufacturing Yields, Reduced Time-toMarket, and Improved Product Quality |
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3256E 0212/3256E 3256E-100LM 304-Pin 3256E-100LB320 320-Ball 3256E-70LM 3256E | |
Contextual Info: Lattice T'Aie Lattice ispLSI and pLSI 2000 Family ï i I Corporation Features_ J Introduction to ispLSI and pLSI 2000 Family ispLSI and pLSI 2000 Family □ 154 M Hz System Perform ance □ 5.5 ns Pin-to-Pin Delay □ High Density 1,000-6,000 PLD Gates |
OCR Scan |
160-Pin 0212-80Bisp/2128 00413A 2128-100LM 2128-80LM | |
3192-100LM
Abstract: LSC 132 16*1 3192-70LMI
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Contextual Info: C-Grid m o l e x 2.54mm .10 0 " Pitch C-Grid III Kinked Pin Header FEATURES AND SPECIFICATIONS Features and Benefits • Sizes 1 to 40 circuits Voltage: 350V ■ Easy breakaway to smaller sizes Current: 3 .0 A J ■ Contact and plating orientation according to DIN 4 16 5 1 |
OCR Scan |
PS-99020-00 160fx 0007im | |
marking P5t
Abstract: m38022e4sp "SERIES MELPS 740" SERIES MELPS 740 USERS MANUAL transistor da 3807 M38022M4-XXXFP M38022M4-XXXSP capacitor 334 ceramic "MELPS 740" 80P6S-A
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OCR Scan |
P53/SRDy2 P52/SClk2 P47/SRDY, P46/Sclkiâ P45/TxD P44/RXD P43/INT2 P42/INT, P40/INT4 P30/DA, marking P5t m38022e4sp "SERIES MELPS 740" SERIES MELPS 740 USERS MANUAL transistor da 3807 M38022M4-XXXFP M38022M4-XXXSP capacitor 334 ceramic "MELPS 740" 80P6S-A | |
si3256Contextual Info: ispLSI 3256 High Density Programmable Logic Functional Block Diagram A0 A1 OR Array A2 A3 B3 N C0 C1 C2 R F2 D Q F1 Twin GLB F0 D Q D Q E3 E2 D Q E1 Global Routing Pool E0 C3 Output Routing Pool • 100% IEEE 1149.1 BOUNDARY SCAN COMPATIBLE D Q D Q Array |
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160-MQFP/3256 160-Pin 041A-08isp/3256 3256-70LM 3256-50LM 0212Aisp/3256 si3256 | |
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w584
Abstract: V068
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OCR Scan |
0212Aisp/3256 3256-70LM 160-Pin 3256-70LG 167-Pin 3256-50LM 3256-50LG w584 V068 | |
UAA170
Abstract: UAA180 RBG-1000 IR2406 GBG-1000 OBG-1000 YBG-1000 LM3914 LM3914 PIN uaa17
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OCR Scan |
RBG-1000 OBG-1000 YBG-1000 GBG-1000 RBG-1000, OBG-1000, YBG-1000, GBG-1000 UAA170 UAA180 RBG-1000 IR2406 LM3914 LM3914 PIN uaa17 | |
3256EContextual Info: ispLSI 3256E Device Datasheet June 2010 All Devices Discontinued! Product Change Notifications PCNs have been issued to discontinue all devices in this data sheet. The original datasheet pages have not been modified and do not reflect those changes. Please refer to the table below for reference PCN and current product status. |
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3256E 3256E 3256E-70LB320 3256E-100LB320 3256E-70LQA 3256E-100LQA 3256E-70LQA1 3256E-100LQA1 | |
AA23
Abstract: AC13 AF14 EL B17
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272-BGA 388-BGA 384V-125LB272 272-Pin 384V-125LB388 388-Pin 384V-100LB272 384V-100LB388 AA23 AC13 AF14 EL B17 | |
3256EContextual Info: ispLSI 3256E High Density Programmable Logic Functional Block Diagram G3 H0 A0 A1 OR Array A2 A3 ORP ORP • IN-SYSTEM PROGRAMMABLE — 5V In-System Programmable ISP using Lattice ISP or Boundary Scan Test (IEEE 1149.1) Protocol — Increased Manufacturing Yields, Reduced Time-toMarket, and Improved Product Quality |
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3256E 0212/3256E 3256E-100LM 304-Pin 3256E-100LB320 320-Ball 3256E-70LM 3256E | |
036 84, 036 85, 036 86 rondorex w21
Abstract: kc 59 246 3256E
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3256E E2CMOS149 0212/3256E 3256E-100LM 304-Pin 3256E-100LB320 320-Ball 3256E-70LM 036 84, 036 85, 036 86 rondorex w21 kc 59 246 3256E | |
logic gates pin configurationContextual Info: Specifications ispLSI 3256 ispLSI 3256 High Density Programmable Logic Functional Block Diagram • HIGH PERFORMANCE E CMOS TECHNOLOGY — fmax = 77 MHz Maximum Operating Frequency — tpd = 15 ns Propagation Delay — TTL Compatible Inputs and Outputs |
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kc 59 246
Abstract: 3256E
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3256E 0212/3256E 3256E-100LQ 304-Pin 3256E-100LB320 320-Ball 3256E-70LQ kc 59 246 3256E | |
LD3Z
Abstract: INS8070 S807X ins8070-series
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OCR Scan |
INS8070-Series S8070-Series 16-bit 70-Series INS087O LD3Z INS8070 S807X | |
B272
Abstract: 149-IO
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Faste14 3192-100LM 240-Pin 3192-100LB272 272-Ball 3192-70LM 3192-70LB272 3192-70LMI B272 149-IO |