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AT28C010-DWFM Microchip Technology Inc EEPROM, 128KX8, Parallel, CMOS
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AT28C010-10JC Atmel Corporation Chip One Exchange 26 - -
AT28C010-12EM/883 Microchip Technology Inc Master Electronics 5 $266.39 $245.90
AT28C010-12JU Microchip Technology Inc New Advantage Corporation 64 $39.94 $37.28
AT28C010-12JU Microchip Technology Inc Avnet 20 €31.09 €24.89
AT28C010-12JU Microchip Technology Inc Master Electronics 32 $38.20 $26.94
AT28C010-12JU Microchip Technology Inc RS Components 27 £25.05 £21.63
AT28C010-12JU Microchip Technology Inc Future Electronics 128 $27.96 $27.96
AT28C010-12JU Microchip Technology Inc Chip1Stop 160 $34.40 $25.80
AT28C010-12JU Microchip Technology Inc Chip1Stop 17 $29.90 $29.90
AT28C010-12JU-235 Microchip Technology Inc microchipDIRECT 1,500 $33.01 $28.89
AT28C010-12JU-T Microchip Technology Inc microchipDIRECT 3,750 $30.04 $26.29
AT28C010-12TU Microchip Technology Inc Allied Electronics & Automation - $29.89 $28.39
AT28C010-15JI Atmel Corporation Bristol Electronics 2 - -
AT28C010-15JU Microchip Technology Inc Future Electronics - $26.21 $26.21
AT28C010-15JU Microchip Technology Inc Avnet 32 €28.99 €23.19
AT28C010-15JU Microchip Technology Inc microchipDIRECT 3,424 $28.72 $25.13
AT28C010-15JU Microchip Technology Inc Avnet 159 $26.19 $25.39
AT28C010-15JU-T Microchip Technology Inc microchipDIRECT - $28.76 $25.17
AT28C010-15PI Atmel Corporation Bristol Electronics 1 - -
AT28C010-15PU Microchip Technology Inc Avnet 1 €14.49 €10.59
AT28C010-15TU Microchip Technology Inc Chip1Stop 21 $30.69 $30.69
AT28C010-15TU Microchip Technology Inc Chip1Stop 140 $30.69 $28.48
AT28C010-15TU Microchip Technology Inc microchipDIRECT 1,055 $32.15 $28.13
AT28C010-20DM/883 Microchip Technology Inc Chip1Stop 4 $344.75 $344.75
AT28C01012JC Atmel Corporation Chip One Exchange 72 - -
AT28C01015JC Atmel Corporation ComS.I.T. 1,143 - -
AT28C01015JI Atmel Corporation Bristol Electronics 10 - -
AT28C01020PC Chip One Exchange 27 - -
AT28C010E-12EM/883 Microchip Technology Inc New Advantage Corporation 34 $371.91 $371.91
AT28C010E-12JU Microchip Technology Inc Future Electronics - $28.25 $28.25
AT28C010E-12JU Microchip Technology Inc Master Electronics 32 $40.33 $28.44
AT28C010E-12JU Atmel Corporation Chip One Exchange 150 - -
AT28C010E-12JU Microchip Technology Inc Newark element14 88 $31.71 $30.53
AT28C010E-12JU Microchip Technology Inc Farnell element14 88 £24.44 £22.62
AT28C010E-12JU Microchip Technology Inc element14 Asia-Pacific 88 $41.32 $38.22
AT28C010E-12JU Microchip Technology Inc Avnet 23 $33.79 $28.09
AT28C010E-12JU Microchip Technology Inc microchipDIRECT 1,710 $31.68 $27.72
AT28C010E-12JU-341 Microchip Technology Inc Chip1Stop 32 $29.66 $28.58
AT28C010E-12TU Microchip Technology Inc Avnet 156 €32.99 €26.39
AT28C010E-12TU Microchip Technology Inc Future Electronics - $28.12 $28.12
AT28C010E-15JC Atmel Corporation Chip One Exchange 50 - -
AT28C010E-20PC Atmel Corporation New Advantage Corporation 24 - -
X28C010D-15 Rochester Electronics - - -
X28C010D15 (OXIDIZED) Intersil Corporation Chip One Exchange 40 - -
X28C010DI-15 Rochester Electronics - - -
X28C010DI-15 Intersil Corporation Bristol Electronics 13 - -
X28C010DMB-25 Intersil Corporation New Advantage Corporation 5 - -
X28C010DMB-25 X OR . Bristol Electronics 1 - -
X28C010FI-15C1009 Rochester Electronics - - -
X28C010FI-20 Rochester Electronics - - -
X28C010FMB-15 Rochester Electronics - - -
X28C010J-25 Intersil Corporation New Advantage Corporation 23 - -
X28C010RI-20 Intersil Corporation New Advantage Corporation 6 - -
X28C010RI-20C7168 Rochester Electronics - - -
XM28C010M-20 Intersil Corporation Bristol Electronics 6 - -

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28C010 datasheet (343)

Part Manufacturer Description Type PDF
28C010-120 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010-150 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010-200 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010-250 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010H-120 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010H-150 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010H-200 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010H-250 Seeq Technology 128K x 8 CMOS EEPROM Memory Scan PDF
28C010RP Maxwell Technologies 1 MEGABIT EEPROM MCM 128K x 8 - BIT Original PDF
28C010TdieDB-12 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDB-15 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDB-20 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDE-12 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDE-15 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDE-20 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDI-15 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDI-20 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDS-12 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDS-15 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF
28C010TdieDS-20 Maxwell Technologies IC EEPROM PARL 1MBIT 128K x 8 5V 32DIP Original PDF

28C010 Datasheets Context Search

Catalog Datasheet MFG & Type PDF Document Tags
28C010-120

Abstract: 28C0102 28C010 400103 28C010-200
Text: specified) Lim its 28C010-120 Sym bol Parameter tflC CE AA OE OF 28C010-150 Min. 150 28C010-200 Min. 200 Max. 28C010-250 Min. Max. 250 Min. 120 Max. Max. Test Units Conditions lo lo , *OEH 28C010-150 Min. Max. 10 5 0 70 0 0 50 10 10 100 60 10 28C010-200 Min. Max. 10 5 0 70 0 0 50 , . The 28C010's write cycle time is 5 ms typical. An automatic clear is performed before a write. The , loaded randomly into the 28C010. Addresses A7-A16 select the page address and must remain the same


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PDF 28C010 1024K 120mA 850pA 28C010) 28C010H) 28C010 400103/A 28C010-120 28C0102 400103 28C010-200
28C010-200

Abstract: 28C010-150 28C010-120 28c010 28C010-250 M28C010
Text: Parameter Limits Units Test Conditions 28C010-120 28C010-150 28C010-200 28C010-250 Min , Vcc range, unless otherwise specified) Symbol Parameter Umlts 28C010-120 28C010-150 28C010-200 28C010-250 Min. Max. Min. Max. Min. Max. Min. Max. Units 'wc Write Cycle Time Standard , 28C010 has an internal timer that automatically times out the write time. The 28C010's write cycle time , 28C010. Addresses A7-A16 select the page address and must remain the same throughout the page load cycle


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PDF 28C010 1024K 28C010) 28C010H) 28C010 128Kx8EEPR0M 400103/A 28C010-200 28C010-150 28C010-120 28C010-250 M28C010
28C010-120

Abstract: No abstract text available
Text: automati cally times out the write time. The 28C010's write cycle time is 5 ins typical. An automatic clear , Byte/Page Write Time ( 28C010 ) · 5 ms Typical Byte/Page Write Time ( 28C010H ) On-Chip Timer · Automatic , into the 28C010. Addresses A 7-A 16 select the page address and must remain the same throughout the , otherwise specified) Limits BM 28C010-120 EJM28C010-1S0 E/M20CO1O-2OO E/M28C01C-250 s Data (I/O , 6-103 E/M28C010 ADVANCED INFORMATION DATA SHEET Description The SEEQ 28C010is a


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PDF E/M28C010 1024K 120mA 28C010) 28C010H) 20CO1O 128Kx8EEPROM 120ns 400085/A 28C010-120
Not Available

Abstract: No abstract text available
Text: write time. The 28C010†™s write cycle time is 5 ms typical. An automatic clear is performed before a , into the 28C010. Addresses A7-A16 select the page address and must remain the same throughout the , Cycle Times • 128 Byte Page Write Operation • 10 ms Typical Byte/Page Write Time ( 28C010 ) • 5 ms Typical Byte/Page Write Time ( 28C010H ) ■5 V ± 10% Power Supply On-Chip Timer , The SEEQ 28C010is a high-performance 5 Vonly, 128K x 8 Electrically Erasable Programmable Read Only


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PDF E/M28C010 1024K 28C010) 20CO1O 400085/A
tsop 338

Abstract: 28c010 28C010 Atmel 4C016 4b23 4h5229 AT28C010 2D93 6F9630 4A9422
Text: PAGE 1 OF 10 ATMEL CORPORATION Tel:(408)441-0311 Fax:(408)436-4200 AT- 28C010 CMOS EEPROM , report was generated from AT- 28C010 reliability testing. This data is applicable to the following device , -28C040 JULY 2003 2325 Orchard Parkway San Jose CA. 95131 PAGE 2 OF 10 AT- 28C010 150°C DYNAMIC LIFE , ) PAGE 3 OF 10 AT- 28C010 200°C DATA RETENTION BAKE LOT NUMBER FAILURES 132106-2 131571 , cycling tests are shown below. No device failures have been found. CYCLE TEST RESULTS OF AT- 28C010


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PDF AT-28C010 MIL-M-38535 AT-28C256 AT-28C040 AT-28C010 7G9822 6H9708 9G9937 9G9939 tsop 338 28c010 28C010 Atmel 4C016 4b23 4h5229 AT28C010 2D93 6F9630 4A9422
ne 5555 timer

Abstract: No abstract text available
Text: 28C010-120 28C010-200 28C010-250 Min. Min. Min. Min. Max. Max. Max. Max. Read , (Over the operating temperature and Vcc range, unless otherwise specified) Limits 28C010-120 Symbol Parameter W Write Cycle Time Min. Max. 28C010-150 28C010-200 Min. Min. Max , €¢ 10 m s Typical Byte/Page Write Time ( 28C010 ) • 5 ms Typical Byte/Page Write Time ( 28C010H ) â , Units Conditions Ol ml a < F Symbol Parameter 28C010-150 ÜÊ = OE - V1 L b3E D â


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PDF in233 1024K 28C010) 28C010H) 120nsec 400103/A ne 5555 timer
1999 - 28C010

Abstract: 28c010-15 1N914 CAT28C010
Text: 6 pF VIN = 0V 28C010-12 28C010-15 A.C. CHARACTERISTICS, Read Cycle VCC=5V + 10 , 28C010-12 Min. Max. 28C010-15 Min. Max. Symbol Parameter tWC Write Cycle Time tAS , tOHZ DATA OUT tHZ tOH tOLZ HIGH-Z DATA VALID DATA VALID tAA 28C010 F06 Figure , 28C010 F10 Figure 8. Toggle Bit WE CE tOEH tOES tOE OE I/O6 (1) (1) tWC 28C010 F11 Note: (1) Beginning and ending state of I/O6 is indeterminate. Doc. No. 25093-00 7/99 P


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PDF CAT28C010 1024K-Bit 28C010 10mmx14mm) 8mmX20mm) 500/Reel 120ns 150ns 28C010 28c010-15 1N914 CAT28C010
29C257

Abstract: gang capacitor pin details 27LV020 27c4000 ST 27C1000 29C010A 29F040A Winbond 29EE011 Xicor 28C010 27C020
Text: , 27C040, 27LV010, 27LV020, 28C010 , 29C257, 29C512, 29C010, 29C010A, 29LV010 □ Catalyst n 28F512 , □ 97209 □ Waferscale □ 27010L □ Winbond □ 29EE011 □ Xicor □ 28C512, 28C010


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PDF ADSl/63 ///AD63 27C010, 27C020, 27C040, 27H010, 27LV512, 27LV020, 28F256, 28F512, 29C257 gang capacitor pin details 27LV020 27c4000 ST 27C1000 29C010A 29F040A Winbond 29EE011 Xicor 28C010 27C020
28f512

Abstract: 27C020 29C257 29f040a Winbond 29EE011 AD51 programmer for 29F010 29F040 28F010 28F256
Text: , 27LV010, 27LV020, 28C010 , 29C257, 29C512, 29C010, 29C010A, 29LV010 □ Catalyst □ 28F512, 28F010, 28F020 , –¡ Winbond □ 29EE011 □ Xicor □ 28C512, 28C010 Device package: 32 pin PLCC Note: AD63 may also be used


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PDF AD51/63 ///AD63 27C010, 27C020, 27C040, 27H010, 27LV512, 27LV020, 28F256, 28F512, 28f512 27C020 29C257 29f040a Winbond 29EE011 AD51 programmer for 29F010 29F040 28F010 28F256
eeprom 2816

Abstract: 2816A eeprom Atmel eeprom Cross Reference eeprom Cross Reference EEPROM 2864 INTEL 28C64 EEPROM xicor 28C64 Xicor 28C010 Xicor 2864 intel 2864
Text: 28C65 28C64A 28C256 36C16* 36C16 2804A 2816A 28C64 28C64 28C64 28C64A 28C256 28C256 M28C010 28C010


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PDF 2864B AT28HC16 AT28C64 AT28C64E AT28C64X AT28HC64 AT28PC64 AT28C64F AT28C2S6 AT28C256F eeprom 2816 2816A eeprom Atmel eeprom Cross Reference eeprom Cross Reference EEPROM 2864 INTEL 28C64 EEPROM xicor 28C64 Xicor 28C010 Xicor 2864 intel 2864
27C32

Abstract: 24c04 Atmel 27c301 atmel 24c02 39SF040 24C08 ATMEL dataman s4 27C101 Xicor 28256 eeprom 2864a
Text: 27CL010 27LV010 28C010 28C64B 28MC020 29C010 29C040A 29C512 29LV512 49LV020 27C010L 27C080 , Winbond 27C020M 27E512 29EE011 27E010 29C020 29EE512 Xicor 28256 28C010 28C64 2864A


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PDF 2716B 2732B 27C010 27C100 27C512L 27HB010 28C256 28F256 29F002NBB 29F040 27C32 24c04 Atmel 27c301 atmel 24c02 39SF040 24C08 ATMEL dataman s4 27C101 Xicor 28256 eeprom 2864a
28C040

Abstract: 28C256 atmel AT28C040 28c010 28C256 28HC64 MIL-M-38535 5F0280 AT28C010
Text: PAGE 1 OF 4 ATMEL CORPORATION Tel:(408)441-0311 Fax:(408)436-4200 AT-28C040 EEPROM RELIABILITY DATA* - 125°C OPERATING LIFE TEST - 200°C RETENTION BAKE - CYCLE TEST *. This data is applicable to the following device types due to same technology grouping as defined in MIL-M-38535 Appendix A: AT-28C256 AT- 28C010 JULY 2003 2325 Orchard Parkway San Jose CA. 95131 PAGE 2 OF 4 AT-28C040 150°C DYNAMIC OPERATING LIFE TEST LOT NUMBER DATE CODE SAMPLE SIZE TOTAL


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PDF AT-28C040 MIL-M-38535 AT-28C256 AT-28C010 AT-28C040 5F0280 5F9526 5F0723 5F9522 AT-28HC64 28C040 28C256 atmel AT28C040 28c010 28C256 28HC64 5F0280 AT28C010
winbond 25080

Abstract: 29F200BB 16LF648A 89V51RD2 18f252 89S51 National SEMICONDUCTOR GAL16V8 29sf040 12f675 29F400BB
Text: > Devices List Atmel 28C010 28MC010 29C040 29LV020 49F001NT 49F002NT Benchmarq BQ4010Y 28C16 , 2864A 28HC256 2864B 2864H 28C010 28C256 28C256B U632H64 U634H256 U635H16


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PDF 2732B 27C100 27HB010 27C256 27HC64 27C128 27C040 7128A winbond 25080 29F200BB 16LF648A 89V51RD2 18f252 89S51 National SEMICONDUCTOR GAL16V8 29sf040 12f675 29F400BB
28C011

Abstract: 28LV010 28C010 Maxwell Technologies 79C0832 79LV0408 79LV0832 HN58C1001 1mb eeprom
Text: APPLICATION NOTE Hitachi 1Mb EEPROM ­ Hitachi Die HN58C1001 Purpose Over the last several months several design applications questions have been asked regarding the Hitachi EEPROM. These questions have been to both clarify the datasheet specifications as well as obtain additional information not contained in the datasheet. This application note documents the answers that Maxwell has received from Hitachi. Maxwell Technologies Microelectronics Products Affected · 28C010 · 28C011 ·


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PDF HN58C1001 28C010 28C011 79C0408 79C0832 28LV010 28LV011 79LV0408 79LV0832 28C011 28LV010 28C010 Maxwell Technologies 79C0832 79LV0408 79LV0832 HN58C1001 1mb eeprom
atmel 93c66

Abstract: PH29EE010 2764 EEPROM sst ph29ee010 537RU10 556RT7A 556RT5 intel 8755 eprom 2716 537RU17
Text: 28C17A 28C64 28C256 28C010 28C020 28C040 : SST : EEPROM SST29EE512 PH29EE010 SST29EE020 SST29LE020


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PDF ST011 DIP42 DIP42, RS232 155RE3 556RT4 556RT4A 556RT5 atmel 93c66 PH29EE010 2764 EEPROM sst ph29ee010 537RU10 556RT7A intel 8755 eprom 2716 537RU17
Xicor 28C010

Abstract: 28C010-200 28C010-120 28C010-150 28C010H-250 28C010H-200 28C010H-150 28C010H-120 28C010-250 HN29C101
Text: ) 28C010-120 SEEQ 0—711 120 120 0 50 50 4. 5-5. 5 120/2 0.8 2.0 6 0. 4/2. 1 2. 4/0.4 12 28C010-150 SEEQ —70 150 150 0 55 55 4. 5-5. 5 120/2 0.8 2.0 6 0. 4/2.1 2. 4/0. 4 12 28C010-200 SEEQ 0-7» 200 200 0 55 55 4. 5—5. 5 120/2 0.8 2.0 6 0. 4/2.1 2. 4/0.4 12 28C010-250 SEEQ 0-70 250 250 0 55 55 4. 5-5. 5 120/2 0.8 2.0 6 0. 4/2.1 2. 4/0. 4 12 28C010H-120 SEEQ 0—7D 120 120 0 50 50 4. 5-5. 5 120/2 0.8 2.0 6 0. 4/2.1 2. 4/0. 4 12 28C010H-150 SEEQ 0—70 150 150 0 55 55 4. 5-5. 5 120/2 0.8 2.0 6 0. 4


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PDF 28C010-120 28C010-150 28C010-200 28C010-250 28C010H-120 28C0/2 28C010 Pin32 Xicor 28C010 28C010H-250 28C010H-200 28C010H-150 HN29C101
EEPROM 28C256

Abstract: 7b9729 1C0302 28C040 28C256 82307 6D9708 4b23 6C9638 28C256 atmel
Text: types due to same technology grouping as defined in MIL-M38535 Appendix A: AT- 28C010 AT


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PDF AT-28C256 MIL-M38535 AT-28C010 AT-28C040 AT-28C256 1C0302 3E0319 3E0323 3G0338 EEPROM 28C256 7b9729 1C0302 28C040 28C256 82307 6D9708 4b23 6C9638 28C256 atmel
MIL-STD 833 test method 3015

Abstract: No abstract text available
Text: < Ordering Information M Q 28C010 K -2 5 0 _T X . PACKAGE TYPE M = MODULE


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PDF Q/E28C010 1024K MQ/ME28C010 28C256 MD400066/A MQ/ME28C010 28C010 MIL-STD 833 test method 3015
Not Available

Abstract: No abstract text available
Text: ^. D h/ ^ < Ordering Information M M 28C010 K -2 5 0 MP J PACKAGE TYPE TEMPERATURE RANGE


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PDF M28C010 1024K MM28C010 128Kx8Electrically 28C256 TheMM28C010isavailableina 32pin MM28C010 T-46-13-27
5962-3826719V7C

Abstract: 5962-3826718VMC 5962-3826719V6C 5962-3826718V6C Maxwell 5962-3826719V7C QML-38535 AT28C010-12DM 5962-3826718v 28C010TFS-15 28C010TFB-25
Text: No file text available


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PDF 5962-R139-94. 5962-R278-94. 5962-R163-96. 0EU86 1FN41 0EU86 5962-3826719V7C 5962-3826718VMC 5962-3826719V6C 5962-3826718V6C Maxwell 5962-3826719V7C QML-38535 AT28C010-12DM 5962-3826718v 28C010TFS-15 28C010TFB-25
MP 1008 es

Abstract: MP 6101 MD4000
Text: < Ordering Information M M 28C010 K -250 I . PACKAGE TYPE M e MOOULE TEMPERATURE RANGE M »-6 S *C to +


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PDF M28C010 1024K MM28C010 128Kx8Electrically 28C256 32pin MM28C010 28C010 MP 1008 es MP 6101 MD4000
Not Available

Abstract: No abstract text available
Text: 883 C U S S B SCREENED MILITARY M M 28C010 J


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PDF M28C010 1024K MM28C010 128Kx 28C256 32pinmodule MD400044/B 28C010
1998 - AT28C010-12DK-SV

Abstract: 28C010 AT28C010-12DK AT28C010-12DK-12 AT28C010-12DK-E AT28C010-12DK-MQ Atmel 28C010 AT28C010
Text: write can begin. Atmel's 28C010 has additional features to ensure high quality in manufacturing. The


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PDF 128-byte 4259E AT28C010-12DK-SV 28C010 AT28C010-12DK AT28C010-12DK-12 AT28C010-12DK-E AT28C010-12DK-MQ Atmel 28C010 AT28C010
1999 - AT28C010

Abstract: No abstract text available
Text: access for a read or write can begin. Atmel's 28C010 has additional features to ensure high quality


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PDF 128-byte 0353E 06/99/xM AT28C010
Not Available

Abstract: No abstract text available
Text: X Preliminary Information 1 Megabit Module XM 28C010 H S T 128K x 8 Bit 5 Volt, Byte Alterable E2PROM T Y P IC A L F E A T U R E S • High Density 1 Megabit (128K x 8 ) E2PROM Module • Access Tim e of 120 ns at -5 5 °C to +125°C • SIMPLE Byte and Page Write — Single 5 Volt Supply — No External High Voltages or VPP Control Circuits — Self Timed — No Erase Before Write — No Complex Programming Algorithms — No Overerase Problem • Base Memory


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PDF 28C010 X28C256 32-Pin FHDF06 XM28C010
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