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test socket current

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: . 17 Figure 5. Socket 754 Qualification Test Matrix , Gas EIA 364­70 Temperature Rise Versus Current Test Procedure for Electrical Connectors and , production lots of Socket 754. 4.1 Qualification Test Report A test report must be written for each , AMD. · Socket 754 drawing and specifications in supplier's format · Qualification Test Report (See , Socket 754 · Sample of Socket 754 from qualification test lot The documentation package, as specified ... Advanced Micro Devices
Original
datasheet

40 pages,
2142.03 Kb

amd socket 754 PIN LAYOUT 40 pin zif socket AMD Socket 754 processor amd athlon 64 3000 alloy-194 AMD Socket S1 PIN LAYOUT AMD thermal design retention mechanism athlon socket 754 EIA-364-30 EIA-364-27 distance measurement using ir EIA-364-103 socket S1 socket s1 Advanced Micro Devices EIA 364-60 AMD Socket 754 amd athlon 64 socket 754 AMD socket s1 AMD athlon socket 754 Socket 754 TEXT
datasheet frame
Abstract: Figures Figure 1. Socket 940 Qualification Test Matrix , Socket 940. 2.1 Qualification Test Details The socket qualification test matrix for Socket 940 , Rev. 3.04 September 2003 Figure 1. Socket 940 Qualification Test Matrix 12 Socket 940 , 940 Design Specification, order# 25766 and EIA Standard, EIA 364, Electrical Connector/Socket Test , documentation, socket suppliers must provide AMD with five socket samples from the qualification test lot. The ... Advanced Micro Devices
Original
datasheet

33 pages,
1175.21 Kb

amd socket s1 mechanical amd 940 EIA-364-108 Athlon 64 FX Athlon 64 AMD design retention mechanism amd athlon PIN LAYOUT socket s1 AMD thermal design retention mechanism socket 940 AMD socket s1 amd FX PIN LAYOUT 940 SOCKET PIN LAYOUT amd socket 940 PIN LAYOUT socket 940 pin package AMD Socket S1 PIN LAYOUT amd athlon PIN LAYOUT voltage ground TEXT
datasheet frame
Abstract: : . 36 6.8. SOCKET TEST PLAN , motherboard not connected and only the measurements with the same test vehicle mounted on the socket will be , Socket Design Guidelines Figure 17: Contact Current Rating Measurement 4.5. Dielectric Withstand , : Frequency Range: 5Hz to 500Hz 30 10 12 ® 423 Pin Socket Design Guidelines Vibration test to , meet all the electrical contact resistance requirements following random vibration test. The socket ... Intel
Original
datasheet

39 pages,
1008.57 Kb

intel MOTHERBOARD pcb design Accelerometer 300g ZIF socket design guidelines MOTHERBOARD pcb CIRCUIT diagram motherboard PCB diagram motherboard PCB diagram pentium 4 PGA423 schematic diagram intel motherboard au3a A37-C37 ATX MOTHERBOARD schematic intel MOTHERBOARD pcb design in pentium 4 motherboard CIRCUIT diagram free circuit diagram of motherboard 40 pin zif socket intel MOTHERBOARD pcb CIRCUIT diagram pentium 4 motherboard schematic diagram TEXT
datasheet frame
Abstract: :. 27 Socket Test Plan , . Solderability Test: Must pass 95% coverage per solder ball/surface mount feature. 3.5.6. Socket BGA , provide two separate circuits. One is a precision current source to deliver the test current. The other , randomly chosen. 4.7. Contact Current Rating Measure and record the temperature rise when the socket is subjected to rated current of 0.8A. The sockets shall be tested according to EIA-364 EIA-364, Test ... Intel
Original
datasheet

37 pages,
1320.95 Kb

A59-A57 A129-A133 AE10 circuit diagram of motherboard IBM motherboard socket rev 1.6 intel MOTHERBOARD pcb CIRCUIT diagram MARK A106 a105 transistor networking SOCKET CONNECTION DIAGRAM rev 1.5 ibm motherboard A135 surface mount transistor A61 surface mount transistor A55 surface mount transistor A48 surface mount transistor A103 S8-95 20 pin zif socket MOTHERBOARD CIRCUIT diagram explained ZIF socket design guidelines a96 laser diode TEXT
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Abstract: Diameter: 0.062" (1.57 mm). Test Current: 13 Amps. Stock No. 70082904 70082905 70082906 70082907 70042253 , Body: Copper alloy, plated tin or gold. Contact Size: 16. Pin Diameter: 0.062" (1.57 mm). Test Current , " (1.57 mm). Test Current: 13 Amps. Stock No. 70082899 70082900 70082901 70086317 70042235 70042236 , Diameter: 0.062" (1.57 mm). Test Current: 25 Amps. Stock No. 70086084 70086085 70083346 70083349 70042659 , plating. Pin Diameter: 0.062". Test Current: 13 Amps. Contact Size: 16. Stock No. 70087519 70087520 ... Original
datasheet

1 pages,
498.04 Kb

M39029 pin crimp Coaxial 66566-7 201330-1 7004-23 TEXT
datasheet frame
Abstract: 100 120 140 160 180 200 220 240 A Test current Springtac™ Socket Type 170-. Solid pin Type , 100 150 Test current 200 240 A Springtac™ Socket Type 170-. Solid pin Type 180 , 200 300 Test current 400 480 A Springtac™ Socket Type 170-. Springtac™ Socket , 0 50 460 100 150 200 A 300 400 Test current 500 600 A Springtac™ Socket , 20 10 0 Test current A Contact Ø Ø 1 Ø 1,5 4 6 5 10 Ø 3 Ø 5 Ø 6 ... ODU-Steckverbindungssysteme
Original
datasheet

4 pages,
44.02 Kb

TEXT
datasheet frame
Abstract: Final contact resistance Socket minimum current rating and test voltage Dielectric withstand voltage , :.16 5.1.7 Test Voltage and Current Rating , .23 6.7 SOCKET TEST PLAN , performance characteristics. Specifications are from the top of the socket to the top of test board to which , will be sent to Intel's designated test facility for socket qualification testing. The sockets ... Intel
Original
datasheet

27 pages,
346.28 Kb

socket pga370 ATX MOTHERBOARD schematic intel flash date code marking intel traceability code pentium 4 motherboard schematic diagram 370 socket pinout PGA370 pinout PGA370 TEXT
datasheet frame
Abstract: . 1.4 1.2 1.5 Conclusion This test report confirmed that Tyco socket F 1207 satisfied the , Grid Array 1207 Position Socket ( Socket F 1207 ) Qualification test report 501-5736 2. Test , Position Socket ( Socket F 1207 ) 2.9 Physical shock Qualification test report Accelerated , ) (Final) *1 Environmental Requirements 2.10 Cyclic humidity Test package mated socket with , per contact) (Final) *1 2.11 Temperature life (Heat aging) Test package mated socket with ... Tyco Electronics
Original
datasheet

17 pages,
186.09 Kb

LGA1207 750H 1000H amd socket 1207 Socket-F Tyco cpu socket 553 TEXT
datasheet frame
Abstract: odule Socket) A M P _ ^ S 2 J jR w ¿ iM A R fl1¿ Para. 108-5403 Test Items PCB Mating Force , 108-5403 AMP-Mffi Socket (Mini Memory Module Socket) 1. 1.1 Scope: Contents: This specification covers the requirements for product performance, test methods and quality assurance provisions of AMP-MM Socket. Applicable product description and part numbers are as shown in Appendix 1. Applicable Documents , > Utc 2.1 AMP Specifications: A. 10&-5000 B. 501-5107 501-5153 501-5173 501-5218 Test ... OCR Scan
datasheet

10 pages,
398.73 Kb

s02g 412896 179601-3 TEXT
datasheet frame
Abstract: Socket minimum current rating and test voltage Dielectric withstand voltage (minimum) Pin-to-Pin , :. 17 5.1.7 Test Voltage and Current Rating , . 23 6.7 SOCKET TEST PLAN , . Specifications are from the top of the socket to the top of test board to which it is attached. All , 's designated test facility for socket qualification testing. The sockets submitted must be per the drawing ... Intel
Original
datasheet

28 pages,
335.29 Kb

socket zif 370-PIN intel pentium 1 schematic diagram intel traceability code mass flow measuring circuit schematic pentium 4 motherboard schematic diagram schematic diagram intel processor xeon schematic diagram intel motherboard PGA370 socket free datasheet socket pga370 8080 intel microprocessor pin diagram PGA370 socket 370 pinout PGA370 PGA370 socket PGA370 PGA370 PGA370 370 socket pinout PGA370 pinout TEXT
datasheet frame

Archived Files

Abstract Saved from Date Saved File Size Type Download
No abstract text available
/download/32861537-996504ZC/hw130sl4.tar
Xilinx 08/01/1997 3115 Kb TAR hw130sl4.tar
No abstract text available
/download/90445482-996505ZC/hw130sn4.tar
Xilinx 08/01/1997 2648 Kb TAR hw130sn4.tar
clean test fixture to measure an operational amplifier's input current in the low femtoampere region. op-amp. We made things modular, so we can easily pull out a test channel or a socket for cleaning - or force it to integrate the current at its negative input, it can do that job quite well ( Figure 1 ). But what if its socket is leaky? How can you tell if the error is the leakage of the amplifier or the leakage of the socket? You'd like to be able to autozero that socket's leakage error out of the
/datasheets/files/national/htm/nsc04108-v2.htm
National 16/09/1998 15.1 Kb HTM nsc04108-v2.htm
current file directory. [LIBARY PATH] For the Libary path [HARDWARE TEST] Verifying the Hardware Test from the test pattern library. After inserting an unknown device into the ZIF socket, press . pattern type in current library. [IC Test/Memory Test] AllMax provides an additional memory test size plug-in board. - One 48 pin ZIF socket programming module. NOTE: For multiple and parallel E(E socket that works with programming module. - One 3 feet long 40-pin flat ribbon cable with 2 sockets on
/datasheets/files/schuricht/demos/allmax/am.hlp
Schuricht 27/02/1997 40.22 Kb HLP am.hlp
clean test fixture to measure an operational amplifier's input current in the low femtoampere region. op-amp. We made things modular, so we can easily pull out a test channel or a socket for cleaning - or force it to integrate the current at its negative input, it can do that job quite well ( Figure 1 ). But what if its socket is leaky? How can you tell if the error is the leakage of the amplifier or the leakage of the socket? You'd like to be able to autozero that socket's leakage error out of the
/datasheets/files/national/htm/nsc06455.htm
National 18/12/1998 15.28 Kb HTM nsc06455.htm
No abstract text available
/download/99616438-996502ZC/hw130hp4.tar
Xilinx 08/01/1997 2810 Kb TAR hw130hp4.tar
No abstract text available
/download/11848259-996503ZC/hw130ib4.tar
Xilinx 08/01/1997 4570 Kb TAR hw130ib4.tar
No abstract text available
/download/97149729-700225ZC/udk4ila.xls
Sager 16/05/1996 5.86 Kb XLS udk4ila.xls