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TEST2600 Atmel Corporation Photo Transistor, 920nm, PLASTIC, 2 PIN visit Digikey
TESTPN-SJA Texas Instruments Obsolete OPN-TEST visit Texas Instruments
TMS320TEST1000 Texas Instruments TMS320TEST Test Generic visit Texas Instruments
TEST2600 Vishay Semiconductors Photo Transistor, 920nm , 0.05A I(C) visit Digikey
CS5373A-ISZR Cirrus Logic Low-power, High-performance Delta-Sigma Modulator with Test DAC visit Digikey
CDKWM8962B-S-1 Cirrus Logic KIT - WM8962B KIT CDB6243 MB DC visit Digikey

test socket current

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Abstract: * The AC load to be measured is plugged into the test socket. Current is measured across the 0.01 Q , Dropout Voltage vs Output Current â'¢ IN DICATES GUARANTEED TEST >01N r -55°C , °C ] 0123456789 10 OUTPUT CURRENT(A) â'¢ INC )ICATES GUARANTEED TEST P0 NT -55°C , I-r- I INDICATES GUARANTEED TEST POINT 0.5 1 1.5 OUTPUT CURRENT(A) LT1020/LT1120 Dropout Voltage , main transformer to L1 (trace D) occurs. The resultant current flow (trace E), limited by L1, charges -
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DALE RH-25 pulse transformer SCR firing circuits scr firing circuit for dc servo driver Power MOS FET Gate Drive lm317 2000W mosfet power inverter dc voltage regulator using scr AD534 LT1012 AN32-12
Abstract: POTENTIALS. USE CAUTION. The AC load to be measured is plugged into the test socket. Current is measured , INDICATES GUARANTEED TEST POINT LT1020/LT1120 Dropout Voltage and Supply Current · INDICATES , * 1M 10k ­ 115VAC LINE 200W ­ TEST LOAD SOCKET + USE A LINE ISOLATED ±15V SUPPLY , (Trace D) occurs. The resultant current flow (Trace E), limited by L1, charges the 4700F capacitor , start-up. The three terminal regulator's current limit protects the circuit from overloads. Figure 5 Linear Technology
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grid tie inverters circuit diagrams P50N05E p50n05 scr preregulator lk-343 LK-343-A-FM 1N1183 1N916 LT1057 RH-25
Abstract: . 17 Figure 5. Socket 754 Qualification Test Matrix , Gas EIA 364­70 Temperature Rise Versus Current Test Procedure for Electrical Connectors and , production lots of Socket 754. 4.1 Qualification Test Report A test report must be written for each , AMD. · Socket 754 drawing and specifications in supplier's format · Qualification Test Report (See , Socket 754 · Sample of Socket 754 from qualification test lot The documentation package, as specified Advanced Micro Devices
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Socket 754 AMD athlon socket 754 AMD socket s1 amd athlon 64 socket 754 AMD Socket 754 EIA 364-60 EIA-364-90 EIA-364-23 EIA-364-70 EIA-364-20
Abstract: Figures Figure 1. Socket 940 Qualification Test Matrix , Socket 940. 2.1 Qualification Test Details The socket qualification test matrix for Socket 940 , Rev. 3.04 September 2003 Figure 1. Socket 940 Qualification Test Matrix 12 Socket 940 , 940 Design Specification, order# 25766 and EIA Standard, EIA 364, Electrical Connector/Socket Test , documentation, socket suppliers must provide AMD with five socket samples from the qualification test lot. The Advanced Micro Devices
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AMD Socket S1 PIN LAYOUT amd athlon PIN LAYOUT voltage ground socket 940 pin package amd socket 940 PIN LAYOUT 940 SOCKET PIN LAYOUT amd FX PIN LAYOUT
Abstract: : . 36 6.8. SOCKET TEST PLAN , motherboard not connected and only the measurements with the same test vehicle mounted on the socket will be , Socket Design Guidelines Figure 17: Contact Current Rating Measurement 4.5. Dielectric Withstand , : Frequency Range: 5Hz to 500Hz 30 10 12 ® 423 Pin Socket Design Guidelines Vibration test to , meet all the electrical contact resistance requirements following random vibration test. The socket Intel
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PGA423 pentium 4 motherboard schematic diagram intel MOTHERBOARD pcb CIRCUIT diagram 40 pin zif socket free circuit diagram of motherboard pentium 4 motherboard CIRCUIT diagram intel MOTHERBOARD pcb design in IEC60
Abstract: :. 27 Socket Test Plan , . Solderability Test: Must pass 95% coverage per solder ball/surface mount feature. 3.5.6. Socket BGA , provide two separate circuits. One is a precision current source to deliver the test current. The other , randomly chosen. 4.7. Contact Current Rating Measure and record the temperature rise when the socket is subjected to rated current of 0.8A. The sockets shall be tested according to EIA-364, Test Intel
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a96 laser diode ZIF socket design guidelines MOTHERBOARD CIRCUIT diagram explained 20 pin zif socket S8-95 surface mount transistor A103
Abstract: Diameter: 0.062" (1.57 mm). Test Current: 13 Amps. Stock No. 70082904 70082905 70082906 70082907 70042253 , Body: Copper alloy, plated tin or gold. Contact Size: 16. Pin Diameter: 0.062" (1.57 mm). Test Current , " (1.57 mm). Test Current: 13 Amps. Stock No. 70082899 70082900 70082901 70086317 70042235 70042236 , Diameter: 0.062" (1.57 mm). Test Current: 25 Amps. Stock No. 70086084 70086085 70083346 70083349 70042659 , plating. Pin Diameter: 0.062". Test Current: 13 Amps. Contact Size: 16. Stock No. 70087519 70087520 -
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7004-23 201330-1 66566-7 M39029 pin crimp Coaxial DM-20 M39029/64-369 M39029/63-368 DF-20
Abstract: 100 120 140 160 180 200 220 240 A Test current Springtacâ"¢ Socket Type 170-. Solid pin Type , 100 150 Test current 200 240 A Springtacâ"¢ Socket Type 170-. Solid pin Type 180 , 200 300 Test current 400 480 A Springtacâ"¢ Socket Type 170-. Springtacâ"¢ Socket , 0 50 460 100 150 200 A 300 400 Test current 500 600 A Springtacâ"¢ Socket , 20 10 0 Test current A Contact Ø Ø 1 Ø 1,5 4 6 5 10 Ø 3 Ø 5 Ø 6 ODU-Steckverbindungssysteme
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D-84453
Abstract: Final contact resistance Socket minimum current rating and test voltage Dielectric withstand voltage , :.16 5.1.7 Test Voltage and Current Rating , .23 6.7 SOCKET TEST PLAN , performance characteristics. Specifications are from the top of the socket to the top of test board to which , will be sent to Intel's designated test facility for socket qualification testing. The sockets Intel
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PGA370 PGA370 pinout 370 socket pinout socket pga370 intel flash date code marking ATX MOTHERBOARD schematic 370-P USA/96/POD/PMG
Abstract: . 1.4 1.2 1.5 Conclusion This test report confirmed that Tyco socket F 1207 satisfied the , Grid Array 1207 Position Socket ( Socket F 1207 ) Qualification test report 501-5736 2. Test , Position Socket ( Socket F 1207 ) 2.9 Physical shock Qualification test report Accelerated , ) (Final) *1 Environmental Requirements 2.10 Cyclic humidity Test package mated socket with , per contact) (Final) *1 2.11 Temperature life (Heat aging) Test package mated socket with Tyco Electronics
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LGA1207 cpu socket 553 Socket-F Tyco amd socket 1207 1000H 750H LF-LGA1207
Abstract: odule Socket) A M P _ ^ S 2 J jR w ¿ iM A R fl1¿ Para. 108-5403 Test Items PCB Mating Force , 108-5403 AMP-Mffi Socket (Mini Memory Module Socket) 1. 1.1 Scope: Contents: This specification covers the requirements for product performance, test methods and quality assurance provisions of AMP-MM Socket. Applicable product description and part numbers are as shown in Appendix 1. Applicable Documents , > Utc 2.1 AMP Specifications: A. 10&-5000 B. 501-5107 501-5153 501-5173 501-5218 Test -
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179601-3 412896 s02g MIL-STD-202 FJ0O-1O56-97 FJ00-4128-96 FJOO-2156-95 FJ00-0806-94
Abstract: Socket minimum current rating and test voltage Dielectric withstand voltage (minimum) Pin-to-Pin , :. 17 5.1.7 Test Voltage and Current Rating , . 23 6.7 SOCKET TEST PLAN , . Specifications are from the top of the socket to the top of test board to which it is attached. All , 's designated test facility for socket qualification testing. The sockets submitted must be per the drawing Intel
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PGA370 socket socket 370 pinout 8080 intel microprocessor pin diagram PGA370 socket free datasheet schematic diagram intel motherboard schematic diagram intel processor xeon
Abstract: . 30 6.8 Socket Test Plan , socket, as well as any environmental test procedure outlined in Section 5. 3.5.1 Name mPGA604 , two separate circuits. One is a precision current source to deliver the test current. The other is a , assembly (socket and shorted test fixture) and one unit of measured sandwich (shorted test fixture) will , temperature rise when the socket is subjected to rated current of 0.8A. The sockets shall be tested according -
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mPGA604 intel 94v-0 MOTHERBOARD MANUAL A71 spice MARKING A106 ptv a123 pga socket 604 PGA604 603-P
Abstract: (average of minimum 40 pin/connector mated connections) 17 m 4. Socket minimum current rating @ , daisy chain Package Test Vehicle. Socket: The resistance of the socket contact, interface resistance , current source to deliver the test current. The other is a precision voltmeter circuit to measure the , measured from the solder ball side of the socket using a resistance daisy chain test fixture to short the , the inductance by probing on the solder ball side of the socket with the test fixture mounted on it Intel
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478 SOCKET PIN LAYOUT intel mpga478b MOTHERBOARD MANUAL Intel socket 478 PIN LAYOUT motherboard mPGA478 circuit 478 SOCKET mpga478 478-P PGA478 S2-93
Abstract: . 29 Figure 10. Picture of Test Fixture Mounted on a Socket , . 19 Table 5. Socket Positions Daisy Chained in Test Board , selected contacts per socket. The average porosity count as defined by EIA 364, test procedure 53A for the , into the socket. Note: 3.10.2. It is important to use an unused test device for the first and , Maximum mutual capacitance, C 1.0 pF 4 Socket minimum current rating @ 1.0A Read & Record Intel
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mpga479 M25N-2 MPGA479M AF17-AF18 AC22-AC23 AC18-AC19 PGA479M PGA479
Abstract: Plan EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications , socket 3.3. Ratings · · 3.4. 108-78375 Current: 1.33A Temperature: -55 to 110 , Array (LGA) 1207 position socket Test Description Requirement 108-78375 Procedure , ) Rev. A 3 of 8 Lever actuated Land Grid Array (LGA) 1207 position socket Test Description , actuated Land Grid Array (LGA) 1207 position socket Test Description Mixed flowing gas. Requirement Tyco Electronics
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EIA-364-60 EIA-364-32 AMD thermal design retention mechanism EIA-364-21 EIA-364-11 LGA 1207 socket F
Abstract: Socket Contact Size 16â'" Pin Diameter .062 [1.57] (Test Current, 13 Ampere)^ W ire Size Range AWG , .062 [1.57] (Test Current, 13 Am pere)* T o oling No. W ire Size Range AWG [mm2] 28-24 , contact, free-air test current is not to be construed as contact rating current. Use only for testing , Retention Springâ'" Stainless steel Contact Size 16â'" Pin Diameter .062 [1.57] (Test Current, 13 Ampere)^ , contact, free-air test current is not to be construed as contact rating current. Use only for testing -
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90281-1
Abstract: Dual compressive LGA socket Qualification test report DMD Socket 1. 07 MAR 2006 , 11 Dual compressive LGA socket DMD Socket 501-5712 1.5 1.5 Test samples Samples , LGA socket DMD Socket 501-5712 2. 2. Test Contents No , compressive LGA socket DMD Socket 501-5712 . 3. Product qualification test sequence /Test Group , compressive LGA socket DMD Socket 501-5712 4 4. Test result Conditions Measure Item N Tyco Electronics
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LGA socket 203P mil-std-202 201 10MAR
Abstract: Socket 16 Short 10-40599 Socket 16 Long 10-33646 16 18 20 22 Test Current* Amps , 10-597109-171 Socket 10-40561 16 18 20 22* Required Test Wire Adapter Current* Sleeve Amps 12 , stated are test ratings only. The connector could not withstand full rated current through all contacts , current carrying capacity, the size 16 and 12 socket contacts are of the closed entry design. Crimp , entry socket design in the size 12 and 16 contacts. A heavy silver-plated finish is deposited on all Amphenol
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Abstract: Screen fixing Cable group Cond. fixing Test voltage (kV rms) Rated current (A) 2 5 2 2 12 7 7 11 6 6 6 5 , suit almost any specific requirement in most markets, including medical devices, test and measurement , connector to be mated by simply pushing the plug axially into the socket. Once firmly latched, connection , first disengages the latches and then withdraws the plug from the socket. UL Recognition LEMO , mating and environmental characteristics. Each series includes a wide variety of plug, socket and coupler LEMO
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LEMO FFA 1S DPE.99 lemo DPE.99.103.8K huber suhner catalogue ARALDITE standard epoxy adhesive P0410
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