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tabai espec

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tabai espec

Abstract: JIS-Z-3282 TABAI ESPEC CORP. 30 TABAI ESPEC CORP. 30 TABAI ESPEC CORP. 30 TABAI ESPEC CORP. 30
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NSK osc

Abstract: 48 H diode TABAI ESPEC CORP. 30 TABAI ESPEC CORP. 30 TABAI ESPEC CORP. 30 TABAI ESPEC CORP. 30
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TSV-40

Abstract: tabai espec ) Equipment Used VS â'"700 â'"5 ^-^^s^flwfc^tfc Vibration tester (TABAI ESPEC CORP. ) (3)|5$|fc&# Test , '"401 HIGH TEMPERATURE TESTER (TABAI ESPEC CORP.) (2) fftf^pn-piiC The Number Of D.U.T. (Device Under Test , Used l&fiMtf PF â'"210 (^W^-^tfci^tt) LOW TEMPERATURE TESTER (TABAI ESPEC CORP.) (2) l&fiipp piffr , TESTING CHAMBER (TABAI ESPEC CORP. ) (2) The Number Of D.U.T. (Device Under Test) 5 (units) (3) ìmm
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INS420

Abstract: photo transistor til 78 test MODEL : PC3-5-5 (1) Equipment Used SMfifflf PH â'"401 HIGH TEMPERATURE TESTER (TABAI ESPEC CORP , -210 (^^^^«^ii) LOW TEMPERATURE TESTER (TABAI ESPEC CORP.) (2) IM^-nfC The Number Of D.U.T. (Device Under Test , ) HEAT SHOCK TESTING CHAMBER (TABAI ESPEC CORP. ) (2) The Number Of D.U.T. (Device Under Test) 5 "cJ , class Frequency variable endurance test (2) Equipment Used VSâ'"700â'"5 Vibration tester (TABAI ESPEC CORP. ) Test Conditions -m&mm io-sshz Sweep frequency â'¢mmm wra Sweep time 15min. â'¢S^g
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tabai espec

Abstract: TSV-40 endurance test (2) fiffligl mm*sm vs- Vibration tester Equipment Used -700-5 (TABAI ESPEC CORP. Om®^ , MODEL : PC6-24-5 (1) Equipment Used {S^Mff PF â'"210 LOW TEMPERATURE TESTER (TABAI ESPEC CORP.) (2 , :) HEAT SHOCK TESTING CHAMBER (TABAI ESPEC CORP. ) (2) The Number Of D.U.T. (Device Under Test) 5 "p , -24-5 (1) ffifflfl-M EquipmenL Used SiffiJfcffif PH â'"401 (^/W^^^tfe^tt) HIGH TEMPERATURE TESTER (TABAI ESPEC CORP. ) (2) fitf^p^-p-^: The Number Of D.U.T. (Device Under Test) 5 -p (units) (3) fSi&^M^ Test
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TSV-40 tabai espec 217F ESS-630A R-16 C128-57-01A 24VDC 500VACJ

s3v 73 diode

Abstract: LTYN Equipment Used MWlPiWi^ VS â'" 700 â'" 5 f/^tt-^'yirfäRgft. Vibration tester (TABAI ESPEC CORP , ) fifflftM Equipment Used r^iM^atf PH â'"401 W'^tt^ytm&gm HIGH TEMPERATURE TESTER (TABAI ESPEC CORP.) (2 , . ifeiUIfJi^^ LOW TEMPERATURE STORAGE TEST MODEL : PC6-24-5 (1) Equipment Used (TABAI ESPEC CORP. ) pfâ , CHAMBER (TABAI ESPEC CORP- ) (2) The Number Of D.U.T. (Device Under Test) 5 ^ (units) (3) i^Jg^f^ Test
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PCD6-24-1212 s3v 73 diode LTYN DIODE S3V 64 diode S3V 68 DIODE S3V 46 DIODE S3V 39 C140-57-01 12VDC

TABAI PL-2G

Abstract: tabai espec : Platinous Lucifer PL-2G from Tabai Espec Corp. 2. Test Conditions #of U.U.T.'s : 3 units Ambient , . Equipment Used : Platinous Lucifer PL-2G from Tabai Espec Corp. 2. Test Conditions # of U.U.T.'s : 3 units , Shock Test 1. Equipment Used : Thermal shock chamber TSV-40 from Tabai Espec Corp. 2. Test Conditions
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TABAI PL-2G espec rm100-48 tabai espec pl-2g RM100-48-2 lambda power supply RM100-48 1-800-LAMBDA-4/5 TDRM100-48 MIL-HDBK-217F

tabai espec pl-2g

Abstract: INS-4420 . TDRM50-48 High Temperature Storage Test 1. Equipment Used : Platinous Lucifer PL-2G from Tabai Espec , Tabai Espec Corp. 2. Test Conditions # of U.U.T.'s : 3 units Ambient Temperature : -40°C Test Time , Electronics Inc. A TDRM50-48 Thermal Shock Test 1. Equipment Used : Thermal shock chamber TSV-40 from Tabai Espec Corp. 2. Test Conditions # of U.U.T.'s : 5 units Standard : subjected to JIS C5030 Ambient
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INS-4420 RM50-48-5 F-400-BM-DCS-7800 EMIC RM50-48-2 Lambda LN RM50-48

tabai espec pl-2g

Abstract: lambda power supply High Temperature Storage Test 1. Equipment Used : Platinous Lucifer PL-2G from Tabai Espec Corp. 2 , Tabai Espec Corp. 2. Test Conditions # of U.U.T.'s : 3 units Ambient Temperature : -40°C Test Time , chamber TSV-40 from Tabai Espec Corp. 2. Test Conditions # of U.U.T.'s : 5 units Standard : subjected
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Lambda Electronics Lambda electronics Power supply Asahi Lambda Electronics LS Power supplies tabai RM30-48-2 RM30-48 TDRM30-48

tabai espec

Abstract: 45Cll ®^iîgê Equipment Used Vibration tester (TABAI ESPEC CORP ) (SJKSfe!^ Test Conditions â'¢Mi&W&W 10 , TESTING CHAMBER (TABAI ESPEC CORP. ) (2) The Number Of D UT (Device Under Test) 5 (units) (3) f^&fr Test , - Equipment Used PF â'"210 tfs^X^ymS&ft.) LOW TEMPERATURE TESTER (TABAI ESPF.C CORP.) (2) I^ppr1^ The
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PC3-24-5 45Cll c124 transistor TRANSISTER C124 mtl 5018 C124-5 500VAC

TSV-40

Abstract: ESS-630A ) fifflf+IIJfff Equipment Used ifi&tmff PH â'"401 (VU^^ym^tt) HIGH TEMPERATURE TESTER (TABAI ESPEC CORP. ) (2 , Used TSV-40 (^Vi^s^ifcs^tt) HEAT SHOCK TESTING CHAMBER (TABAI ESPEC CORP. ) (2) (3) f HP pile The
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PC1R5-24-5 C120-57-01
Abstract: effort. Temperature testing of materials is quicker and easier. 1. For a TABAI ESPEC chamber Agilent Technologies
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4291B 5966-1501E

DC04 display

Abstract: how to test POWER MOSFET with digital multimeter HP Gralab Sonoscan C-SAM 3100 Mitutoyo ESPEC Sexton ESPEC Associated Lansmont Unholtz-Dickie Tabai Ransco Unitron Ames Precision Fischerscope Usage Cross-Section Analysis Bench Check VZAP
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DC04 display how to test POWER MOSFET with digital multimeter tektronix 576 curve tracer VISHAY VT 300 WEIGHT INDICATOR FLUKE 79 manual TSMC 0.35Um DC04-0001

tsmc 0.35um 2p4m cmos

Abstract: K2411 March Inst Inc Leica S420 Fluke HP Gralab Sonoscan C-SAM 3100 Mitutoyo ESPEC Sexton ESPEC Associated Lansmont Unholtz-Dickie Tabai Ransco Unitron Ames Precision Fischerscope Cross-Section
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tsmc 0.35um 2p4m cmos K2411 teradyne j750 tester manual specification of scr 2p4m 2p4m equivalent Z0853006PSC

Z0840004PSC

Abstract: Z0853006PSC Temperature/Humidity Test Chamber ESPEC Temperature/Humidity Test Temperature/Humidity Test Chamber Sexton ESPEC Moisture Resistance Test Salt Atmospheric Chamber Associated Salt Atmosphere , Brand Usage VVF Test Unholtz-Dickie VVF Test Thermal Shock Tabai Thermal Shock Test
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Z0840004PSC sumitomo crm1033b Sumitomo CRM 1033B z0840004 Z0847004PSC Z84C008 ZAC03-0004 2002Q Z80S183