500 MILLION PARTS FROM 12000 MANUFACTURERS

DATASHEET SEARCH ENGINE

Top Results

Part Manufacturer Description Datasheet BUY
JRW040A0A61-HZ GE Critical Power JRW017/040/060/065/070 Series Power Module DC-DC Converter visit GE Critical Power
JRW070A0M1 GE Critical Power JRW017/040/060/065/070 Series Power Module DC-DC Converter visit GE Critical Power
JRW065A0Y1 GE Critical Power JRW017/040/060/065/070 Series Power Module DC-DC Converter visit GE Critical Power
JRW040A0A1 GE Critical Power JRW017/040/060/065/070 Series Power Module DC-DC Converter visit GE Critical Power
JRW065A0G1-HZ GE Critical Power JRW017/040/060/065/070 Series Power Module DC-DC Converter visit GE Critical Power
JRW017A0B1 GE Critical Power JRW017/040/060/065/070 Series Power Module DC-DC Converter visit GE Critical Power

stc 1740

Catalog Datasheet MFG & Type PDF Document Tags

stc 1740

Abstract: GIS 110 kV 275/320 650 1530/1740 3880/4600 1 B* -50/70 170 10000 325/370 750 1740/1940 4600/5315 1 B* -50/70 220/250 9000 460/525 1050 2300/2440 6510 , insulators > > > > > RE 12.0187 1) STC 95.002 1) RE 12.0107 RE 12.0108 RE 12.0144 Electrical , 12.0181 1) STC 95.024 1) Electrical type tests, full-size capacitors Shock tests, full-size capacitors Group 3: Indoor and GIS capacitors > > > > > > RE 12.0182 1) RE 12.0186 1) STC
Maxwell Technologies
Original

stc 1740

Abstract: "stc" 1740 performance characteristics - Continued. Test Symbol Conditions -55°C sTC , 2003 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55°C sTc , 1.740 1.760 a2 28.96 29.46 1.140 1.160 s 6.10 6.60 0.240 0.260 T 10.92 11.43 0.430 0.450 Dl D NOTES: 1 , 0.260 4P 3.43 3.68 0.135 0.145 q/q1 44.20 44.70 1.740 1.760 q2 28.96 29.46 1.140 1.160 S 6.10 6.60 0.240 , 2.510 F 1.14 1.40 0.045 0.055 L 6.10 6.60 0.240 0.260 P 3.43 3.68 0.135 0.145 q/q1 44.20 44.70 1.740
-
OCR Scan

QML-38534

Abstract: stc 1740 Conditions -55°C sTc , 1.40 0.045 0.055 L 6.10 6.60 0.240 0.260 3.43 3.68 0.135 0.145 q/q1 44.20 44.70 1.740 1.760 q2 28.96 , P 3.43 3.68 0.135 0.145 q/q1 44.20 44.70 1.740 1.760 q2 28.96 29.46 1.140 1.160 ? 6.10 6.60 0.240 , 0.240 0.260
-
OCR Scan

stc 1740

Abstract: 5962-9319301HXA Continued. Test Symbol Conditions -55° C sTc < +125°C V|N = 28 V dc ±0.5 V dc no external sync, C|_ = 0 , 3.68 0.135 0.145 q/q1 44.20 44.70 1.740 1.760 q2 28.96 29.46 1.140 1.160 s 6.10 6.60 0.240 0.260 T , 1.740 1.760 q2 28.96 29.46 1.140 1.160 S 6.10 6.60 0.240 0.260 NOTES: 1. The U. S. preferred system of , 3.68 0.135 0.145 q/q1 44.20 44.70 1.740 1.760 q2 28.96 29.46 1.140 1.160 s 6.10 6.60 0.240 0.260 T 8.64
-
OCR Scan
Abstract: short-circuit current. Isc = Short-circuit current of one module at Standard Test Conditions (STC) Voc = Open circuit voltage of one PV module at STC Initial conditions for specifying PV fuses: Ns = , Short-circuit current of one module at Standard Test Conditions (STC) Voc = 45.6V Open circuit voltage of one PV module at STC Calculation: Note: When calculating for high ambient temperature applications , sub-arrays in parallel per PV array Short-circuit current of one PV module at Standard Test Conditions (STC EATON
Original

PJ979

Abstract: diode PJ979 characteristics - Continued. Test Symbol Conditions -55° C STC s +125°C 4.5 V s Vcc s 5.5 V unless otherwise , Continued. Test Symbol Conditions -55°C sTc s +125°C 4.5 V i Vqq s 5.5 V unless otherwise , Continued. Test Symbol Conditions -55°C sTc S +125°C 4.5 V s Vqq s 5.5 V unless otherwise specified Group , 16.89 17.40 L .035 .045 0.89 1.14 e .045 .055 1.14 1.40 N 20 FIGURE 1. Case outlines. STANDARD , 17.40 r .010 ref. 0.25 ref. E .343 .357 8.71 9.07 R .008 typ. 0.20 typ. e .050 typ. 1.27 typ. S
ADC Telecommunications
Original

QML-38535

Abstract: SMD AH ENGINEERS MASTER D ire c to ry ), Pages 1727 to 1740. 60A? to DC, Regulated 400*3^ to DC, Regulated 28
-
OCR Scan

RCA SK CROSS-REFERENCE

Abstract: 250PA120 Conditions -55*C sTc s +125*C 4.5 V i. Vcc i. 5.5 V unless otherwise specified Group A subgroups Device type , .370 9.40 .035 0.89 .592 15.04 .045 1.14 .608 15.44 .055 1.40 .665 16.89 .063 1.60 .685 17.40 .078 1.98 , .343 .357 .590 .610 .665 .685 -DEL 1.52 2.03 2.54 8.71 9.07 14.99 15.49 16.89 17.40 FIGURE 1. Case out
-
OCR Scan

qml-38535

Abstract: RCD testers : tC S+tC H defines the m inim um pause in RAM I/O pad transitions to assure pad data capture 12 , ales O f f ic e s Western Hitachi A m erica, Ltd. 1740 Technology Drive Suite 500 San Jose, CA 9
-
OCR Scan

67s18258

Abstract: 56A, AC 125, AC 126, AC 151, AC 151 r, 40-200 25-125 50-250 40-200 40-200 17-40 1.50 1.50 2.00 1.50
-
OCR Scan

irf 5630

Abstract: transistor 2SB 367 :24,CCR STC CCR.Rd STC CCR,@ ERd STC CC R,® (d:16,ERd) STC CCR,@(d:24,ERd) STC C C R ,® -E R d STC CCR, ®aa:16 STC CCR,@aa:24 ANDC #xx:8,CCR ORC #xx:8,CCR XORC #xx:8.CCR W W @EF;s(even) x 1:16,ERs
-
OCR Scan
Showing first 20 results.