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DRV8872DDARQ1 Texas Instruments Automotive 3.6A Brushed DC Motor Driver With Fault Reporting 8-SO PowerPAD -40 to 125 visit Texas Instruments Buy
DRV8872DDA Texas Instruments 3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125 visit Texas Instruments
DRV8872DDAR Texas Instruments 3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125 visit Texas Instruments Buy
TMS370C156FNL Texas Instruments 8-Bit Microcontroller 68-PLCC visit Texas Instruments
TMS370C250FNAR Texas Instruments 8-Bit Microcontroller 68-PLCC visit Texas Instruments
TMS370C686AFNT Texas Instruments 8-Bit Microcontroller 44-PLCC visit Texas Instruments

report on PLCC

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pj 989

Abstract: 145026 REPORT Failure @ Hours Package 68 PLCC Fab lot 1351104 Device QL8X12B Quantity 100 , 0 0 Total * = 150 ºC 6-9 3 6 Quality, Packaging 84 PLCC RELIABILITY REPORT , RELIABILITY REPORT The reliability tests on the programmed ViaLink element must demonstrate the stability of , QL16x24B 4 0 0 0 6-24 RELIABILITY REPORT Failure @ Hours Package 84 PLCC Fab Lot , pASICTM 1 FAMILY Reliability Report SUMMARY The pASIC device is a highly reliable Field
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pj 989 145026 PASIC 380 14093 38980 report on PLCC 24X32B

report on PLCC

Abstract: 40673 RELIABILITY REPORT ACCELERATED LIFE TESTS ON THE pASIC TABLE 2. Results of Accelerated Life Tests on the , has no measurable effect on the reliability of the resulting product. 9-3 9 Quality, Packaging pASIC ® 1 and 2 FAMILY Reliability Report RELIABILITY REPORT PROCESS DESCRIPTION , . It is created by depositing a very high resistance amorphous silicon film on a standard size , RELIABILITY REPORT In Table 1, t50 is the mean time to failure, E is the electric field, Ea is the
QuickLogic
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40673 plcc 68 QL8X12A ql8x12 reliability report solar cell Amorphous

68hc11pa8

Abstract: 68hc11kg4 MCTG RELIABILITY AND QUALITY 1996 ANNUAL REPORT MRQSY96/D Microcontroller Technologies Group Reliability and Quality 1996 Annual Report To Our Valued Customers: Thank you for selecting Motorola as , activities are also initiated on design fixes, process capability enhancements and defectivity reductions based on our ongoing reliability monitor program and our Total Control Methodology in manufacturing processes. We are glad to publish this annual 1996 MCTG Reliability Monitor Report for your use. Please
Motorola
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68hc11pa8 68hc11kg4 68B09E 68HC11PH8 HC711KG4 68HC57

68HC11L6

Abstract: 68hc11ka4 REPORT Quarter 1, 1997 Semiconductor Product Sector Test results contained herein are for information only. This report does not alter MotorolaÕs standard warranty or product speciÞcations. Microcontroller Technologies Group Reliability and Quality Quarter 1, 1997 Report © MOTOROLA INC., 1997 1 MICROCONTROLLER TECHNOLOGIES GROUP RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION , . 3-1 MICROCONTROLLER TECHNOLOGIES GROUP RELIABILITY AND QUALITY Q1 1997 REPORT MOTOROLA iii
Motorola
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68HC11L6 68hc11ka4 68HC11a1 527 MOSFET TRANSISTOR motorola D65C 68HC05N4

68hc26

Abstract: 68HC05C4 CSIC Microcontroller Division Reliability and Quality Quarter 2, 1996 Report © MOTOROLA INC., 1996 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION , QUALITY . 3-1 CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY Q2 1996 REPORT MOTOROLA iii MOTOROLA iv CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY Q2 1996 REPORT CSIC MICROCONTROLLER DIVISION RELIABILITY AND QUALITY REPORT TECHNICAL INFORMATION RELIABILITY AND
Motorola
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68hc26 68HC05C4 68hc705p9 JPC3400 68HC05B6 68HC05C12

M7401

Abstract: m74010 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1998 PERFORM PER THE , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1998 Issued: 5/28/98 , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1998 Issued: 5/28/98 WAFER , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1998 Issued: 5/28/98 , Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias
Cypress Semiconductor
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M7401 m74010 m7402 M74050 M74040 m80129 150C/3 CY7C1334-AC 150C/63V

tms 9937

Abstract: TSMC fuse CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 STANDARD , Bias Page 2 of 32 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4 , 32 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 , stress performed. See table on previous page for detail. Tem/humidity/bias condition for the stress. See
Cypress Semiconductor
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tms 9937 TSMC fuse CY7C1353-AC PALC22V10b Hyundai 9944 MR841 C/130 SRAM/LOGIC-R52D 140C/3 CY7C1329-AC MR93232 MR93231

power supply ic 9435

Abstract: report on PLCC- II ) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 Introduction to Integrated Device Technology , , and office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report. For
Integrated Device Technology
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PLCC-52 power supply ic 9435 report on PLCC- II 7134 AN 7134 7132 PLCC-52 9511 PDIP-48 PLCC-68 PLCC-84

CY7C4271-JC

Abstract: cypress 98267 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1998 PERFORM PER THE , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 3/7/2000 , Page 2 of 29 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 , /Thailand Hana/Thailand Page 3 of 29 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT , Manufacturing Division Common code for the stress performed. See table on previous page for detail. Tem/humidity
Cypress Semiconductor
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CY7C4271-JC cypress 98267 9832 121C/100 CY62128V-VC CY62128V-ZSC

PLCC-64

Abstract: 9529 FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report
Integrated Device Technology
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PLCC-64 TQFP-132 9529 quality and reliability report 668 9539 7050Z A101 7134X 7130U 7014Z 7133X 7007Z 71502Z

A101

Abstract: A102 ) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 Introduction to Integrated Device Technology , , and office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report. For
Integrated Device Technology
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A102 A104 Q494 ic 9435 ase korea on semiconductor A106 PDIP-28 PLCC-44 PLCC-32 72245LB TQFP-64 PQFP-120

report on PLCC- II

Abstract: 7132-S FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , 's quality system is the Quality and Reliability Monitor Program. Section II of this report contains , II of this report. For more information regarding the reliability performance of IDT products
Integrated Device Technology
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7132-S t450 A110 tqfp 64 thermal resistance 7130S P-DIP-48 7132S 71321S 7140SF VI-10

quality and reliability report

Abstract: A101 ) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT July 1997 Introduction to Integrated Device Technology , office automation markets. IDT's development efforts focus on providing proprietary and enhanced , Monitor Program. Section II of this report contains four-quarter rolling summaries of reliability testing , methods used for the monitors are described in Section II of this report. For more information regarding
Integrated Device Technology
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7025X TQFP-64 PACKAGE thermal resistance IDT QUALITY & RELIABILITY MONITOR REPORT 9549N 9703P 7005X 70261Z 7026Z

Hyundai Semiconductor

Abstract: report on PLCC FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1996 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report
Integrated Device Technology
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Hyundai Semiconductor 1005 Ic Data DATASHEET OF IC 741 IC 741 data sheet plcc-32 vcc s 122 transistor "p 77" PQFP-64 72103Y 7200T 7201T 72245X 72521Y

PLCC-52

Abstract: 7024X ) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 Introduction to Integrated Device Technology , office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report
Integrated Device Technology
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PQFP-132 7024X S 1854 T 9527 transistor 9529 7052Z 7006X 7015X 7015Z

7206Y

Abstract: 9616P FAX: (408) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 TABLE OF CONTENTS , INTRODUCTION IDT QUALITY & RELIABILITY MONITOR REPORT January 1997 Introduction to Integrated Device , communications, and office automation markets. IDT's development efforts focus on providing proprietary and , 's quality system is the Quality and Reliability Monitor Program. Section II of this report contains , II of this report. For more information regarding the reliability performance of IDT products
Integrated Device Technology
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7206Y 9616P 7202S 72241Y 7204T 72510Y 72402Y PDIP-18

S 1854

Abstract: 1005 Ic Data ) 492-8674 IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 TABLE OF CONTENTS Section I , IDT QUALITY & RELIABILITY MONITOR REPORT July 1996 Introduction to Integrated Device Technology , office automation markets. IDT's development efforts focus on providing proprietary and enhanced , the Quality and Reliability Monitor Program. Section II of this report contains four-quarter rolling , . The procedures and test methods used for the monitors are described in Section II of this report
Integrated Device Technology
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Power PQFP 64 PQFP 64 72510 9528 7205X 7201S 72511Y

tms 9937

Abstract: M9922 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1999 PERFORM PER THE , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 , RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 WAFER FAB AREAS FAB # LOCATION CA TX MN , CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1999 Issued: 4/3/00 , Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias
Cypress Semiconductor
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M9922 PALC22V10B-15PC CY62128-SC 130C 140C CY7B923-JI M/LOGIC-R52D SRAM/LOGIC-R52LD CY62137-AI MR94085

ACT1020

Abstract: JH05 , continuous communication between top executives, managers, and employees I Emphasis on cooperation and , successfully advance to higher complexity designs with confidence. Quality & Reliability Report 1 2 , STACK Member. 2 Quality & Reliability Report STACK Registered suppliers include Actel, Altera , . Quality & Reliability Report 3 Reliability Assurance System1 To ensure that customers are satisfied , following documents on page 57. · Actel and the Antifuse-A Technical Backgrounder · Oxide-Nitride-Oxide
Actel
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ACT1020 JH05 44 pin actel 1020b MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR ACP55 ACTEL 1020B

VIC068A-BC

Abstract: M71079 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1997 PERFORM PER THE , Department Manager CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 , Page 2 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1997 , Hana/Thailand Page 3 of 12 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT , Fail Mode Cypress Manufacturing Division Common code for the stress performed. See table on
Cypress Semiconductor
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M71079 VIC068A-BC M7108 CY62256-VC m71070 m7101 CY7C374I-JC FLASH-FL28D CY7C375I-AC M71089 M71080
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