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TESTPN-SJA Texas Instruments Obsolete OPN-TEST
TMS320TEST1000 Texas Instruments TMS320TEST Test Generic
ADVANCED_BQMTESTER Texas Instruments Texas Instruments Advanced bqMTester Multi-Station Test and Program Board
DSPTEST Texas Instruments DSPTEST for Node
MSP430-3P-LSDM-LSD-TEST430FXXX-DEVBD Texas Instruments MSP430-3P-LSDM-LSD-TEST430Fxxx-DEVBD
RI-UHF-IC116-00 Texas Instruments PACKAGED UHF IC FOR PCB TRACKING APPLICATION 6-USON -40 TO 125

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hi pot test sheets

Catalog Datasheet MFG & Type PDF Document Tags
Abstract: 429 specification and the Holt HI-8585 & HI-8586 Data Sheets. No changes are necessary to the data , ) PCN INFORMATION PCN # Title Contact: 0704 ARINC 429 Line Driver Die Change for HI-8585 & HI , Date Code Other CHANGE TYPE Design Wafer Fab Site Assembly Site Test Site Electrical Specification Wafer Fab Material Assembly Material Test Process Mechanical Specification Wafer Fab Process Assembly , HI8595 for all HI-8585 & HI-8586 product REASON FOR CHANGE: 1. Replace the zener diode-based voltage HOLT Integrated Circuits
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HI-8585PSI HI-8585PST HI-8585PSTF HI-8586PSIF 8586PDT HI8586PSM hi pot test pcb HI-8585 HI-8586 HI8590 MIL-STD-883 HI-8585PSIF
Abstract: 250mW DC current At least 450mA Hi Pot 1500 Vrms Operating Temperature -40°C to +85°C , -010051-CF1A41 900 piece reel MABA-010051-CF1ATB Customer Test Board 4 ADVANCED: Data Sheets contain , . * Restrictions on Hazardous Substances, European Union Directive 2002/95/EC. 1 ADVANCED: Data Sheets contain , . Commitment to develop is not guaranteed. PRELIMINARY: Data Sheets contain information regarding a product MA-COM Technical Solutions Visit www.macomtech.com for additional data sheets and product information M/A-COM
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MABA-010051-CF1A41 ethernet transformer Application Note 50 Ohm transformer ethernet transformer 010051 10/100BASE-T MABA-010051CF1A41
Abstract: . 6 1.2 Power Connectors 1.3 Test Stakes , Outputs Test Stakes DRV8811 USB 1.2 MSP430F1612 Power Connectors The DRV8811 customer EVM uses a combination of terminal blocks and test clips for the application/monitoring of power. The , Documentation Feedback Installing Drivers And Software www.ti.com 1.3 Test Stakes Every pin on the device has been brought out to a test stake. A label on the silkscreen identifies each signal. 1.4 Texas Instruments
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DRV8811EVM wireless motor speed control by rf MSP430 start and stop motor schematic diagram SLVA344A
Abstract: ISOLATION VOLTAGE Application Notes WHAT DO THE FOLLOWING TERMS REALLY MEAN? Hi Pot Test Withstand Voltage Dielectric Withstand Voltage Flash Tested Proof Voltage A question , ? These are all terms that apply to various aspects of the same thing: A test voltage, applied for a , baseplate or chassis. The actual voltage and time duration of the test varies by model but is always specifically defined on the product data sheets or is inferred by the specific safety agency approvals C&D Technologies
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C&D TECHNOLOGIES C*D Technologies UL60950 GEAN-04
Abstract: Thermocouple Calibrators: See Data Sheets 22,222 & 322 "QUIK-CHEKTM" SWITCH Select HI, LO & SET 45 , " ·Toolbox Tough · Three-year warranty Data Sheets are in the following order QUIK-PAKTM MILLIAMP 5 , cost low enough for every bench and toolbox. Data Sheets 134 & 234 _ WARRANTY , Calibrators: See Data Sheets SPECIFICATIONS ALTEK M O D E L 2 34 (Unless otherwise indicated , checkout and calibration of all milliamp input devices. Calibrators: See Data Sheets ALTEK'S broad -
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sec 222M se RKM 24 sm transistor sire db 125 160F SENSORS TEMPERATURE Pt-100-DIN 43760 2120R pyro sensor range 20m
Abstract: Parameter Value Input power 250mW DC current 600mA Hi Pot 1500 Vrms Operating , solder wetting 1 ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology , guaranteed. Visit www.macomtech.com for additional data sheets and product information. PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology Solutions has under development , . Engineering samples and/or test data may be available. M/A-COM Technology Solutions Inc. and its affiliates M/A-COM
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MABA-010655-CF1A40 MABA-010655CF1A40 MABA-010655-CF1ATB ANI-019
Abstract: Input power 250mW DC current 600mA Hi Pot 1500 Vrms Operating Temperature -40° to , of the carrier. Castellations will not show solder wetting 1 ADVANCED: Data Sheets contain , . Commitment to develop is not guaranteed. Visit www.macomtech.com for additional data sheets and product information. PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology Solutions , . Mechanical outline has been fixed. Engineering samples and/or test data may be available. M/A-COM Technology M/A-COM
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MABA01 CO-000884
Abstract: current Hi Pot Operating Temperature Storage Temperature Value 250mW 600mA 1500 Vrms -40°C to +110°C -55°C , ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology Solutions · North America , for additional data sheets and product information. PRELIMINARY: Data Sheets contain information , tests. Specifications are typical. Mechanical outline has been fixed. Engineering samples and/or test , °C, Pin = 0dBm 2 ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology M/A-COM
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SCD21 CO-002313
Abstract: CIRCUIT TYPE: FET Front End DESIGNATION: HA-2000 OPERATING LIFE TEST CONDITION: 1) TEMPERATURE: +125°C , ) (21 (3) 0.4 (3) 0.4 (3) 0.4 (3)0.4 (3) 0.8 (3) 0.8 (3) 1.5 0.33 0.33 0.25 0.25 Hi POWER SUPPLY , -2510/2515 HA-2720/2725 HA-2630/2635 HI-1800A HA-2650/2655 HD-1488 HD-1489/A C2 B2 B2 A3 C2 C2 B2 B2 B2 A2 C2 , IH5060 IH5070 * Part Numbers: Intersil Harris HA-2111/2211/2311 HI-5040 thru HI-5051 HA-2060/2065 HA-2600/2605 HA-2520/2525 HA-2420/2425 HI-506A HI-507A M =_2 * C =-5 [DE =HI 1 r+- PE =HI 1 11 TW = HI 2 -
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HA-909 HA-2500 HA-2502 HA-2510 HA-2512 HA-2520 MC1554 H12-200 lm 1456 n Signetics 2650 mA702 HA2060A
Abstract: . 2 1.2 Test Stakes , (Motor Voltage) power rail via a terminal block (J1). A set of test clips in parallel with the terminal , recommended parameters. NOTE: VDD for logic and microcontroller is derived from USB interface. 1.2 Test Stakes Every pin on the DRV88xx device has been brought out to a test stake. A label on the silkscreen , configuration. 1.3.1 AVREF Select Jumper (JP2) From Pot From DAC 1 (a) 1 (b) To configure the Texas Instruments
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DRV8825 DRV8841 msp430 motor pwm control msp430 pwm control generation of pwm signals by MSP430 DRV8802-14 DRV8824-25 SLVU361A CPG004 DRV88 DRV8802 DRV8812 DRV8813
Abstract: -2520 A1 AD518 HA-2510/2515 B2 AD7501 HI-1818A B2 AD7502 HI-1828A B2 AD7503 HI-1818A B2 AD7506 H1-506 A1 AD7507 H1-507 A1 AD7510 HI-201 C2 AD7511 HI-201 C2 AD7512 HI-5043 C2 AD7513 HI-200 A1 , 3508J HA-2625 A1 3550J HA-2055 B2 3550K HA-2050 B2 3550S HA-2055 B2 MPCBD HI 1-507A-5 A1 , .) C. Not pin compatible â'" consult data sheets. 1. Identical electrical specifications 2. Harris part superior in most parameters 3. Parameter tradeoffs â'" consult data sheets MANUFACTURER PART -
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HA-911 HA-2005A HA-2055A HA-2065 HA-2065A HA-2405 al 60 dv 2425 MPC16S CD4046 HA-2425 HA-2505 HA-2515 HA-20
Abstract: 2700/2705 2640/2645 HA-2650/2655 HA-2620/2625 HA-2510/2515 HA-2720/2725 HA-2630/2635 HI-1800A HA , -2111/2211/2311 HI-5040 thru HI-5051 HA-2060/2065 HA-2600/2605 HA-2520/2525 HA-2420/2425 HI-506A HI-507A M =_2 * C =-5 [DE =HI 1 r+- PE =HI 1 11 TW = HI 2 IH5040MDE H11-5040-2 A1 A1 B2 B2 B2 C2 A2 A2 , MC1539/1439 HI-1080/1085 HA-2600/2605 HA-2600/2605 HA-2700/2705 HA-2640/2645 HA-2630/2635 HA-2620/2625 C2 , ., compensation, etc.) C. Not pin compatible â'" consult data sheets. 1. Identical electrical specifications 2 -
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philbrick rc4558 preamp Signetics 2513 2060 h4 LM1488 MA776 HA-2525 HA-2535
Abstract: . 6 1.3 Test Stakes , complete evaluation. 1.1 Block Diagram VM Power Motor Outputs Test Stakes DRV8811 USB , and test clips for the application/monitoring of power. The only power rail the user must supply is , connection. The user must apply VM according to datasheet recommended parameters. 1.3 Test Stakes Every pin on the device has been brought out to a test stake. A label on the silkscreen identifies each Texas Instruments
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FTD232R SLVA344B
Abstract: VOLTAGE `Hi Pot Test', `Flash Tested', `Withstand Voltage', `Proof Voltage', `Dielectric Withstand Voltage' & `Isolation Test Voltage' are all terms that relate to the same thing, a test voltage, applied , , recommended alternative: (click to view data sheets) Efficiency % 600 74 NDTD2415C NDTS4805C , min.-max. 70 TA = +25º 1.0 MHr ISOLATION CHARACTERISTICS Parameter Rated voltage Test , maintained within SELV limits i.e. less than 42.4V peak, or 60VDC. The isolation test voltage represents a muRata Power Solutions
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ML-HDBK-217 WPC03 WPC03R24S05LC WPC03R24D15LC WPC03R48S05LC WPC03R24 WPC03R48
Abstract: /rohs TECHNICAL NOTES ISOLATION VOLTAGE `Hi Pot Test', `Flash Tested', `Withstand Voltage', `Proof Voltage', `Dielectric Withstand Voltage' & `Isolation Test Voltage' are all terms that relate to the same thing, a test voltage, applied for a specified time, across a component designed to provide electrical , NDTS2405C NDTD2415C NDTS4805C Obsolete, recommended alternative: (click to view data sheets) INPUT , kHz MHr ISOLATION CHARACTERISTICS Parameter Rated voltage Test voltage Resistance Capacitance muRata Power Solutions
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NPH10S2412IC WPC03RC WPC03R
Abstract: information, please visit www.murata-ps.com/rohs TECHNICAL NOTES ISOLATION VOLTAGE `Hi Pot Test', `Flash Tested', `Withstand Voltage', `Proof Voltage', `Dielectric Withstand Voltage' & `Isolation Test Voltage' are all terms that relate to the same thing, a test voltage, applied for a specified time, across a , : (click to view data sheets) INPUT CHARACTERISTICS Parameter Voltage range Conditions All , Test voltage Resistance Capacitance Conditions 60Hz, 10 seconds Min. 1500 1500 Typ. Max muRata Power Solutions
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Abstract: hour pressure pot test has been implemented to more stringently verify moisture resistance. Frame , Hot Rail (opt.) T emp Cycle (opt.) Parametric Mark Outer Mold Hi Pot Package , with or without zero crossing detector logic. Test MIL-STD-883 Reference Pre-condition , Figure 1). Test Condition Test Conditions Temp (°C) RH (%) Bias Hours Ambient Life Test 25 ð60% Max Rating 1000 Elevated Life Test 70 ð60% Derated Max Rating Vishay Semiconductors
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antiparallel scr optocoupler MTBF phototransistor MTBF dual channel triac optocoupler inverse-parallel scr drive circuit optocoupler RC snubber
Abstract: -220 ISOWATT220 INTERNAL SCHEMATIC DIAGRAM G , P.ot T"stg Ti (*) Pulse width limited by safe operating area June 1988 1/6 633 STHI10N50 - , ELECTRICAL CHARACTERISTICS (Tj = 25°C unless otherwise specified) Parameters Test Conditions Min. Typ. Max , STHI10N50FI ELECTRICAL CHARACTERISTICS (Continued) Parameters Test Conditions Min. Typ. Max. Unit , STHI10N50FI Switching times test circuit for resistive load Switching time waveforms for resistive load -
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bc 357 transistor
Abstract: . 2 1.2 Test Stakes , test clips in parallel with the terminal block allows for the monitoring of the input power rail. User , is derived from USB interface. 1.2 Test Stakes Every pin on the DRV8821/DRV8823 device has been brought out to a test stake. A label on the silkscreen identifies each signal. For those pins that , jumpers (JP1 and JP2). Two pin jumpers are used to set AB DECAY or CD DECAY HI or LO. Three pin jumpers Texas Instruments
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msp430 DC motor control 23EV dc motor using zigbee DRV8821 DRV8821-23 drv883 SLVU350 CPG003 DRV8821-23EVM-001 DRV882123-001
Abstract: sheets for this device are available on request. Pinouts Functional Diagram SAMPLE/ HOLD CONTROL , Test Conditions (Unless otherwise specified) V g u P P L Y - ±.15.0V; Ch = 1000pF; Digital Input (Pin , produce 8+10V output. 3. Adjust the trim pot for +10V output in the hold mode. 4. Apply the nominal input , trim pot for an output hold voltage of (V-10NOM IN ALH(-10V) 2 cS O FFSET ADJUSTMENT The offset voltage of the HA-2420/2425 may be adjusted using a lO O kfi trim pot, as shown in Figure 6. The recom -
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HARRIS 2425 4BD2S71 09X36
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